1. Carbon nanotube transistors scaled to a 40-nanometer footprint.
- Author
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Qing Cao, Tersoff, Jerry, Farmer, Damon B., Yu Zhu, and Shu-Jen Han
- Subjects
- *
PERFORMANCE of transistors , *CARBON nanotubes , *ELECTROMAGNETIC current density measurement , *PERFORMANCE evaluation , *NANOELECTROMECHANICAL systems - Abstract
The International Technology Roadmap for Semiconductors challenges the device research community to reduce the transistor footprint containing all components to 40 nanometers within the next decade. We report on a p-channel transistor scaled to such an extremely small dimension. Built on one semiconducting carbon nanotube, it occupies less than half the space of leading silicon technologies, while delivering a significantly higher pitch-normalized current density—above 0.9 milliampere per micrometer at a low supply voltage of 0.5 volts with a subthreshold swing of 85millivolts per decade. Furthermore,we show transistors with the same small footprint built on actual high-density arrays of such nanotubes that deliver higher current than that of the best-competing silicon devices under the same overdrive,without any normalization. We achieve this using low-resistance end-bonded contacts, a high-purity semiconducting carbon nanotube source, and self-assembly to pack nanotubes into full surface-coverage aligned arrays. [ABSTRACT FROM AUTHOR]
- Published
- 2017
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