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We demonstrate a non-monotonic evolution of in-plane thermal conductivity of large-area hexagonal boron nitride films with thickness. Wrinkles and defects/impurities are present in these films. Raman spectroscopy, an optothermal non-contact technique, is employed to probe the temperature and laser power dependence property of the Raman active E2ghigh phonon mode, which, in turn, is used to estimate the rise in the temperature of the films under different laser powers. As the conventional Fourier law of heat diffusion cannot be directly employed analytically to evaluate the thermal conductivity of these films with defects and wrinkles, finite-element modeling is used instead. In the model, average heat resistance is used to incorporate an overall near-surface defect structure, and Voronoi cells with contact resistance at the cell boundaries are constructed to mimic the wrinkled domains. The effective in-plane thermal conductivity is estimated to be 87, 55, and 117 W/m K for the 2, 10, and 30 nm-thick films, respectively. We also present a quantitative estimation of the thermal resistance by defects and wrinkles individually to the heat flow. Our study reveals that the defects/impurities render a much higher resistance to heat transfer in the films than wrinkles. [ABSTRACT FROM AUTHOR]

Recently, the electron mobility in wedge-shaped c-GaN nanowall networks has been estimated to cross the theoretical mobility limit for bulk GaN. Significant blue-shift of the bandgap has also been observed. Both the findings are explained in terms of two-dimensional electron gas (2DEG) formed at the central vertical plane of the walls due to the polarization charges at the two inclined faces. Carrier concentration and mobility have earlier been determined from thermoelectric power and conductivity measurements with the help of a statistical model. Due to the network nature of the system, direct measurements of these quantities from Hall experiments are not possible. Search for a better way to estimate mobility in this system thus becomes important. Since, strain can also lead to the blue-shift of the bandgap, it is also imperative to evaluate carefully the role of strain. Here, using Raman spectroscopy, we have estimated carrier concentration and mobility in these nanowall networks with varied average tip-widths. Depth distribution of strain and luminescence characteristics are also studied. The study reveals that strain has no role in the bandgap enhancement. Moreover, the electron mobility, which is determined from the lineshape analysis of the A1(LO)-plasmon coupled mode in Raman spectra, has been found to be significantly higher than the theoretical limit of mobility for bulk GaN for the same electron concentration. These results thus corroborate the picture of polarization induced vertical 2DEG formation in these walls as predicted theoretically. [ABSTRACT FROM AUTHOR]

Wafer-scale thin films of hexagonal boron nitride have exceptional thermal and mechanical properties, which harness the potential use of these materials in two-dimensional electronic, device applications. Along with unavoidable defects, grains, and wrinkles, which develop during the growth process, underlying substrates influence the physical and mechanical properties of these films. Understanding the interactions of these large-scale films with different substrates is, thus, important for the implementation of this 2D system in device fabrication. MOVPE-grown 2 and 30 nm hBN/sapphire films of size 2 in. diameter are delaminated chemically and transferred on quartz, SiO2/Si, and sapphire substrates. The structural characteristics of these films are investigated by employing Raman spectroscopy. Our results suggest that not only the roughness but also the height modulation at the surface of the substrates play a pivotal role in determining substrate-mediated mechanical strain inhomogeneity in these films. The statistical analysis of the spectral parameters provides us with the overall characteristics of the films. Furthermore, a Stark difference in the thermal evolution of strain in these films depending on substrate materials is observed. It has been demonstrated that not only the differential thermal expansion coefficient of the substrates and the films, but also slippage of the latter during the thermal treatment determines the net strain in the films. The role of the slippage is significantly higher in 2 nm films than in 30 nm films. We believe that the observations provide crucial information on the structural characteristics of the substrate-coupled wafer-scale hBN films for their future use in technology. [ABSTRACT FROM AUTHOR]

We report a detailed ab initio study of two superlattice heterostructures, one component of which is a unit cell of CuPt ordered InSb 0.5 As 0.5 . This alloy part of the heterostructures is a topological semimetal. The other component of each system is a semiconductor, zincblende-InSb, and wurtzite-InAs. Both heterostructures are semiconductors. Our theoretical analysis predicts that the variation in the thickness of the InSb layer in InSb/InSb 0.5 As 0.5 heterostructure renders altered bandgaps with different characteristics (i.e., direct or indirect). The study holds promise for fabricating heterostructures, in which the modulation of the thickness of the layers changes the number of carrier pockets in these systems. [ABSTRACT FROM AUTHOR]

The underlying physics which explains the role of cationic and anionic defect dynamics in determining the catalytic activity and ionic conductivity of aliovalent ion-doped ceria is complex and not yet fully understood. To address this issue, we have investigated the structural evolution of LaxCe1-xO2–δ, where x =0.1, 0.2, 0.3, 0.4, and 0.5. Rietveld refinements of the X-ray diffraction patterns reveal that the crystal structure belongs to a disordered fluorite phase for all samples. We find a systematic increase in the lattice parameter along with a gradual decrease in oxygen site occupancy with the increase in La3+ doping concentration. In Raman spectra of doped compounds, other than well-known crystalline F2g and defect related modes, we observe the presence of an additional Raman mode. The Raman line-shape analysis indicates the non-resonant Fröhlich character of this mode. Temperature dependent Raman measurements demonstrate unique characteristics of this Raman peak. In addition, from the change in relative intensity ratio of the Raman modes related to different types of defect states, we show that vacancies cannot be considered as isolated defects beyond a critical doping level. We propose that the evolution of Raman intensities of defect related modes and Fröhlich mode with the doping level can be used as a marker to determine the role of electron-phonon coupling and anion vacancies in the catalytic activity of doped ceria. Furthermore, by studying the photocatalytic measurements for La3+ doped ceria compounds, we demonstrate that the anion vacancies do not always play a direct role in controlling functional properties. [ABSTRACT FROM AUTHOR]

The crystallization of amorphous selenium films was conducted by exposing them to simultaneous irradiation of a 488.0 nm line of Ar+ and a 676.4 nm line of a Kr+ laser by cross-band-gap and sub-band-gap light irradiation. It was observed that the crystallized amorphous selenium films displayed Raman spectra similar to that of trigonal crystalline. Results indicate that the crystallization process is delayed when the material is expose to both of the sources simultaneously.

We embarked on a study of Scandium (Sc) doped (onto Ga site) gallium ferrite (GaFeO3) and found remarkable magnetic properties. In both doped as well as parent compounds, there were three types of Fe3+ions (depending on the symmetry) with the structure conforming to space group Pna21 (Sp. Grp. No. 33) below room temperature down to 5 K. We also found that all Fe3+ions occupy octahedral sites, and carry high spin moment. For the higher Sc substituted sample (Ga1-xScxFeO3:x = 0.3), a canted magnetic ordered state is found. Spin-phonon coupling below Néel temperature was observed in doped compounds. Our results indicated that Sc doping in octahedral site modifies spin-phonon interactions of the parent compound. The spin-phonon coupling strength was estimated for the first time in these Sc substituted compounds. [ABSTRACT FROM AUTHOR]

The correlations between properties of hydrogenated diamondlike carbon films and their Raman spectra have been investigated. The films are prepared by plasma deposition technique, keeping different hydrogen to methane ratios during the growth process. The hydrogen concentration, sp3 content, hardness, and optical Tauc gap of the materials have been estimated from a detailed analysis of their Raman spectra. We have also measured the same parameters of the films by using other commonly used techniques, such as sp3 content in films by x-ray photoelectron spectroscopy, their Tauc gap by ellipsometric measurements, and hardness by microhardness testing. The reasons for the mismatch between the characteristics of the films, as obtained by Raman measurements and by the above mentioned techniques, have been discussed. We emphasize on the importance of the visible Raman spectroscopy in reliably predicting the above key properties of diamondlike carbon films. [ABSTRACT FROM AUTHOR]

Optical properties of nanocrystalline red-emitting phosphor, europium-doped yttria (Y2O3:Eu3+), of average particle size of 15 nm are investigated. The intensity of the strongest emission line at 612 nm is found to be highest in the nanocrystalline sample with 4 at. wt % of europium. The narrow electronic emission spectrum suggests a crystalline surrounding in this nanomaterial. We have estimated the strength of the crystal-field parameter at the dopant site, which plays a crucial role in determining the appearance of the intense emission line. The equilibrium temperature of this system has also been calculated from the intensity ratio of Stokes and anti-Stokes Raman scattering. Though known for the bulk samples, our approach and consequent results on the crystalline nanomaterial of Y2O3:Eu3+ provide a unique report, which, we believe, can be of considerable significance in nanotechnology. [ABSTRACT FROM AUTHOR]

An investigation on the optical properties of nanocrystalline red-emitting phosphor, europium-doped yttria [Y2O3:Eu(super 3+)], of average particle size of 15 nm is presented. The intensity of the strongest emission line at 612 nm is found to be highest in the nanocrystalline sample with 4 at. wt% of europium.

Optical properties of nanocrystalline red-emitting phosphor, europium-doped yttria (Y2O3:Eu3+), of average particle size of 15 nm are investigated. The intensity of the strongest emission line at 612 nm is found to be highest in the nanocrystalline sample with 4 at. wt % of europium. The narrow electronic emission spectrum suggests a crystalline surrounding in this nanomaterial. We have estimated the strength of the crystal-field parameter at the dopant site, which plays a crucial role in determining the appearance of the intense emission line. The equilibrium temperature of this system has also been calculated from the intensity ratio of Stokes and anti-Stokes Raman scattering. Though known for the bulk samples, our approach and consequent results on the crystalline nanomaterial of Y2O3:Eu3+ provide a unique report, which, we believe, can be of considerable significance in nanotechnology. [ABSTRACT FROM AUTHOR]