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The measurement of distance plays an integral part in many aspects of modern societies. In this paper an integrated mode-locked laser on a chip is used for distance measurement based on mode-resolved interferometry. The emission from the on-chip source with a repetition rate of 2.5 GHz and a spectral bandwidth of 3 nm is coupled into a Michelson interferometer. The interferometer output is recorded as a spectral interferogram, which is captured in a single camera image. The images are analyzed using Hilbert transform to extract the distance. The distance derived shows a deviation of 6 \mum from the reference, for a distance up to 25 mm. We also demonstrate interferometry with repetition frequency sweep which can also be used with the source. Performance is expected to be better in the near future with the rapid developments in the field of on-chip laser sources which are demonstrating larger spectral widths and coherence lengths.

Low-excess-loss arrayed waveguide gratings are enabled by unique application of deep UV lithography in InP integrated photonics through reduced feature sizes and, more specifically, well-resolved inter-waveguide gap dimensions. Submicrometer wafer-flatness is shown to be required to achieve the critical dimension uniformity better than 10 nm on 3-in substrates. Arrayed waveguide grating devices were fabricated and the effect of inter-waveguide gap scaling on the excess losses was measured and compared to simulations. Excess losses down to 0.15 dB were demonstrated to be lower than predicted with the 2-D simulations. The tapering of the etch depth inside the gaps due to the lag effect of the etch process may explain the improvements.

The standardization of photonic integration processes for InP has led to versatile and easily accessible generic integration platforms. The generic integration platforms enable the realization of a broad range of applications and lead to a dramatic cost reduction in the development costs of photonic integrated circuits (PICs). This paper addresses the SMART Photonics generic integration platform developments. The integration technology based on butt joint active-passive epitaxy is shown to achieve a platform without compromising the performance of the different components. The individual components or building blocks are described. A process design kit is established with a comprehensive dataset of simulation and layout information for the building blocks. Latest results on process development and optimization are demonstrated. A big step forward is achieved by applying high-resolution ArF lithography, which leads to increased performance for AWGs and a large increase in reproducibility and yield. The generic nature of the platform is demonstrated by analyzing a number of commercial multiproject wafer runs. It is clear that a large variety of applications is addressed with more than 200 designs from industry as well as academia. A number of examples of PICs are displayed to support this. Finally, the design flow is explained, with focus on layout-aware schematic-driven design flow that is required for complex circuits. It can be concluded that generic integration on InP is maturing fast and with the current developments and infrastructure it is the technology of choice for low cost, densely integrated PICs, ready for high-volume manufacturing.

Foundry services for photonic integration enable access to such technologies and facilitate fab-less businesses models. The technologies are sufficiently mature for proof-of-concept demonstrators, advanced prototypes, and two-medium small-volume production. Further improvement of the technology processes behind those services requires extensive research and development efforts in order to advance the foundry offerings and assure scalability, process control, and the yield required for volume production. A high-level automation of test and assembly processes in the PIC manufacturing chain is essential to improve statistical process control and scalability of all processes. These allow for early known-good-die identification, optimization of fabrication process window, improved yield, and volume production. In this paper we propose a standardized approach to chip layout that supports automated test and assembly processes already at the design phase. Moreover, we describe a modular test software framework based on open standards. Within this test framework, standard file formats for chip, equipment, and measurement description, and the open file formats for storage and exchange of data are described. This test framework is a part of the openEPDA initiative and enables test automation, user-defined testing, data analysis, exchangeability, and traceability across the full manufacturing chain from design to product.

An array of monolithic wide-tunable lasers is integrated using selective area growth to shift the bandgap of their gain section. A gap-free tuning is demonstrated from the combination of the tuning ranges of the lasers, and single-mode operation is verified.

Selective area growth is used for the first time in the TU/e generic integration platform to modify independently the bandgap of active sections. A chip combining 4 tunable lasers with shifted wavelength ranges has been fabricated. A 96 nm wide tuning range is demonstrated.

Access to fabrication of photonic integrated circuits is enabled via multi-project wafer runs offered by foundries. Such services open a path for proof-of-concept demonstrators and advanced prototypes. However, the technology processes behind those services need extensive developments in order to be scalable and suitable for volume production. Those developments are in a vast part related to test, assembly and packaging across the full PIC manufacturing chain. Standardization and automation of the test methods and equipment is essential for better statistical process control and scalability. When implemented, these will allow for early known-good-die identification, optimization of fabrication process window, improved yield and volume production.The challenges related to PIC testing will be discussed and current developments in our labs towards standardization and automation of test methods from a design phase to system level functional module evaluation will be presented.

We present our work on the realization of integrated III/V-on-silicon integrated mode-locked lasers. We demonstrate 1 GHz repetition rate mode-locked lasers with a spectrum spanning more than a 1 THz.

ArF deep UV (193 nm) lithography was successfully applied to fabricate Arrayed Waveguide Gratings in generic Indium Phosphide technology. The sub-dB transmission losses demonstrate the advantages of scaling down the minimum feature size to 100 nm.

We report a novel type of monolithically integrated tunable semiconductor laser. The tuning is achieved by three intracavity Mach–Zehnder interferometers, realized in passive waveguides and using voltage-controlled electro-optic phase modulators requiring only four control voltages. The potential of the design is demonstrated by a realized laser system that shows an optical linewidth of 363 kHz, output power of 3 mW, and a record tuning range of 74.3 nm. Such a continuous wavelength span is in excess of any monolithic semiconductor laser reported up to date. Precision of the tuning mechanism is demonstrated by a scan over a 0.89-GHz-wide absorption line of acetylene. The laser design is suitable for a number of applications, including gas spectroscopy, telecommunication, and optical coherence tomography. The laser has been fabricated in a multi-project wafer run on an indium phosphide-based generic photonic foundry platform and demonstrates the potential of these technology platforms.

Picosecond-pulse III-V-on-silicon mode-locked lasers based on linear and ring extended cavity geometries are presented. In passive mode-locked operation a 12 kHz -3dB linewidth of the fundamental RF tone at 4.7 GHz is obtained for the linear cavity geometry and 16 kHz for the ring cavity geometry. Stabilization of the repetition rate of these devices using hybrid mode-locking is also demonstrated.

Optical frequency combs emerge as a promising technology that enables highly sensitive, near-real-time spectroscopy with a high resolution. The currently available comb generators are mostly based on bulky and high-cost femtosecond lasers for dense comb generation (line spacing in the range of 100 MHz to 1 GHz). However, their integrated and low-cost counterparts, which are integrated semiconductor mode-locked lasers, are limited by their large comb spacing, small number of lines and broad optical linewidth. In this study, we report a demonstration of a III-V-on-Si comb laser that can function as a compact, low-cost frequency comb generator after frequency stabilization. The use of low-loss passive silicon waveguides enables the integration of a long laser cavity, which enables the laser to be locked in the passive mode at a record-low 1 GHz repetition rate. The 12-nm 10-dB output optical spectrum and the notably small optical mode spacing results in a dense optical comb that consists of over 1400 equally spaced optical lines. The sub-kHz 10-dB radio frequency linewidth and the narrow longitudinal mode linewidth (

In this paper, we present the detailed characterization of a semiconductor ring passively mode-locked laser with a 20 GHz repetition rate that was realized as an indium phosphide based photonic integrated circuit (PIC). Various dynamical regimes as a function of operating conditions were explored in the spectral and time domain. A record bandwidth of the optical coherent comb from a quantum well based device of 11.5 nm at 3 dB and sub-picosecond pulse generation is demonstrated.

We report, to the best of our knowledge, the first demonstration of 320 Gb/s all-optical clock recovery and all-optical time de-multiplexing after 51 km transmission by exploiting single-quantum dash mode-locked laser diode (QD-MLLD). Based on injection locking of the QD-MLLD, the 40 GHz synchronized optical clock pulses were recovered from the 320 Gb/s with a pulse width of 1.9 ps and timing jitter of 135 fs, which allowed directly time de-multiplexing of 320-40 Gb/s without additional complex optoelectronic circuitry. The 320-40 Gb/s all-optical de-multiplexing was achieved with averaging a power penalty of 4.5 dB at BER of 1E-6.

In this study, we provide an experimental assessment of a quantum dash Fabry–Perot´ mode-locked laser for all-optical clock recovery using data streams at 40, 80, 160, and 320 Gb/s. The data streams at 80, 160, and 320 Gb/s are phase coherent signals featuring no spectral component at 40 GHz. The 40 GHz recovered optical clock signal is characterized in terms of phase noise, timing jitter, dynamic power range, and wavelength dependence for the different data rates. Our experiments demonstrate a recovered optical clock signal from a 320 Gb/s data stream with a timing jitter of 94 fs and wavelength detuned by 23 nm. In addition, the performance of the optical time division multiplexing receiver at 80 and 160 Gb/s data signals employing the recovered clock as a demultiplexing control signal and as a clock for the bit-error-rate tester (BERT) is evaluated by bit error rate measurements on the demultiplexed data signals.

In this paper we introduce the III–V photonic integration platforms for emerging applications beyond telecommunications. Recent achievements in the InP generic and InP membrane platforms for wireless and sensing applications are reviewed. The realized chips show the great potential of the InP-based photonic integration due to its full functionality, high flexibility and high performance.

Generic photonic integration technology platforms allow for design and fabrication of large complexity application specific photonic integrated circuits. Monolithic active-passive integration on indium phosphide substrate naturally enables a reliable co-integration of optical gain elements and therefore on-chip realization of advanced laser systems. An overview of multi-wavelength sources in the form of photonic integrated circuits fabricated using such integration technology for applications in telecommunications, sensing, millimeter and terahertz generation will be given.

Progress on the development of a long wavelength (∼2 µm) generic monolithic photonic integration technology on indium phosphide substrate and a novel concept of a tunable laser realized as a photonic integrated circuit using such technology are presented. Insights into the development of active and passive waveguide structures which are used to define a limited set of on-chip functionalities in the form of building blocks will be given. A novel tunable laser was proposed and designed using such predefined set of basic building blocks. The laser geometry features an intra-cavity wavelength tuning mechanism based on asymmetric Mach-Zehnder interferometers in a nested configuration. The photonic integrated circuit chip was fabricated within the first long wavelength multi-project wafer run. The experimental evaluations of the fabricated device show a record tuning range of 31 nm around 2027 nm and successful measurements of a 0.86 GHz wide absorption line of carbon dioxide. These results provide a demonstration of a fully functional photonic integrated circuit operating at wavelengths that are much longer than those in the typical telecommunication windows as well as the use of indium phosphide based generic photonic integration technologies for gas sensing applications.

The performance of integrated planar waveguide mode locked lasers can be enhanced using the available photonic integration platform technology in indium-phosphide. Extended cavity mode locked oscillators including DBR mirrors and phase modulators can be realized at telecom wavelengths to improve performance and control over the device. Integrated pulse shapers and special amplifiers can be used to improve the output properties further.

The authors present the design and characterization of a novel integrated two-section discrete mode index patterned diode laser source. The two slotted regions etched into the laser ridge waveguide are formed in the same fabrication step as the ridge, thus avoiding the requirement for complex lithography and regrowth steps. The laser is encased in a temperature-controlled butterfly package, which simplifies the static and dynamic measurements. Initial static characterization of this two-section laser shows that the injection, from the master laser to the slave laser, enhances the slave's emission side-mode suppression ratio from 30 dB to over 50 dB and its relative intensity noise is reduced from about -129.3 dB/Hz to -142.6 dB/Hz. Subsequent dynamic characterization then shows that the modulation bandwidth of the laser can be improved via injection to about three times the inherent free-running bandwidth. Hence, optical injection from master section into slave section enables the improvement of various parameters, which makes this two-section device attractive as a transmitter in optical communication systems.

For the first time we demonstrate an anti-colliding mode-locked laser implemented on a III-V-on-silicon platform. In passive mode-locked operation a 1.7kHz 3dB linewidth of the fundamental RF tone at 4.83GHz is obtained.

A review is given of a number of lasers in a form of photonic integrated circuits realized on InP substrate using a generic integration approach. The potential of these photonic circuits lies in their compactness, low power consumption, and significant reduction of fabrication cost by realization in generic foundry runs. Generic integration platforms offer the possibility of realizing functionally advanced photonic circuits using combinations of just a few standardized and parameterized building blocks. This vibrant field opens new doors to innovative product development for SMEs as well as curiosity-driven research.

A tunable laser for single line gas spectroscopy is realized as a monolithic photonic integrated circuit in an InP based generic foundry platform. The laser operates at wavelengths around 2.0 μm and has a tuning range of 22 nm.

In this paper we present our recent progress on 2.5 GHz mode-locked, quantum well lasers operating at 1550 nm. Two such lasers are monolithically integrated on an InP substrate. Stable passive and hybrid mode-locking of both lasers operating at the same time with a small repetition rate difference is demonstrated.

Experimental and simulation work, presented in this letter, demonstrates for the first time how the monolithic integration of two single-mode lasers in a master-slave configuration, can substantially increase the achievable bit rate of a direct modulation adaptively modulated optical orthogonal frequency-division multiplexing (AMO-OFDM) system. The Levin-Campello algorithm is applied to select the OFDM bit and power loading scheme used for each system configuration. Improvement in terms of data throughput due to injection is measured for several transmission distances with the improvement in performance presented in terms of error vector magnitude per OFDM subcarrier.

Using monolithic integration technology we have designed and fabricated tunable lasers in the 1.5 µm region with a demonstrated tuning range of 60 nm and single mode operation. This performance is achieved using intracavity tunable Mach-Zehnder interferometers that use voltage controlled phase modulators. In this paper we will discuss design considerations and advantages of such tunable lasers.

A tunable laser operating from 2015 – 2040 nm realized as a monolithic InP photonic integrated circuit is presented. The laser uses an intracavity tuning mechanism based on parallel asymmetric Mach-Zehnder interferometers with electro-refractive modulators. The device is intended for a single line gas spectroscopy and was designed and fabricated using a generic integration technology platform.

Spectral phase control of optical pulses is often required to generate short pulses, and an important application of a pulse shaper is spectral chirp/dispersion (pre-) compensation. In this paper, we present the pulse shaping/compression capability of a monolithically integrated optical pulse shaper. Chip fabrication has been carried out in a standardized generic photonic integration platform which is available in the framework of European FP7 project EuroPIC. A key capability of this platform is the active-passive integration scheme which allows direct integration of active components such as semiconductor optical amplifiers (SOAs) with passive elements such as arrayed waveguide gratings (AWGs) and phase modulators (PMs) on a single photonic chip.

We present the first 320Gb/s all-optical clock recovery by exploiting single Quantum Dash MLL to generate 40GHz synchronized optical clock pulse with 71fs timing jitter. 320Gb/s all-optical demultiplexing operation with 1dB BER penalty was demonstrated.

We experimentally investigate the locking/unlocking dynamics of a mode-locked QDash laser diode for packet-based clock-recovery applications. Results show 20 ns locking times for the passively and externally synchronized mode-locking mechanisms.

Discrete Mode Laser Diodes (DMLDs) present an economic approach with a focus on high volume manufacturability of single mode lasers using a single step fabrication process. We report on a DMLD designed for operation in the 1550 nm window with high Side Mode Suppression Ratio (SMSR) over a wide temperature tuning range of -20 °C < T < 95 °C. Direct modulation rates as high as 10 Gbit/s are demonstrated at both 1550 nm and 1310 nm. Transmission experiments were also carried out over single mode fibre at both wavelengths. Using dispersion pre-compensation transmission from 0 to 60 km is demonstrated at 1550 nm with a maximum power penalty measured at 60 km of 3.6 dB.

The authors present a multi-carrier transmitter based on a gain switched laser employed in a next generation access network. The simple, robust and cost efficient direct modulation based comb generation technique offers closely spaced coherent channels. Each of the channels is imposed with 2.5 Gbaud data using QPSK and 16-QAM formats. The authors also present a performance comparison between the commonly used coherent detection scheme and a novel receiver architecture based on a pilot tone aided direct detection scheme. The simplified low cost receiver, enabled by the phase correlated optical comb tones, eases the requirement for an expensive local oscillator (tunable laser), reduces the need for digital signal processing and also greatly enhances the phase noise tolerance of the system.

In this paper, a detection scheme based on four wave mixing in a semiconductor optical amplifier (SOA) is used to measure the frequency and bandwidth of the optical terahertz beat-tone signal generated by a passively mode locked semiconductor laser. Two signals from external cavity lasers are injected into an SOA, which acts as a local oscillator at their detuning frequency. The device under test is a passively mode locked laser with a beat-tone frequency in the terahertz spectrum. Its optical signal is injected in the SOA, which also acts as a frequency mixer. The frequency and linewidth of the terahertz signal are then measured by retrieving the intermediate frequency detected by a low bandwidth photodiode and an electrical spectrum analyser.

We present a linear self-referenced measurement of the spectral amplitude and phase of a free-running quantum-dash modelocked laser diode. The technique is suitable for measuring optical signals with repetition rates up to 100 GHz. In contrast to many other linear techniques it requires no external electronic clock synchronized to the signal under test. Using this method we are able to compensate for the intracavity dispersion of the diode to demonstrate 500 fs pulses at a repetition rate of 39.8 GHz. We also use the technique to characterize the dependence of the diode’s intracavity dispersion on the applied current.

Beat-tones at 40-GHz from a QDash-ML laser under 10 to 160 Gb/s optical injection are analyzed. A FWHM linewidth less than 8 Hz is obtained regardless of the rate of injected data stream.

Synchronization of a 40 GHz quantum-dash mode-locked (ML) Fabry-Perot laser diode with optically injected pulse streams is experimentally studied. Injected signals consist of nonmodulated and modulated trains of 1.6 ps pulses at various repetition rates, ranging from 10 to 160 GHz and 10 to 160 Gbps, respectively. Subharmonic, fundamental, and harmonic synchronization of the ML laser allows retrieval of stable 40 GHz clock pulses featuring a width of 1.8 ps. Frequency components at 10 and 20 GHz do not create any amplitude modulation on the recovered 40 GHz clock pulses when injecting signals at 10 and 20 GHz/Gbps. In addition, external synchronization of the laser with pulse streams at 80 and 160 GHz/Gbps is sustained despite the absence of significant components at or below 40 GHz.

Quantum-dash modelocked laser diodes (QD-MLLD) are capable of producing short optical pulses at extremely high repetition rates. As such they are ideally suited to many telecommunications applications [1]. In this paper we present a linear self-referenced measurement of the spectral amplitude and phase of a free-running quantum-dash modelocked laser diode. The technique is suitable for measuring optical signals with repetition rates up to 100 GHz. In contrast to many other linear techniques it requires no external electronic clock synchronized to the signal under test. Using this method we show that compensating for the intra-cavity dispersion of the diode results in 500 fs pulses at a repetition rate of 39.8 GHz. The measurement technique is based on the stepped-heterodyne method presented in Ref. [2]. The signal under test is mixed with a CW narrowband optical local oscillator (LO) and the combined signal detected by a high-speed photodiode, mixed with an electronic LO, and then recorded on a real-time oscilloscope. When the optical LO is placed between two adjacent signal modes the resultant beat signals can be analysed to determine not only the power of each of the signal modes, but also the phase difference between them [2]. Stepping the optical LO across all signal modes allows for a complete measurement of the spectral amplitude and phase of the signal.

An all-optical approach based on nonlinear interactions inside a semiconductor optical amplifier for measuring the THz beat-tone of a passively mode-locked laser is proposed. This novel approach can be applied to beat-tones in the range from GHz to few THz.

Timing-jitter measurements in optically generated subpicosecond pulses by a quantum-dash passively mode-locked semiconductor laser as a function of the bias current are reported. All the measurements are retrieved from a second-harmonic-generation frequency-resolved optical gating system. A decreasing trend in the pulse width and the associated timing jitter is found with the bias current. Additionally, the optical and mode-beating linewidths are analyzed in terms of both the mode wavelength and the bias current. From our results, we can conclude that once the optical modes are phase locked, the optical linewidth associated to every individual longitudinal mode of the device under test does not have a significant impact on the mode-beating signal on neither the pulse width nor its respective timing jitter.

International audience; A narrowband terahertz signal generated by a unitravelling carrier photodiode (UTC-PD) interfaced with a dual-mode Fabry–Pérot laser diode is demonstrated. A beat tone corresponding to the free spectral range is generated on the UTC-PD, and radiated by a transverse-electromagnetic-horn antenna. A terahertz signal at a frequency of 372 GHz, featuring a linewidth of 17 MHz is recorded by a subharmonic mixer coupled to an electrical spectrum analyzer. All components involved in this experiment operate at room temperature. The linewidth and the frequency of the emitted terahertz wave are analyzed, along with their dependency on dc-bias conditions applied to laser diode.

An experimental analysis on the quality of 40-GHz radio-frequency signals generated by various passively mode-locked semiconductor lasers is addressed. The analysis is performed considering the frequency linewidth of 40-GHz optically generated signals and the number of longitudinal modes selected by the cavity of each laser under study. Four of these devices are multi-quantum wells InAlGaAs Fabry–Perot lasers. They have been engineered to exhibit a specific number of longitudinal modes: 4, 5, 10, and 22 modes, respectively. Another device under test is a bulk distributed Bragg reflector laser exhibiting 3 lasing modes. The last device under study is a quantum-dash Fabry–Perot laser characterized by 40 lasing modes. From our experimental results it appears that, regardless the nature of the device cavity and active media, the strength of the passively mode-locked mechanism might be enhanced with the number of longitudinal modes oscillating into the laser cavity, allowing a reduction in the frequency linewidth.

A technique to measure a terahertz wave generated by spectrum tailored Fabry–Pérot lasers (FP) is assessed. A dc-biased and 25 °C temperature controlled FP is probed by a continuous wave signal, tuned at 20 nm away from its lasing modes. With a 0.02 nm resolution optical spectrum analyzer (OSA), the terahertz generated signal frequency is measured from the interval between the probe and its side-band modulations. The terahertz waves emitted by these FPs are measured at 370±5 GHz and at 1.157±0.005 THz, respectively, within a precision set by our OSA. The origin of the terahertz wave is due to passive mode-locked through intracavity four-wave-mixing processes.

We present results achieved in the generation of terahertz wave by a semiconductor laser. It is a Fabry–Pérot based device with shallow grooves implemented on its p-side to engineer the longitudinal mode spectrum. The laser is dc-biased and temperature controlled at 298 K. The main two modes are separated by 3 nm at 1550 nm with a side-mode-suppression ratio of 25 dB. Using a frequency resolved optical gating, evidence of mode beating at 373 GHz is observed. With a bolometer interfaced to a Fourier transform interferometer, the second harmonic signal is measured at 690 GHz.

In this paper we present some characterizations of passively mode-locked semiconductor lasers. These lasers are multimode and they exhibit a modulation of their output power even though they are DC-biased. The modulation frequency corresponds to their free-spectral range. We demonstrate their potential: for generation of ultra-fast modulation for THz wave generation at room temperature without any direct modulations applied, in the radio frequency range they synchronise their modulation to the bit-rate of an incoming signal used for clock extraction. Therefore these devices can be used for all-optical clock recovery.

Mode-locked fiber and solid state lasers have played an essential role in several scientific and technological developments. The integration of mode-locked lasers on chips could enable their use in a wide range of applications. The advancement of semiconductor mode-locked laser diodes has been going on for several decades, but has recently seen the development of novel devices based on generic InP and III-V-on-silicon photonic integration platforms. These photonic integration platforms enable the use of standardized components and low-loss waveguides within the laser cavity, allowing for the design of advanced extended cavities. In this manuscript we give a review of these novel devices and compare their performance.