31 results on '"Adamu-Lema, Fikru"'
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2. Equivalent Circuit Macro-Compact Model of the 1T Bipolar SRAM Cell
3. A Kinetic Monte Carlo study of retention time in a POM molecule-based flash memory
4. Dynamic Simulation of Write ‘1’ Operation in the Bi-stable 1-Transistor SRAM Cell
5. Enhanced Capabilities of the Nano-Electronic Simulation Software (NESS)
6. Multiscale Modeling of Charge Trapping in Molecule Based Flash Memories
7. Z²-FET as capacitor-less eDRAM cell for high-density integration
8. Extended analysis of the Z²-FET: operation as capacitorless eDRAM
9. Quantum Transport Investigation of Threshold Voltage Variability in Sub-10 nm JunctionlessSi Nanowire FETs
10. The Impact of Dopant Diffusion on Random Dopant Fluctuation in Si Nanowire FETs: A Quantum Transport Study
11. NESS: new flexible Nano-Electronic Simulation Software
12. Does a nanowire transistor follow the golden ratio? A 2D Poisson-Schrödinger/3D Monte Carlo simulation study
13. Understanding Electromigration in Cu-CNT Composite Interconnects: A Multiscale Electrothermal Simulation Study.
14. Random Dopant-Induced Variability in Si-InAs Nanowire Tunnel FETs: A Quantum Transport Simulation Study.
15. Z^\textsf 2 -FET as Capacitor-Less eDRAM Cell For High-Density Integration.
16. Interplay between quantum mechanical effects and a discrete trap position in ultra-scaled FinFETs
17. Experimental and Simulation Study of Silicon Nanowire Transistors Using Heavily Doped Channels.
18. Interplay between quantum mechanical effects and a discrete trap position in ultra-scaled FinFETs.
19. Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D ‘atomistic’ simulation
20. 3D dynamic RTN simulation of a 25nm MOSFET: The importance of variability in reliability evaluation of decananometer devices
21. A Mobility Correction Approach for Overcoming Artifacts in Atomistic Drift-Diffusion Simulation of Nano-MOSFETs.
22. Modelling of reliability of nanoscale MOSFETs within the discrete charge trapping paradigm.
23. Performance and Variability of Doped Multithreshold FinFETs for 10-nm CMOS.
24. Problems With the Continuous Doping TCAD Simulations of Decananometer CMOS Transistors.
25. Time-Dependent 3-D Statistical KMC Simulation of Reliability in Nanoscale MOSFETs.
26. 3-D Statistical Simulation Comparison of Oxide Reliability of Planar MOSFETs and FinFET.
27. Geometry, Temperature, and Body Bias Dependence of Statistical Variability in 20-nm Bulk CMOS Technology: A Comprehensive Simulation Analysis.
28. Accuracy and Issues of the Spectroscopic Analysis of RTN Traps in Nanoscale MOSFETs.
29. Simulation Study of Individual and Combined Sources of Intrinsic Parameter Fluctuations in Conventional Nano-MOSFETs.
30. Statistical Interactions of Multiple Oxide Traps Under BTI Stress of Nanoscale MOSFETs.
31. Impact of statistical variability and 3D electrostatics on post-cycling anomalous charge loss in nanoscale Flash memories.
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