1. Size dependent bandgap of molecular beam epitaxy grown InN quantum dots measured by scanning tunneling spectroscopy.
- Author
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Kumar, Mahesh, Rajpalke, Mohana K., Bhat, Thirumaleshwara N., Roul, Basanta, Kalghatgi, A. T., and Krupanidhi, S. B.
- Subjects
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MOLECULAR beam epitaxy , *QUANTUM dots , *TUNNELING spectroscopy , *INDIUM nitride , *WURTZITE , *X-ray diffraction , *TRANSMISSION electron microscopy , *EFFECTIVE mass (Physics) - Abstract
InN quantum dots (QDs) were grown on Si (111) by epitaxial Stranski-Krastanow growth mode using plasma-assisted molecular beam epitaxy. Single-crystalline wurtzite structure of InN QDs was verified by the x-ray diffraction and transmission electron microscopy. Scanning tunneling microscopy has been used to probe the structural aspects of QDs. A surface bandgap of InN QDs was estimated from scanning tunneling spectroscopy (STS) I-V curves and found that it is strongly dependent on the size of QDs. The observed size-dependent STS bandgap energy shifts with diameter and height were theoretical explained based on an effective mass approximation with finite-depth square-well potential model. [ABSTRACT FROM AUTHOR]
- Published
- 2011
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