15 results on '"Collins, R."'
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2. Real time spectroellipsometry for optimization of diamond film growth by microwave plasma-enhanced chemical vapor deposition from CO/H2 mixtures.
3. Real time spectroellipsometry characterization of optical gap profiles in compositionally-graded semiconductor structures: Applications to bandgap engineering in amorphous silicon-carbon alloy solar cells.
4. Growth analysis of (Ag,Cu)InSe2 thin films via real time spectroscopic ellipsometry.
5. Analysis of controlled mixed-phase (amorphous+microcrystalline) silicon thin films by real time spectroscopic ellipsometry.
6. Dual rotating-compensator multichannel ellipsometer: Instrument development for high-speed Mueller matrix spectroscopy of surfaces and thin films.
7. Spectroscopic ellipsometry on the millisecond time scale for real-time investigations of thin-film and surface phenomena.
8. Optical transition energies as a probe of stress in polycrystalline CdTe thin films.
9. Broadening of optical transitions in polycrystalline CdS and CdTe thin films.
10. Electronic and structural properties of molybdenum thin films as determined by real-time spectroscopic ellipsometry.
11. Extended phase diagrams for guiding plasma-enhanced chemical vapor deposition of silicon thin films for photovoltaics applications.
12. Ultraviolet-extended real-time spectroscopic ellipsometry for characterization of phase evolution in BN thin films.
13. Surface, interface, and bulk properties of amorphous carbon films characterized by in situ ellipsometry.
14. An improved analysis for band edge optical absorption spectra in hydrogenated amorphous silicon from optical and photoconductivity measurements.
15. Correlation of real time spectroellipsometry and atomic force microscopy measurements of surface roughness on amorphous semiconductor thin films.
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