1. Optical study of Tm-doped solid solution (Sc0.5Y0.5)2SiO5 crystal.
- Author
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Shi, Jiaojiao, Liu, Bin, Zheng, Lihe, Wang, Qingguo, Tang, Huili, Liu, Junfang, Su, Liangbi, Wu, Feng, Zhao, Hengyu, He, Nuotian, Li, Na, Li, Qiu, Guo, Chao, Xu, Jun, Yang, Kejian, Xu, Xiaodong, Ryba-Romanowski, Witold, Lisiecki, Radosław, and Solarz, Piotr
- Subjects
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CRYSTAL growth , *NEAR infrared spectroscopy , *TEMPERATURE effect , *CRYSTAL structure , *THULIUM - Abstract
Tm-doped (Sc 0.5 Y 0.5 ) 2 SiO 5 (SYSO) crystals were grown by Czochralski method. The UV-VIR-NIR absorption spectra and the near-infrared emission spectra were measured and analysed by the Judd-Ofelt approach. Temperature influence on both absorption and emission spectra has been determined from the data recorded at room temperature and 10 K. It has been found that the structural disorder resulting from dissimilar ionic radii of Sc 3+ and Y 3+ in the solid solution (Sc 0.5 Y 0.5 ) 2 SiO 5 crystal brings about a strong inhomogeneous broadening of Tm 3+ ions spectra. However, it affects the excited state relaxation dynamics inherent to thulium-doped Y 2 SiO 5 and Sc 2 SiO 5 hosts weakly. [ABSTRACT FROM AUTHOR]
- Published
- 2018
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