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In the field of paper conservation and archival research, identifying the raw materials of paper is important to elucidate its history and culture. As the most basic element of the raw materials for paper, fibers have not been sufficiently investigated. In this study, we propose a nondestructive method for estimating paper fibers from macro photographs ( $4000\times3000$ pixels) captured using a digital camera. The proposed method consists of background patch (500 pixels per side) detection (BPD), wherein background regions with no text are identified; patch fiber classification (PFC), wherein background patches obtained after BPD are analyzed for fiber classification; and paper fiber estimation (PFE), wherein macro images obtained after PFC are analyzed for fiber estimation. BPD and PFC are employed to perform patch-based classification on segmented macro images, which are reconstructed during PFE to obtain the final fiber estimation results. We performed experiments using 1337 macro images (64176 patches) to evaluate the fiber estimation accuracy for kozo, mitsumata, and gampi via three-fold cross-validation. The average fiber classification accuracy for patch images was observed to be 79.1%; accordingly, the average fiber estimation accuracy for macro images was 85.8%. Experimental results indicated that PFE can be realized in a nondestructive manner on macro images of paper captured using a digital camera.

Computer scientists often publish their source code accompanying their publications, prominently using code repositories across various domains. Despite the concurrent existence of scholarly articles and their associated official code repositories, explicit references linking the two are often missing. Traditionally, identifying whether scholarly content and code repositories pertain to the same research project requires manual inspection, a time-consuming task. This paper proposes a deep learning-based algorithm for automatically matching scholarly articles with their corresponding official code repositories. Our findings indicate that the most common linking information includes the paper title and BibTeX entries, typically found in the repository’s readme document. In this study, we employed SPECTER for vector embedding of paper and repository metadata. Utilizing these embedding representations with the Light Gradient Boosting Machine (LGBM), our method achieved an F1 score of 0.94. Moreover, combining our best model with a rule-based approach improved performance by 5.31%. This study successfully delineates a connection between academic papers and associated official code repositories, minimizing reliance on explicit bibliographic information in repositories.

In the era of Industry 4.0, digital transformation has spurred the swift advancement of technologies, including intelligent predictive maintenance scheduling, prognostics and health management. The accurate prediction of remaining useful life plays a crucial role in these technologies as it extends power equipment’s safe operational duration and decreases the maintenance costs associated with unforeseen shutdowns. Also, the increased accessibility of data for monitoring system conditions has paved the way for the more immense adoption of machine learning models in prognostics and health management for power transformers. At the moment, with the ever-increasing demand for electricity, there is a corresponding increase in the degradation processes of power transformers. Transformers insulation system and more importantly, the paper insulation happens to be the principal part where the degradation is prominent. Therefore, an accurate prediction of the insulating paper condition through its degree of polymerization is required to guarantee the reliability of power transformers. In this regard, the predictions, reliability, and health monitoring of this power equipment can be actualized by modeling the degradation of transformer insulation paper through several machine learning frameworks. In this view, this review paper has been drafted not only to serve as a guide for researchers interested in the fields of transformer insulation system fault prognosis but also to offer insights into potential research directions as existing literature in modeling and evaluating transformer paper insulation is presented.

Evaluating the long-term influence of academic papers in the early stage after publication is crucial for research management and decision-making. Although the total number of citations has been considered as a valid indicator to measure the academic influence of papers, there are still some bottleneck problems in predicting future citation counts. Firstly, it remains a challenging task to select the reasonable features due to the diversity of model features. Secondly, some prediction models are overly complex and their defects may cause prediction bias or even errors. Finally, the most important thing is that very few models possess long-term predictive ability. This paper proposes a prediction model that can provide an early evaluation of the long-term citations, or the long-term influence, of academic papers. The model uses features available immediately after publication or after a certain period of time. Taking academic papers in Information Science and Library Science as our experimental subject, we train the model using three machine learning algorithms and find that the artificial neural network performs satisfactorily. Our findings may offer guidance for research management and decision-making.

This special section of the IEEE Open Journal of Circuits and Systems (OJCAS) aims to highlight a selection of papers from 2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS). Due to COVID-19 and travel restrictions, APCCAS 2022 was organised as a hybrid conference during 11 - 13 November 2022 in Shenzhen China. As the regional flagship conference of IEEE Circuits and Systems Society, APCCAS 2022 was driven by the theme “Building a Fully-connected AIoT World” to emphasize the CAS Society’s potential for finding multidisciplinary solutions to societal and industrial challenges. The papers in this special issue were selected from a comprehensive list of papers presented in the sessions of APCCAS 2022.

The Editorial Board of the IEEE Open Access Journal of Power and Energy (OAJPE) would like to recognize the following best papers selected from all papers published between October 1, 2020 and September 30, 2023 in OAJPE.

Welcome to Volume 4 of IEEE Journal of Microwaves! In this issue, we bring you 11 quality papers: two invited and nine regular submissions. We also celebrate six of our Outstanding Reviewers of 2023 and announce our IEEE Journal of Microwaves 2022 Best Paper prize. Our author and reader pools continue to expand and our usage counts per article published now exceed 1530. All of our 232 published articles from 2021 to 2023 now appear on Clarivate's Web of Science and we are looking forward to possibly receiving an impact factor this July. Remember to take a look at our solicitation for papers that can fit into our Microwaves in Climate Change special issue, which we intend to release before the end of 2024.

The article announces the IEEE International Symposium on Technology and Society, scheduled from September 18-20 in Puebla, Mexico, focusing on the Social Implications of Artificial Intelligence (AI), inviting submissions from academia, industry, and government to explore AI's impacts.

This research proposes an inkjet printed dual-band dual-sense circularly polarized antenna using CPW-feeding on PET substrate. The antenna is designed and optimized using ANSYS HFSS, which operates at 4.01 GHz - 5.05 GHz (22.96%) and 6.23 GHz - 7.58 GHz (19.55%) with a return loss of $0.44\lambda $ x $0.52\lambda $ x $0.002\lambda $ , where $\lambda $ is the free-space wavelength at the lowest circular polarization frequency. Measurement of the fabricated version shows good agreement with the simulated version. To the best of author’s knowledge, this proposed design is the first circularly polarized antenna integrating flexibility with dual-band and dual-sensing characteristics.

As this Special Section goes to publication, semiconductor manufacturing in the United Status, and globally, continues to expand at a seemingly torrid pace. Assisted by government funding and driven in part by artificial intelligence workloads that gobble up increasing amounts of data center computing capacity, Intel and TSMC fabs are going up in Arizona, TI and Samsung fabs are coming to Texas, and Micron has big plans in New York. Unfortunately, just like those flying cars we were once promised, AI has not yet eliminated the need for the skilled trades and engineers required to build and successfully operate a fab. As a result, workforce development has become an important part of the increasingly complex semiconductor manufacturing process: Where are the thousands of engineers the semiconductor industry needs to staff these new fabs going to come from? How can we make more students excited about science and engineering? While the Guest Editors don’t have all the answers, we are happy that ASMC contributes to the solution by actively supporting student presentations and posters and annually recognizing the best student paper of the conference. And, maybe some day, the artificial intelligence systems that semiconductor manufacturing has enabled will give us those Star Wars or Star Trek robots that can build fabs and make chips too. [ABSTRACT FROM AUTHOR]

The semiconductor industry is the core industry of the information age. As a key link in the semiconductor industry, wafer fabrication plays a key role in its development. In the testing stage of the wafer, each die of the wafer is detected and marked, and a wafer map with a certain spatial pattern can be formed. The analysis and classification of these spatial patterns can identify the cause of wafer defects, thereby improving production yield. However, as wafer size increases, line widths become smaller, etc., the probability of a mixed defect mode wafer pattern increases. Moreover, the mixed defect mode wafer map is more difficult to identify and classify than the single defect mode wafer map. Therefore, this paper proposes an improved deep convolutional neural network (DCNN) structure model for the recognition and classification of mixed defect pattern wafer maps. From the perspective of increasing the width of the DCNN, the improved network structure can avoid problems such as over-fitting and limited extraction of features due to the continuous deepening of the DCNN. The network is called Multi-Path DCNN (MP-DCNN) structure. The experimental results show that the proposed Multi-Path DCNN structure has better performance and higher classification accuracy than existing methods. [ABSTRACT FROM AUTHOR]

Transistor random threshold voltage variations due to process fluctuations seriously affects the stability of Static Random Access Memory (SRAM). In this paper, a SRAM bit transistors threshold voltage $({Vth})$ deviation monitoring scheme and system is proposed. This scheme ingeniously achieves on-chip measurement of all transistors threshold voltages without altering compact SRAM bit array layout. Control signal strategies and Transistor ${Vth}$ Determination Circuit (TVDC) for different types of Devices Under Test (DUTs) have been proposed. The system is implemented using a 65 nm CMOS process with a core area of 0.01875mm2. Through Monte Carlo analysis, the Weighted Average (WA) difference of the proposed scheme and the direct measurement method is not more than 10mV, and the Root Mean Square Error (RMSE) difference is not more than 3mV. This system can also effectively detect the cell position of the transistor threshold voltage mismatch simulated by modifying the substrate voltage. For SRAM arrays of different scales, the method proposed in this paper has area efficiency and flexible reconfigurability. [ABSTRACT FROM AUTHOR]

Chemical mechanical planarization (CMP) is vital for ensuring chip fabrication uniformity at nanometer scales. The emergence of a series of phenomenological CMP process models (Stine et al., 1997; Gbondo-Tugbawa, 2002; Xie, 2007; Vasilev, 2011) suggests that the existing model upgrade approach is largely based on a change in phenomenological model assumptions, demanding deep insights into complex process mechanisms and protracted period for accuracy improvements. To tackle this issue, this paper proposes a decoupling regression strategy for model upgrades. This strategy employs a data-driven approach to enhance the coupling relationships within the model, facilitating continuous improvement of simulation accuracy based on the existing model. It is capable of achieving improvements in model accuracy even in scenarios where modelers lack insight into complex process mechanisms. We validate our method by upgrading the Density Step Height (DSH) model to the Extend-DSH model to address poor erosion predictions at the 28nm node. Comparing model predictions with silicon data reveals that the Extend-DSH model aligns better with the measured data, reducing the root mean square error from 159.31Å to 6.89Å and increasing the coefficient of determination from -0.83561 to 0.6058, showcasing the effectiveness of the proposed chip-level CMP model upgrade method grounded in the decoupling regression strategy. [ABSTRACT FROM AUTHOR]

This paper proposes a novel method for Virtual Metrology (VM) in plasma etch processes based on analysis of all time and wavelength samples of Optical Emission Spectroscopy (OES) signals. The new method flattens each OES signal into a single vector, after which Singular Value Decomposition (SVD) is performed on the matrix formed by vectors of flattened OES signals in the training dataset. Low rank SVD projections of flattened and standardized OES recordings served as inputs for Ridge Regression, Artificial Neural Network, and Random Forest based VM models. A VM study is then conducted on a dataset gathered from a major 300 mm wafer fabrication facility, showing that the use of newly proposed SVD-based OES features consistently outperformed benchmark VM model features. Additional analysis of feature importance performed based on the analytically tractable Ridge Regression VM model form demonstrated distinct time-frequency patterns of OES signal portions that were highly informative for prediction of relevant Critical Dimensions, clearly justifying the need to use the entire OES signals for VM. [ABSTRACT FROM AUTHOR]

This paper studies simultaneous scheduling of production and material transfer that arises in the semiconductor photolithography area. In particular, the right reticle and right job both need to be present to process the job. Jobs are transferred by a material handling system that employees a fleet of vehicles. Reticles serving as an auxiliary resource are also transferred from one place to another by a different set of vehicles. This intricate scheduling challenge, encompassing jobs, reticles, machines, and two distinct sets of vehicles, is explored here for the first time. The paper introduces a multi-stage methodology that involves relaxation, a constructive heuristic, constraint programming, and a warm-start approach to address this complex problem. [ABSTRACT FROM AUTHOR]

A scheduling problem for parallel batch processing machines (BPMs) with jobs having unequal ready times in semiconductor wafer fabrication facilities (wafer fabs) is studied in this paper. A blended objective function combining the total weighted tardiness (TWT) and the total electricity cost (TEC) under a time-of-use (TOU) tariff is considered. A genetic programming (GP) procedure is designed to automatically discover priority indices for a heuristic scheduling framework. Results of computational experiments are reported that demonstrate that the learned priority indices lead to high-quality schedules in a short amount of computing time. [ABSTRACT FROM AUTHOR]

The "IEEE Transactions on Semiconductor Manufacturing" is a journal that publishes the latest advancements in the manufacturing of microelectronic and photonic components. It aims to enhance knowledge and improve manufacturing practices in the semiconductor industry. The journal covers various topics such as process integration, manufacturing equipment performance, yield analysis, metrology, and supply chain management. Papers submitted to the journal should focus on practical engineering techniques for solving manufacturing-related problems. The journal follows a peer-review process and encourages authors from low-income countries to submit their work. The standard length for regular papers is eight pages, and shorter contributions can be submitted as letters. The journal provides guidelines for manuscript preparation, including the use of the IEEE template style. It also accepts graphical abstracts and electronic supplements. Authors are responsible for preparing a publication-quality manuscript and may use English language editing services if needed. Plagiarism is strictly prohibited, and manuscripts found to have plagiarized content may be penalized. Authors are required to have an Open Researcher and Contributor ID (ORCID) and can submit their manuscripts online. The journal offers both traditional and open access publication options, with associated fees. Native language author names are supported, and page charges may apply for publication. The IEEE holds the copyright to the published material. [Extracted from the article]

Detecting wafer map anomalies is crucial for preventing yield loss in semiconductor fabrication, although intricate patterns and resource-intensive labeled data prerequisites hinder precise deep-learning segmentation. This paper presents an innovative, unsupervised method for detecting pixel-level anomalies in wafer maps. It utilizes an efficient dual attention module with a knowledge distillation network to learn defect distributions without anomalies. Knowledge transfer is achieved by distilling information from a pre-trained teacher into a student network with similar architecture, except an efficient dual attention module is incorporated atop the teacher network’s feature pyramid hierarchies, which enhances feature representation and segmentation across pyramid hierarchies that selectively emphasize relevant and discard irrelevant features by capturing contextual associations in positional and channel dimensions. Furthermore, it enables student networks to acquire an improved knowledge of hierarchical features to identify anomalies across different scales accurately. The dissimilarity in feature pyramids acts as a discriminatory function, predicting the likelihood of an abnormality, resulting in highly accurate pixel-level anomaly detection. Consequently, our proposed method excelled on the WM-811K and MixedWM38 datasets, achieving AUROC, AUPR, AUPRO, and F1-Scores of (99.65%, 99.35%), (97.31%, 92.13%), (90.76%, 84.66%) respectively, alongside an inference speed of 3.204 FPS, showcasing its high precision and efficiency. [ABSTRACT FROM AUTHOR]

Three dimensional Not-And (3D NAND) flash memory devices are scaling in the vertical direction to more than 200 oxide/sacrificial wordline nitride layers to further increase storage capacity and enhance energy efficiency. The accurate measurement of the thicknesses of these layers is critical to controlling stress-induced wafer warping and pattern distortion. While traditional optical metrology in the UV-vis-NIR range offers a non-destructive inline solution for high volume manufacturing, we demonstrate in this paper, that mid-IR metrology has advantages in de-correlating oxide and nitride thicknesses owing to their unique absorption signatures. Furthermore, because of the depths sensitivity of oxide and nitride absorptions, the simulated measurement results show the ability to differentiate thickness variations in the vertical zones. Good blind test results were obtained with a machine learning model trained on pseudo-references and pseudo spectra with added skew. [ABSTRACT FROM AUTHOR]

It is known that the determination of the good-dice-in-bad-neighborhoods (GDBNs) has been regarded as an effective technique to reduce the value of the defect parts per million (DPPM) by identifying and rejecting the suspicious dice even though they are good in testing. Instead of examining eight immediate neighbors in a small-sized $3\times 3$ window or exploiting simple linear regression, a large-sized window can be used to recognize the broad-sighted neighborhoods and accurately infer the suspiciousness level for any given die. In this paper, the artificial neural networks (ANN)-based method can be proposed to solve the GDBN identification. Furthermore, two enhanced techniques can be further presented to improve the inference accuracy of the original ANN-based method by considering the variation of the time-dependent wafer patterns and the wafer-to-wafer relationship between two adjacent wafers. After applying the two enhanced techniques, the business profits can be improved in the new ANN-based method. Various experiments on two datasets clearly reveal the superiority of the proposed ANN-based method over the other existing methods. In addition to the reduction of the DPPM value, the new ANN-based method can achieve the 1.5X–2X better reduction in the cost of the return merchandise authorization (RMA). On the other hand, the experimental results show that the similar result can also be obtained in the other lower-yield products. By using the new ANN-based method, the relationships on bad dice cross wafers can be captured and the highly-accurate inference results can be simultaneously maintained. [ABSTRACT FROM AUTHOR]

Titanium tetrachloride (TiCl4) is a well-known source of titanium (Ti) for the formation of titanium nitride (TiN) barrier material in the semiconductor interconnection process; however, the reaction of by-products with airborne molecules can cause unexpected pump trips and equipment breakdown from the by-product powder build-up. Plasma scrubbers are used to decompose by-products, but hydrogen chloride (HCl) and nitrogen oxides are produced during and after the process. The process mechanisms change when the temperature and applied power of the heat source change. In this paper, we study the influence of the reactor temperature and applied power to the heat source on the decomposition capacity of TiCl4 in a plasma pretreatment system (PPS). We examine the effect of the temperature and heat source power to understand the reaction mechanisms for the composition and decomposition of gaseous species with chemical reactions through simultaneous methods. We analyzed the system with computational fluid dynamics (CFD) and chemical kinetic simulation to investigate the changes of the system mechanism. Subsequently, we achieved results for the correlation between the temperature of the reactor, power applied to the heat source, composition and decomposition of species, and chemical reaction mechanisms. [ABSTRACT FROM AUTHOR]

Semiconductor manufacturing processing can be jeopardized due to process fluctuations, and the degradation of equipment parts can significantly influence process variation. Timely diagnosing equipment faults causing process variations is desired in current high-end product manufacturing. This paper proposes a diagnostic method for the SiH4 gas flow rate drift using N2 vibrational transition in oxide deposition. In this research, optical emission spectroscopy (OES) and quadrupole mass spectrometer (QMS) are employed as condition monitoring sensors serving as a reference model to compare the diagnostic performance for gas flow rate drift. The study observes that the OES model exhibits much higher performance for minor diagnoses of less than 5% drift. The diagnostic model performance can be enhanced by incorporating plasma condition and gas indicators compared to when these indicators are used individually. This suggests that when conducting diagnostics for equipment and processes, it is crucial to consider indirect indicators like plasma indicators along with direct indicators such as gas radical density. The comprehensive use of both types of indicators enhances the diagnostic performance, providing a more accurate assessment of the conditions and potential problem in semiconductor manufacturing. [ABSTRACT FROM AUTHOR]

The document is the table of contents for the May 2024 issue of the IEEE Transactions on Semiconductor Manufacturing. It includes papers on various topics such as yield modeling, analysis, and enhancement, advanced processing, advanced process control, equipment and automation technology, non-silicon materials, emerging areas, and environment, safety, and health. The articles cover subjects such as chip-scale chemical mechanical polishing, threshold voltage deviation monitoring, curvilinear standard cell design, fabrication of silicon nanocone arrays, improving the reliability of through silicon vias, energy consumption and carbon emission reduction in HVAC systems, low-k silicon dioxide synthesis, chemical mechanical polishing of diamond epitaxial layers, conditional variable selection based on deep learning, and eco-friendly dry-cleaning and diagnostics of silicon dioxide deposition chambers. The document also includes an announcement for the call for nominations for the 2024 IEEE EDS Early Career Award. [Extracted from the article]

Chemical mechanical polishing/planarization (CMP) combines physical grinding and chemical reactions to planarize the wafer surface. The complex mechanism of CMP brings great challenges to the mechanism-based modeling process. The data-driven CMP modeling process is limited by insufficient datasets. At the same time, these two types of models generally have high computational complexity. In this paper, we introduce the group method of data handling (GMDH)-type polynomial network to build the CMP model to address the above challenges. We designed and manufactured the test chip using a 28nm process. The measurement data from the test chip shows that compared with the mechanism-based CMP model, the trained CMP model based on GMDH-type polynomial network has higher accuracy and lower computational complexity, with the average simulation speed being 115x faster. Experiments based on silicon data show that this modeling method has a small demand for data, and 20 randomly selected sets of data can meet the needs for modeling the current CMP process. [ABSTRACT FROM AUTHOR]

This paper proposes a linear regression model for scalar-valued responses and two-way functional (bivariate) predictors. Our motivation stems from the quality evaluation of products based on optical emission spectroscopy data from virtual metrology of semiconductor manufacturing. We focus on multivariate cases where the smoothness and shapes of the data vary significantly across variables. We propose a two-step solution to this problem, consisting of decomposition and prediction. First, we decompose the two-way functional data into pairs of component functions using functional singular value decomposition. Next, we build functional linear models for the decomposed functional variables and obtain the final predictor by averaging the models. Results from numerical studies, including simulation studies and real data analysis, demonstrate the promising empirical properties of the proposed approach, especially when the number of predictors is large. [ABSTRACT FROM AUTHOR]

It has been a widely growing interest in using silicon carbide (SiC) in high-power electronic devices. Yet, SiC wafers may contain killer defects that could reduce fabrication yield and make the device fall into unexpected failures. To prevent these failures from happening, it is very important to develop inspection tools that can detect, characterize and locate these defects in a non-invasive way. Current inspection techniques such as Dark Field or Bright field microscopy are effectively able to visualize most such defects; however, there are some scenarios where the inspection becomes problematic or almost impossible, such as when the defects are too small or have low contrast or if the defects lie deep into the substrate. Thus, an alternative method is needed to face these challenges. In this paper, we demonstrate the application of coherent Fourier scatterometry (CFS) as a complementary tool in addition to the conventional techniques to overcome different and problematic scenarios of killer defects inspection on SiC samples. Scanning electron microscopy (SEM) has been used to assess the same defects to validate the findings of CFS. Great consistency has been demonstrated in the comparison between the results obtained with CFS and SEM. [ABSTRACT FROM AUTHOR]

This paper addresses the quality control of the photolithography process in the semiconductor industry. Overlay errors in the process seriously affect the wafer yield, and cause the wafer to be forced to rework and affect the production efficiency of the equipment. We examine the current state of its process control, develop a novel overlay predict model, and verify the prediction results. This study proposes a Global Attention Generative Adversarial Networks (GAGAN) model to precisely predict the overlay error for the feed-forward data of the front layer, which is used as the important information and process parameters for the advanced process control of the current layer. Experiment results on a semiconductor shop-floor confirms that our proposed method achieves high predictive performance while maintaining extensibility and visual quality. [ABSTRACT FROM AUTHOR]

Recent developments in the field of non-local attention (NLA) have led to a renewed interest in self-similarity-based single image super-resolution (SISR). Researchers usually use the NLA to explore non-local self-similarity (NSS) in SISR and achieve satisfactory reconstruction results. However, a surprising phenomenon that the reconstruction performance of the standard NLA is similar to that of the NLA with randomly selected regions prompted us to revisit NLA. In this paper, we first analyzed the attention map of the standard NLA from different perspectives and discovered that the resulting probability distribution always has full support for every local feature, which implies a statistical waste of assigning values to irrelevant non-local features, especially for SISR which needs to model long-range dependence with a large number of redundant non-local features. Based on these findings, we introduced a concise yet effective soft thresholding operation to obtain high-similarity-pass attention (HSPA), which is beneficial for generating a more compact and interpretable distribution. Furthermore, we derived some key properties of the soft thresholding operation that enable training our HSPA in an end-to-end manner. The HSPA can be integrated into existing deep SISR models as an efficient general building block. In addition, to demonstrate the effectiveness of the HSPA, we constructed a deep high-similarity-pass attention network (HSPAN) by integrating a few HSPAs in a simple backbone. Extensive experimental results demonstrate that HSPAN outperforms state-of-the-art approaches on both quantitative and qualitative evaluations. Our code and a pre-trained model were uploaded to GitHub (https://github.com/laoyangui/HSPAN) for validation. [ABSTRACT FROM AUTHOR]

How to model the effect of reflection is crucial for single image reflection removal (SIRR) task. Modern SIRR methods usually simplify the reflection formulation with the assumption of linear combination of a transmission layer and a reflection layer. However, the large variations in image content and the real-world picture-taking conditions often result in far more complex reflection. In this paper, we introduce a new screen-blur combination based on two important factors, namely the intensity and the blurriness of reflection, to better characterize the reflection formulation in SIRR. Specifically, we present Screen-blur Reflection Networks (SRNet), which executes the screen-blur formulation in its network design and adapts to the complex reflection on real scenes. Technically, SRNet consists of three components: a blended image generator, a reflection estimator and a reflection removal module. The image generator exploits the screen-blur combination to synthesize the training blended images. The reflection estimator learns the reflection layer and a blur degree that measures the level of blurriness for reflection. The reflection removal module further uses the blended image, blur degree and reflection layer to filter out the transmission layer in a cascaded manner. Superior results on three different SIRR methods are reported when generating the training data on the principle of the screen-blur combination. Moreover, extensive experiments on six datasets quantitatively and qualitatively demonstrate the efficacy of SRNet over the state-of-the-art methods. [ABSTRACT FROM AUTHOR]

Efficient point cloud compression is essential for applications like virtual and mixed reality, autonomous driving, and cultural heritage. This paper proposes a deep learning-based inter-frame encoding scheme for dynamic point cloud geometry compression. We propose a lossy geometry compression scheme that predicts the latent representation of the current frame using the previous frame by employing a novel feature space inter-prediction network. The proposed network utilizes sparse convolutions with hierarchical multiscale 3D feature learning to encode the current frame using the previous frame. The proposed method introduces a novel predictor network for motion compensation in the feature domain to map the latent representation of the previous frame to the coordinates of the current frame to predict the current frame’s feature embedding. The framework transmits the residual of the predicted features and the actual features by compressing them using a learned probabilistic factorized entropy model. At the receiver, the decoder hierarchically reconstructs the current frame by progressively rescaling the feature embedding. The proposed framework is compared to the state-of-the-art Video-based Point Cloud Compression (V-PCC) and Geometry-based Point Cloud Compression (G-PCC) schemes standardized by the Moving Picture Experts Group (MPEG). The proposed method achieves more than 88% BD-Rate (Bjøntegaard Delta Rate) reduction against G-PCCv20 Octree, more than 56% BD-Rate savings against G-PCCv20 Trisoup, more than 62% BD-Rate reduction against V-PCC intra-frame encoding mode, and more than 52% BD-Rate savings against V-PCC P-frame-based inter-frame encoding mode using HEVC. These significant performance gains are cross-checked and verified in the MPEG working group. [ABSTRACT FROM AUTHOR]

Unmanned Aerial Vehicles (UAVs) rely on satellite systems for stable positioning. However, due to limited satellite coverage or communication disruptions, UAVs may lose signals for positioning. In such situations, vision-based techniques can serve as an alternative, ensuring the self-positioning capability of UAVs. However, most of the existing datasets are developed for the geo-localization task of the objects captured by UAVs, rather than UAV self-positioning. Furthermore, the existing UAV datasets apply discrete sampling to synthetic data, such as Google Maps, neglecting the crucial aspects of dense sampling and the uncertainties commonly experienced in practical scenarios. To address these issues, this paper presents a new dataset, DenseUAV, that is the first publicly available dataset tailored for the UAV self-positioning task. DenseUAV adopts dense sampling on UAV images obtained in low-altitude urban areas. In total, over 27K UAV- and satellite-view images of 14 university campuses are collected and annotated. In terms of methodology, we first verify the superiority of Transformers over CNNs for the proposed task. Then we incorporate metric learning into representation learning to enhance the model’s discriminative capacity and to reduce the modality discrepancy. Besides, to facilitate joint learning from both the satellite and UAV views, we introduce a mutually supervised learning approach. Last, we enhance the Recall@K metric and introduce a new measurement, SDM@K, to evaluate both the retrieval and localization performance for the proposed task. As a result, the proposed baseline method achieves a remarkable Recall@1 score of 83.01% and an SDM@1 score of 86.50% on DenseUAV. The dataset and code have been made publicly available on https://github.com/Dmmm1997/DenseUAV. [ABSTRACT FROM AUTHOR]

This paper focuses on the facial micro-expression (FME) generation task, which has potential application in enlarging digital FME datasets, thereby alleviating the lack of training data with labels in existing micro-expression datasets. Despite obvious progress in the image animation task, FME generation remains challenging because existing image animation methods can hardly encode subtle and short-term facial motion information. To this end, we present a facial-prior-guided FME generation framework that takes advantage of facial priors for facial motion generation. Specifically, we first estimate the geometric locations of action units (AUs) with detected facial landmarks. We further calculate an adaptive weighted prior (AWP) map, which alleviates the estimation error of AUs while efficiently capturing subtle facial motion patterns. To achieve smooth and realistic synthesis results, we use our proposed facial prior module to guide motion representation and generation modules in mainstream image animation frameworks. Extensive experiments on three benchmark datasets consistently show that our proposed facial prior module can be adopted in image animation frameworks and significantly improve their performance on micro-expression generation. Moreover, we use the generation technique to enlarge existing datasets, thereby improving the performance of general action recognition backbones on the FME recognition task. Our code is available at https://github.com/sysu19351158/FPB-FOMM. [ABSTRACT FROM AUTHOR]

Effectively evaluating the perceptual quality of dehazed images remains an under-explored research issue. In this paper, we propose a no-reference complex-valued convolutional neural network (CV-CNN) model to conduct automatic dehazed image quality evaluation. Specifically, a novel CV-CNN is employed that exploits the advantages of complex-valued representations, achieving better generalization capability on perceptual feature learning than real-valued ones. To learn more discriminative features to analyze the perceptual quality of dehazed images, we design a dual-stream CV-CNN architecture. The dual-stream model comprises a distortion-sensitive stream that operates on the dehazed RGB image, and a haze-aware stream on a novel dark channel difference image. The distortion-sensitive stream accounts for perceptual distortion artifacts, while the haze-aware stream addresses the possible presence of residual haze. Experimental results on three publicly available dehazed image quality assessment (DQA) databases demonstrate the effectiveness and generalization of our proposed CV-CNN DQA model as compared to state-of-the-art no-reference image quality assessment algorithms. [ABSTRACT FROM AUTHOR]

Most researchers focus on designing accurate crowd counting models with heavy parameters and computations but ignore the resource burden during the model deployment. A real-world scenario demands an efficient counting model with low-latency and high-performance. Knowledge distillation provides an elegant way to transfer knowledge from a complicated teacher model to a compact student model while maintaining accuracy. However, the student model receives the wrong guidance with the supervision of the teacher model due to the inaccurate information understood by the teacher in some cases. In this paper, we propose a dual-knowledge distillation (DKD) framework, which aims to reduce the side effects of the teacher model and transfer hierarchical knowledge to obtain a more efficient counting model. First, the student model is initialized with global information transferred by the teacher model via adaptive perspectives. Then, the self-knowledge distillation forces the student model to learn the knowledge by itself, based on intermediate feature maps and target map. Specifically, the optimal transport distance is utilized to measure the difference of feature maps between the teacher and the student to perform the distribution alignment of the counting area. Extensive experiments are conducted on four challenging datasets, demonstrating the superiority of DKD. When there are only approximately 6% of the parameters and computations from the original models, the student model achieves a faster and more accurate counting performance as the teacher model even surpasses it. [ABSTRACT FROM AUTHOR]

Small moving objects at far distance always occupy only one or a few pixels in image and exhibit extremely limited visual features, which bring great challenges to motion detection. Highly evolved visual systems endow flying insects with remarkable ability to pursue tiny mates and prey, providing a good template to develop image processing method for small target motion detection. The insects’ excellent sensitivity to small moving objects is believed to come from a class of specific neurons called small target motion detectors (STMDs). However, existing STMD-based methods often experience performance degradation when coping with complex natural scenes. In this paper, we propose a bio-inspired visual system with spatio-temporal feedback mechanism (called Spatio-Temporal Feedback STMD) to suppress false positive background movement while enhancing system responses to small targets. Specifically, the proposed visual system is composed of two complementary subnetworks and a feedback loop. The first subnetwork is designed to extract spatial and temporal movement patterns of cluttered background by neuronal ensemble coding. The second subnetwork is developed to capture small target motion information where its output and signal from the first subnetwork are integrated together via the feedback loop to filter out background false positives in a recurrent manner. Experimental results demonstrate that the proposed spatio-temporal feedback visual system is more competitive than existing methods in discriminating small moving targets from complex natural environments. [ABSTRACT FROM AUTHOR]

When I Was growing up, my best friend’s father lost his job in the great collapse of Eastern Airlines. I was just a kid, so I did not really understand the ins and outs at the time, but what I now know is that his was a very good job, a union job on the ground crew that paid a genuine middle-class wage. It was the sort of job that was getting harder and harder to come by in late 20th-century America, and in the end, he was not able to find another like it. So, instead, he enrolled in a driving school, earned his commercial driver’s license, and went to work for a long-haul trucking company. At first, he was away from home for long stretches but whenever he returned, he would regale us with tales of his many adventures on the road. After several years, he started to drive more local routes, and after a few more, he financed his own rig and became an owner-operator specializing in shorter hauls. For him, trucking was a smart choice, a way to earn a middle-class wage comparable to what he once made at Eastern. Indeed, the success he found in long- and short-haul trucking seemed to validate all of the rosy promises the industry made (and continues to make) in its recruitment materials. Surely, you have seen them, plastered on the back of 18-wheelers everywhere: “50 cents a mile! No experience needed! Guaranteed home time! Excellent lease-to-own terms available! Call now!” [ABSTRACT FROM AUTHOR]

Federated Learning (FL) emerged as a significant advancement in the field of Artificial Intelligence (AI), enabling collaborative model training across distributed devices while maintaining data privacy. As the importance of FL and its application in various areas increased, addressing trustworthiness issues in its various aspects became crucial. In this survey, we provided a comprehensive overview of the state-of-the-art research on Trustworthy FL, exploring existing solutions and key foundations relevant to Trustworthiness in FL. There has been significant growth in the literature on trustworthy centralized Machine Learning (ML) and Deep Learning (DL). However, there is still a need for more focused efforts toward identifying trustworthiness pillars and evaluation metrics in FL. In this paper, we proposed a taxonomy encompassing five main classifications for Trustworthy FL, including Interpretability and Explainability, Transparency, Privacy and Robustness, Fairness, and Accountability. Each category represents a dimension of trust and is further broken down into different sub-categories. Moreover, we addressed trustworthiness in a Decentralized FL (DFL) setting. Communication efficiency is essential for ensuring Trustworthy FL. This paper also highlights the significance of communication efficiency within various Trustworthy FL pillars and investigates existing research on communication-efficient techniques across these pillars. Our survey comprehensively addresses trustworthiness challenges across all aspects within the Trustworthy FL settings. We also proposed a comprehensive architecture for Trustworthy FL, detailing the fundamental principles underlying the concept, and provided an in-depth analysis of trust assessment mechanisms. In conclusion, we identified key research challenges related to every aspect of Trustworthy FL and suggested future research directions. This comprehensive survey served as a valuable resource for researchers and practitioners working on the development and implementation of Trustworthy FL systems, contributing to a more secure and reliable AI landscape.

This paper addresses the hypothesis that the preference of a worker toward a work spot depends on attribute information such as her or his age and position and the type of work task on which she or he is working on that day. The system proposed in this paper is designed to estimate work-spot preferences using machine learning (ML) for activity-based workplaces. The system collects a variety of items related to attribute information and work-spot preferences for each work task from individual workers in advance. It constructs ML models using the collected data and estimates the work-spot preference for a worker. We extend the system to improve the accuracy for the case where the estimation is performed with a limited number of samples for training data. To examine the system, this paper presents two types of experiments: with computer graphics (CG) and with a real environment. Through these experiments, we collect data from people and construct ML models for the estimation of work-spot preferences based on attribute information and types of work tasks. The results demonstrate that the proposed system works for estimating the work-spot preference for each individual worker in accordance with the attribute information and the type of work tasks.

In this paper, we propose an optimal driving control algorithm that enables autonomous electric vehicle to track the reference path while avoiding front obstacles safely and quickly. An artificial potential field (APF) consists of a repulsive field that prevents collisions with nearby obstacles and road boundaries and an attractive field that brings the autonomous electric vehicle closer to the reference path. This APF is used as a path planning technique in this paper. Both the target longitudinal velocity and target yaw angle from the APF are transmitted to the model predictive controller (MPC) for path tracking of the autonomous electric vehicle. It predicts the future vehicle lateral behavior after a few seconds and optimally outputs the fast and accurate front steering angle and each wheel longitudinal force. In particular, the target vehicle longitudinal force for following the target longitudinal speed is set as the control input constraint of the proposed MPC. Based on CarSim and MATLAB/Simulink co-simulations, the high performance of the optimal driving control algorithm proposed in this paper is clearly confirmed in some driving scenario tests.

In this paper, the problem of the assist-as-needed (AAN) control of the upper limb exoskeleton is studied. Due to the complexity of the upper limb exoskeleton structure and driving mode, the control parameters of the equipment need to be adjusted to obtain satisfactory control performance. This paper presents an adaptive gain control method based on AAN. Through the dynamic gain adjustment mechanism, the system can adjust the control force in real-time to avoid excessive or insufficient auxiliary force. It can overcome the problem that traditional adaptive cannot identify dynamically changing parameters efficiently, and effectively avoid the overshoot and oscillation problems of high-gain adaptive, and do not need to obtain unknown disturbance information in complex models. The method adopts the on-demand auxiliary strategy to realize the self-adaptation of the auxiliary force and mode adjustment, which ensures the comfort, safety and effectiveness in the rehabilitation process. Through simulation experiment and comparison with the latest AAN controller, it can be seen that the controller has good anti-jamming effect and adaptive adjustment ability to auxiliary force under unknown interference.

The rapid increase in data generation has led to outsourcing computation to cloud service providers, allowing clients to handle large tasks without investing resources. However, this brings up security concerns, and while there are solutions like fully homomorphic encryption and specific task-oriented methods, challenges in optimizing performance and enhancing security models remain for widespread industry adoption. Outsourcing computations to an untrusted remote computer can be risky, but attestation techniques and verifiable computation schemes aim to ensure the correct execution of outsourced computations. Nevertheless, the latter approach incurs significant overhead in generating a proof for the client. To minimize this overhead, the concept of a Correct Execution Environment (CEE) has been proposed (CEEv1), which omits proof generation for trusted parts of the prover. This paper proposes a new hardware-based CEE (CEEv2) that supports virtual memory and uses an inverted page table mechanism to detect, or prevent, illegal modifications to page mappings. The proposed mechanism supports virtual memory and thwarts virtual-to-physical mapping attacks, while minimizing software modifications. The paper also compares the proposed mechanism to other similar mechanisms used in AMD’s SEV-SNP and Intel’s SGX.

This paper delves into the assessment of public engagement and the categorization of emotional states to gain deeper insights into individuals’ involvement in the revitalization of historical communities and their emotional experiences during this process. First, this paper proposes an enhanced Faster R-CNN model for detecting and analyzing public participation. Specifically, our model incorporates attention mechanisms, both in the spatial and feature channels, to enhance the identification of human subjects and facilitate more precise target localization. Additionally, this paper addresses the challenge of detecting multi-scale targets by employing Feature Pyramid Network (FPN) technology, which enriches the features computed by Faster R-CNN. Furthermore, a method for describing public emotions based on semantic analysis is proposed. Leveraging semantic analysis algorithms, double LSTM and self-attention mechanisms are employed to categorize the emotions of individuals and generate captions to understand the emotions. Experiments validate the effectiveness of our approach in accurately pinpointing individuals within images, enabling a comprehensive assessment of public participation in the restoration of historic residential areas. Our method obtains a CIDEr value of 127.0 and an F value of 0.8856. Moreover, our method proficiently characterizes participants’ emotional states, providing valuable technical support for societal development.