1. Design of a variable temperature scanning force microscope.
- Author
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Nazaretski, E., Graham, K. S., Thompson, J. D., Wright, J. A., Pelekhov, D. V., Hammel, P. C., and Movshovich, R.
- Subjects
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MICROSCOPES , *SCANNING force microscopy , *TEMPERATURE measurements , *MAGNETIC resonance force microscopy , *MAGNETIC force microscopy , *INTERFEROMETRY , *CANTILEVERS ,DESIGN & construction - Abstract
We have developed the variable temperature scanning force microscope capable of performing both magnetic resonance force microscopy (MRFM) and magnetic force microscopy (MFM) measurements in the temperature range between 5 and 300 K. Modular design, large scanning area, and interferometric detection of the cantilever deflection make it a sensitive, easy to operate, and reliable instrument suitable for studies of the dynamic and static magnetization in various systems. We have verified the performance of the microscope by imaging vortices in a Nb thin film in the MFM mode of operation. MRFM spectra in a diphenyl-picryl-hydrazyl film were recorded to evaluate the MRFM mode of operation. [ABSTRACT FROM AUTHOR]
- Published
- 2009
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