1. Reliability evaluation of a 0.25 μm SiGe technology for space applications.
- Author
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Robin, C., Rochette, S., Desgrez, S., Muraro, J.L., Langrez, D., Roux, J.L., and Krstic, M.
- Subjects
- *
MONOLITHIC microwave integrated circuits , *ASTRONAUTICS , *RELIABILITY in engineering - Abstract
This article presents a reliability evaluation of the SiGe SGB25 technology from the European foundry IHP. We propose in this paper a methodology allowing to take into account reliability space requirements. For that, specific test vehicles have been designed and dedicated test sequences have been defined. The final goal is to define a MMIC (Monolithic Microwave Integrated Circuit) safe operating area in terms of static and dynamic electrical constraints. Emphasis will be given to the influence of the degradation modes on noise parameters. [ABSTRACT FROM AUTHOR]
- Published
- 2019
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