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Your search keyword '"Nohira, H."' showing total 8 results
Start Over Author "Nohira, H." Publication Type Electronic Resources
8 results on '"Nohira, H."'

1. Thermal stability of Gd2O3/Si(100) interfacial transition layer

Author

Nohira, H, Yoshida, T, Okamoto, H, Shinagawa, S, Sakai, W, Nakajima, K, Suzuki, M, Kimura, K, Aun, NJ, Kobayashi, Y, Ohmi, S, Iwai, H, Ikenaga, E, Takata, Y, Kobayashi, K, Hattori, T, Nohira, H, Yoshida, T, Okamoto, H, Shinagawa, S, Sakai, W, Nakajima, K, Suzuki, M, Kimura, K, Aun, NJ, Kobayashi, Y, Ohmi, S, Iwai, H, Ikenaga, E, Takata, Y, Kobayashi, K, and Hattori, T

Published
2006

2. Thermal stability of Gd2O3/Si(100) interfacial transition layer

Author

80293885, 00346040, 50127073, Nohira, H, Yoshida, T, Okamoto, H, Shinagawa, S, Sakai, W, Nakajima, K, Suzuki, M, Kimura, K, Aun, NJ, Kobayashi, Y, Ohmi, S, Iwai, H, Ikenaga, E, Takata, Y, Kobayashi, K, Hattori, T, 80293885, 00346040, 50127073, Nohira, H, Yoshida, T, Okamoto, H, Shinagawa, S, Sakai, W, Nakajima, K, Suzuki, M, Kimura, K, Aun, NJ, Kobayashi, Y, Ohmi, S, Iwai, H, Ikenaga, E, Takata, Y, Kobayashi, K, and Hattori, T

Published
2006

6. Composition, chemical structure, and electronic band structure of rare earth oxide/Si(100) interfacial transition layer

Author

80293885, 00346040, 50127073, Hattori, T, Yoshida, T, Shiraishi, T, Takahashi, K, Nohira, H, Joumori, S, Nakajima, K, Suzuki, M, Kimura, K, Kashiwagi, I, Ohshima, C, Ohmi, S, Iwai, H, 80293885, 00346040, 50127073, Hattori, T, Yoshida, T, Shiraishi, T, Takahashi, K, Nohira, H, Joumori, S, Nakajima, K, Suzuki, M, Kimura, K, Kashiwagi, I, Ohshima, C, Ohmi, S, and Iwai, H

Published
2004

7. Quality of SiO2 and of SiGe formed by oxidation of Si/Si0.7Ge0.3 heterostructure using atomic oxygen at 400 degrees C

Author

80293885, 00346040, 50127073, Nohira, H, Kuroiwa, T, Nakamura, A, Hirose, Y, Mitsui, J, Sakai, W, Nakajima, K, Suzuki, M, Kimura, K, Sawano, K, Nakagawa, K, Shiraki, Y, Hattori, T, 80293885, 00346040, 50127073, Nohira, H, Kuroiwa, T, Nakamura, A, Hirose, Y, Mitsui, J, Sakai, W, Nakajima, K, Suzuki, M, Kimura, K, Sawano, K, Nakagawa, K, Shiraki, Y, and Hattori, T

Published
2004

8. Atomic-scale depth profiling of composition, chemical structure and electronic band structure of La2O3/Si(100) interfacial transition layer

Author

80293885, 00346040, 50127073, Nohira, H, Shiraishi, T, Takahashi, K, Hattori, T, Kashiwagi, I, Ohshima, C, Ohmi, S, Iwai, H, Joumori, S, Nakajima, K, Suzuki, M, Kimura, K, 80293885, 00346040, 50127073, Nohira, H, Shiraishi, T, Takahashi, K, Hattori, T, Kashiwagi, I, Ohshima, C, Ohmi, S, Iwai, H, Joumori, S, Nakajima, K, Suzuki, M, and Kimura, K

Published
2004

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