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The layered van der Waals compounds ( MnBi 2 Te 4)( Bi 2 Te 3) were recently established as the first intrinsic magnetic topological insulators. We report a study on the epitaxial growth of (MnBi 2 Te 4) m (Bi 2 Te 3) n films based on the co-deposition of MnTe and Bi 2 Te 3 on BaF 2 (111) substrates. X-ray diffraction and scanning transmission electron microscopy evidence the formation of multilayers of stacked MnBi 2 Te 4 septuple layers and Bi 2 Te 3 quintuple layers with a predominance of MnBi 2 Te 4. The elemental composition and morphology of the films is further characterized by x-ray photoemission spectroscopy and atomic force microscopy. X-ray magnetic circular and linear dichroism spectra are comparable to those obtained for MnBi 2 Te 4 single crystals and confirm antiferromagnetic order in the films. [ABSTRACT FROM AUTHOR]

Presents a study that reported a method for characterizing heteroepitaxial structures using hybrid multiple diffractions which appear in the layer Renninger scans together with the normal MD features. Renninger scan peak profile for mosaic crystals; Misorientation between layer and substrates lattices; Refractive index correction.

Presents information on a study which described the successful observation of the hybrid multiple diffraction in Renninger scans using gallium arsenide grown on a silicon substrate. Methods; Results; Discussion.