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Your search keyword '"Roche, Nicolas"' showing total 3 results
Start Over Author "Roche, Nicolas" Publication Type Reports
3 results on '"Roche, Nicolas"'

1. Single-Event Effect Performance of a Commercial ReRAM

Author

Chen, Dakai, Kim, Hak S, Phan, Anthony, Wilcox, Edward, LaBel, Kenneth, Buchner, Stephen, Khachatrian, Ani, and Roche, Nicolas

Subjects
Electronics And Electrical Engineering
Abstract

We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to bit upsets. However the ReRAM system is vulnerable to SEFI.

Published
2014

2. Radiation Effects of Commercial Resistive Random Access Memories

Author

Chen, Dakai, LaBel, Kenneth A, Berg, Melanie, Wilcox, Edward, Kim, Hak, Phan, Anthony, Figueiredo, Marco, Buchner, Stephen, Khachatrian, Ani, and Roche, Nicolas

Subjects
Electronics And Electrical Engineering
Abstract

We present results for the single-event effect response of commercial production-level resistive random access memories. We found that the resistive memory arrays are immune to heavy ion-induced upsets. However, the devices were susceptible to single-event functional interrupts, due to upsets from the control circuits. The intrinsic radiation tolerant nature of resistive memory makes the technology an attractive consideration for future space applications.

Published
2014

3. Single-Event Effect Response of a Commercial ReRAM

Author

Chen, Dakai, Label, Kenneth A, Kim, Hak, Phan, Anthony, Wilcox, Edward, Buchner, Stephen, Khachatrian, Ani, and Roche, Nicolas

Subjects
Electronics And Electrical Engineering
Abstract

We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to bit upsets. However the ReRAM system is vulnerable to SEFIs due to upsets in peripheral circuits, including the sense amplifier.

Published
2014

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