25 results on '"Ice, G.E."'
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2. Mapping strain gradients in the FIB-structured InGaN/GaN multilayered films with 3D X-ray microbeam
3. Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies
4. Multiple differential-aperture microscopy
5. Automated software for the recovery of the short range order parameters from diffuse X-ray scattering data
6. Reflective optics for microdiffraction
7. Diffuse X-ray scattering measurements of point defects and clusters in iron
8. High-performance Kirkpatrick-Baez supermirrors for neutron milli- and micro-beams
9. Quantitative characterization of electromigration-induced plastic deformation in Al(0.5wt%Cu) interconnect
10. X-ray fluorescence microtomography study of trace elements in a SiC nuclear fuel shell
11. Polychromatic microdiffraction analysis of defect self-organization in shock deformed single crystals
12. Advances in microstructural characterization
13. Characterization of three-dimensional crystallographic distributions using polychromatic X-ray microdiffraction
14. Gradients of geometrically necessary dislocations from white beam microdiffraction
15. X-ray microbeam measurements of subgrain stress distributions in polycrystalline materials
16. Characterization of nano and meso scale deformation structures with intense X-ray synchrotron sources
17. Mosaic crystal X-ray spectrometer to resolve inelastic background from anomalous scattering experiments
18. Focusing optics for a synchrotron x-radiation microprobe
19. Synchrotron X-ray microdiffraction analysis of proton irradiated polycrystalline diamond films
20. Inhomogeneous deformation behavior in intercrystalline regions in polycrystalline Ni.
21. Interface strength in NiAl–Mo composites from 3-D X-ray microdiffraction
22. Indentation-induced localized deformation and elastic strain partitioning in composites at submicron length scale
23. X-ray microdiffraction and strain gradient crystal plasticity studies of geometrically necessary dislocations near a Ni bicrystal grain boundary
24. Differential-aperture X-ray structural microscopy: a submicron-resolution three-dimensional probe of local microstructure and strain
25. Micron-resolution 3-D measurement of local orientations near a grain-boundary in plane-strained aluminum using X-ray microbeams
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