6 results on '"Wang, Kaihong"'
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2. Online Gate-Oxide Degradation Monitoring of Planar SiC MOSFETs Based on Gate Charge Time
3. Monitoring Bond Wires Fatigue of Multichip IGBT Module Using Time Duration of the Gate Charge
4. Monitoring Bond Wires Fatigue of Multichip IGBT Module Using Time Duration of the Gate Charge
5. Active Junction Temperature Control of IGBT Based on Adjusting the Turn-off Trajectory
6. Active Junction Temperature Control of IGBT Based on Adjusting the Turn-off Trajectory
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