Search

The article presents the first part of a two part series regarding the design of anechoic chambers giving a thorough treatment of the subject that could be used as a reference piece. It covers radio frequency (RF) absorber approximations for rectangular far field ranges. The applications where an antenna is radiating or receiving a given signal, and its performance as a function of direction is being measured.

The article discusses how to ensure success in radio frequency identification (RFID) with pre-compliance testing. It elaborates the importance of proper display of certification trademark that indicates performance compatibility, where most industry standards require successful completion of a battery of compliance tests. Related issues are further discussed including RFID testing challenges, pre-compliance testing solutions, spectral emissions pre-compliance testing and meeting industry standards.

The article describes different types of multiple input-multiple output (MIMO) measurements, which include an aproach for including channel impairments such as noise and interference. It presents a comparison between single input-single output (SISO) communication system and MIMO. It claims that increases in data throughput from MIMO techniques come with added system complexity that results in challenges when designing test equipment and measurement systems for evaluating the performance of MIMO systems and their components. Related issues are further discussed.

The article features the applications of Nonlinear Vector Network Analyzer (NVNA) applications. It states that NVNA performs a variety of measurements for a number of different application areas. It can also be used to analyze complex signal behavior while applying Vector Network Analysis (VNA) error correction, providing extremely accurate signal analysis capabilities. Related issues further discussed include mathematical representation of frequency spectrum, NVNA architecture and NVNA measurement applications.

The article discusses the state of test technology and the needs of the test and measurement equipment industry. It presents comments from several test and measurement equipment vendors on how new technologies such as multiple input-multiple output systems (MIMO), Long Term Evolution (LTE) and DigRF impact radio frequency (RF) and microwave testing. The executives who presented their comments include Carla Feldman of Agilent Technologies Inc. and engineers at Keithley Instruments Inc. Related issues are further elaborated including advances in test equipment and digital oscilloscopes.

The article focuses on the 50-year evolution and the visibility of the test equipment and scattering parameters or S-parameters for characterizing radio frequency (RF) microwave behavior. It stated that the emergence of vector network analyzers and S-parameters measurements are important to the engineers to design with newly available high frequency semi-conductors that were performed using test systems implemented with rudimentary signal generators, power detectors and impedance bridges. Moreover, the network analyzer measures the attributes of new devices and materials to address the needs of new applications, operating conditions, and parametric analyses.

The article focuses on the development of the local area network (LAN) extensions for instrumentation (LXI) standard to elaborate the role of test and measurement instruments in the development of technologies. Bob Helsel, executive of LXI Consortium, highlighted the background and objectives of the standard. Interviews of representatives from several manufacturers of the instruments, including David Poole and Jochen Wolle, are given to highlight the commercial interest of the standard.

The article presents information on the companies showcasing their products at the 2006 IEEE MTT-S Radio and Wireless exhibition. Some of the companies that are participating in the exhibition are: Advanced Test Equipment Corp., which offers rental, sale and lease solutions for test and measurement requirements; Anethercomm Inc., which is a leading provider of high power linear and pulsed solid-state power amplifiers; Agilent Technologies, which is a global technology leader in communications, electronics, life sciences and chemical analysis.

The article offers information on several measurements for testing long-term evolution (LTE) receiver performance which includes reference sensitivity level, adjacent channel selectivity and intermodulation characteristics. Topics include vector signal generator (VSG), the device under test (DUT) or user equipment (UE) and higher power out-of-band signals.

The article offers the reviews of LTC®5597, a high accuracy RMS power detector that provides a very wide RF input bandwidth, from thinkRF Ottawa, Canada.

The article presents several products inclduing RF test equipment is affordable and compact enough to fit in a backpack perfect for portable from Signal Hound, Growth Initiative Aerospace & Defense from HUBER+SUHNER AG, and Conducted Immunity Test System from AR RF/Microwave Instrumentation.

The article evaluates two high frequency sites (HFS) radio frequency (RF) test probes including the HFS 860 201 051 A 5306 S and the HFS 860 303 150 A 5343 ER.

The article reports that Ashkelon, Israel-based Vectria Ltd. has developed the RealProbe family of accurate radio frequency (RF) and microwave in-circuit testing probes for both absolute and relative frequency and time domain measurements, using any measurement equipment. To perform adequate in-circuit probing, the probe should have a high input impedance in order to avoid loading of the circuit tested, proper grounding and inner equalization in order to enable broadband flat and accurate coupling. There are numerous applications for in-circuit testing within multifunction RF and microwave boards, starting from the obvious block's gain measurements, up to time domain and EVM measurements.

The article evaluates the M2p digitizer from electronic parts provider Spectrum Instrumentation GmbH and outlines its features.

The article offers information regarding establishment of Holzworth Instrumentation which relies heavily on U.S. based, ISO certified contract manufacturers to build most of their PCBs, but does all of the integration, test and calibration at its factory in Boulder to ensure high quality. It presents information on the automated test equipment (ATE) approach.

The article presents a new website of Custom MMIC, an electronic parts supplier, featuring several company's products, a video from test and measurement equipment manufacturer Keysight Technologies on X-Series signal analyzers, and professional services Weinschel Associates Inc.'s website.

The article evaluates the Wireless Test System (WTS) from National Instruments Corp.

The article focuses on passive intermodulation (PIM) test provider Kaelus of which products have set a standard in manufacturing and field test. It states that the company focused on building a strengthened design to resist the harsh environment of hoisting units and field testing. It says that the firm has merged in a WiFi access point and provided a WiFi-enabled tablet to suit test remote control by ground personnel.

The article discusses the setup of manufacturer of test and measurement equipment Rohde & Schwarz (R&S) vector signal generators (SMW200A). It states that R&S SMW200A can be equipped with two internal baseband modules, four fading simulator, and two RF paths. It also mentions that R&S SMW200A has significantly reduced test setup complexity which allows users to upgrade as it is required.

The article evaluates microwave device testing equipment, including the MW8209A PIM Master passive intermodulation (PIM) analyzer from Anritsu Corp., the PLXO-100 phase-locked crystal oscillator from EM Research Inc., and the mixed signal oscilloscope (MSO) hardware option for the RTO high performance oscilloscope from Rohde & Schwartz.

The article offers information on oscillator devices with standard package that are beneficial in military applications. It states that the oscillators are used in every type of application to test equipment and their universal availability and small size make them ideal for most applications. It mentions Valpey Fisher Corp.'s VFH3225 miniature oscillator which takes advantage of the latest package technology.

The article evaluates several test equipment including the signal generator from Noisecom, S412D LMR Master handled test instrument from Anritsu Co. and ZMA test cables from MegaPhase LLC.

The article evaluates several test equipment including the DIN type calibration kit from GigaLane Co. Ltd., the KU SG 2325 100 high power signal generator from Kuhne Electronic GmbH, the R&S FSV13 and R&S FSV30 signal and spectrum analyzers from Rohde & Schwarz.

The article evaluates several test equipment including PWR-6G+USB power sensor from Mini-Circuits, RF Conducted Immunity Test System from AR RF/Microwave Instrumentation, and EDGE Flicker Noise Measurement System from Cascade Microtech Inc.

The article reports on the accomplishment of a major integrated test milestone on the first Space-based Infrared System (SBIRS) geosyn-chronous orbit (GEO-1) spacecraft that enables the start of environmental testing in preparation for launch in 2009 as announced by Lockheed Martin in the U.S. The author stated that the GEO-1, which is designed to provide new missile detection and surveillance capabilities for the nation has completed the comprehensive baseline integrated system test (BIST) phase in early March. Jeff Smith, SBIRS vice president and general manager, has stated that the comprehensive test, confirms the readiness of the equipment to enter the critical environmental test stage.

The article evaluates several test equipment including a Log Periodic Antenna from AR RF/Microwave Instrumentation, a Handheld Spectrum Analyzer from Wireless Telecom Group Inc., and a 12.5 Gbps 1:8 Demultiplexer from Inphi Corp.

The article presents information about testing equipment related to the electronics industry. Bedfordshire, England-based Anritsu Co.'s MG3700A stand-alone vector signal generator for outputting wide-band modulation signals addresses the needs of the communications industry to test widening frequency bandwidths associated with new wireless communications systems using a single signal generator. Helsinki, Finland-based Sofimation Ltd.'s SOFI 06 radio channel simulator is a RF fading simulation solution that supports all possible GSM bands, 3G conformity and 3G deployment tests.

The article offers information on the FlexMatrix Differential Series signal integrity testing instruments and FlexMatrix Radio Frequeny (RF) Switch Matrix Family from SenarioTek.

The article provides brief information on portable Passive Intermodulation (PIM) analyzer from Kaelus, a passive intermodulation test solutions provider.

The article looks at a 2012 report from market analyst Frost & Sullivan that forecast increased demand for wireless testing equipment in the Latin American markets through 2017, citing the adoption of advanced third- and fourth-generation (3G and 4G) wireless communication standards in the region.

The article evaluates testing equipment products, including the AM223 pulser from AMCAD Engineering and radio frequency (RF) phase stable cables from RF Precision Products.

The article presents a comparison of two electronic equipment including Agilent N5450A InfiniiMax extreme-temperature extension cable from Agilent Technologies Inc. and CDMA2000 1xEV-DO from Anritsu Co.

The article reports on the founding of the Reference Design Centre (RDC) by NXP Seminconductors in Graz, Austria. The effort aims to facilitate deployment and adoption of the radio frequency identification (RFID) system technology. The RDC improves the performance and reliability of existing RFID systems by testing applications under real life conditions for various industries. According to general manager Jan-Willem Reynaerts, RFID technology changes how organizations operate and it is vital that before implementing RFID solutions, all the elements are ready to use in one's business environment.

The article evaluates the AS40000 Radiated Immunity Test System from AR RF/Microwave Instrumentation and the R&S AMU200A baseband signal generator from Rohde & Schwarz GmbH & Co. KG.

The article presents several microwave test equipment. They include Boonton Electronics' models 52012 and 52018 USB Power Meters, NoiseWave Corp.'s model NW6G-26-CS coaxial noise source with built-in test applications, Elektrobit's base station interface tester, Pendulum Instruments AB's CNT-90XL microwave counter and Rohde and Schwarz GmbH and Co.'s FMU36 baseband analyzer.

The article evaluates several commercial products related to testing equipment, including the 9100 spectrum analyzer series from Boonton Electronics Corp., the complete set of EDA products and capabilities from Cadence Design Systems Inc., and the NW2.7G-HP-M1 model of manual high power output noise generator from Noise Wave Corp., among others.

The article presents information on the Lightwave Catalog from Agilent Technologies Inc. The catalog provides detailed information on the company's solutions for optical, electrical, protocol and service-level testing for the installation and commissioning of broadband and triple-play services and infrastructures.

The article presents information on new testing equipment. The MT8860B Wireless LAN test set from Anritsu Corp. is designed for radio layer measurements on all 802.11b/g devices and simulates a WLAN Access Point for testing devices under normal operating conditions, eliminating the need for special test mode software. This TGAR transient generator system from AR Worldwide is capable of generating custom pulses and can handle a large percentage of existing specifications. The complete TGAR system meets the requirements of ISO 7637-2 and SAE J1113-11.

The article presents information on the Product Brochure Wenzel Associates Inc. The brochure highlights the manufacturing details of precision crystal oscillators and related radio frequency devices designed by the company for the communications, navigation, military and test equipment markets.

The article reports that Silicon Laboratories Inc. is going to enter into the frequency control market with the Si530 and Si550 families of oscillators and voltage-controlled oscillators for applications up to 1.4 GHz. Short lead times, high reliability and good performance will be provided by both the Si530 and Si550 families. These are ideal for applications such as networking equipment, base stations, test and measurement equipment, and storage area networks.

This article presents information on some new test equipments introduces in the market related to wireless communication. The model N6030A is a wideband arbitrary waveform generator. With the N6030A digital signal processing and system engineering can rapidly create realistic wideband signals for the design and test of advanced radar, satellite and emerging communication system. The model UFX-9835 is a test instrument that generates near-end crosstalk and far-end crosstalk for production testing of digital subscribers line modems.

Presents an update on the equipment market. Representation of the contribution percentage of the various application segments to the fiber optic test equipment market in 2003; Highlights of the revenue forecasts.

Features several test equipment. ASL 3000RF RFIC test system from Credence Systems Corp.; DNG7500 series digital noise generator from Noise Com; BitAlyzer BA1500 multi-function bit error rate test system from SyntheSys Research Inc.