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Your search keyword '"Chien, Wei-Ting Kary"' showing total 7 results
Start Over Author "Chien, Wei-Ting Kary" Journal ieee transactions on reliability
7 results on '"Chien, Wei-Ting Kary"'

1. Practical 'Building-in Reliability' approaches for semiconductor manufacturing

Author

Chien, Wei-Ting Kary and Huang, Charles Huang-Jia

Subjects
Reliability (Engineering) -- Research, Semiconductor industry -- Research, Semiconductor production equipment industry -- Research, Semiconductor industry, Semiconductor production equipment industry, Business, Electronics, Electronics and electrical industries
Abstract

Advantages of the building-in reliabiity (BIR) methodology for semiconductor manufacturing are identified and discussed.

Published
2002

2. Modeling & maximizing burn-in effectiveness

Author

Chien, Wei-Ting Kary and Kuo, Way

Subjects
Burn-in testing -- Analysis, Redundancy (Engineering) -- Research, Electronic equipment and supplies -- Testing, Business, Electronics, Electronics and electrical industries
Abstract

A nonlinear model has been developed to find optimal burn-in times for all levels and optimal redundancy for every subsystem. It shows that reliability of the target system can be achieved by lowering the incompatibility or component hazards rates. The system reliability is susceptible to the compatibility level of the initial system. Burn-in times increase due to decreases in burn-in cost because it is more useful to burn-in items than to raise the subsystem numbers.

Published
1995

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