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2. Confined IMCs for low temperature and high throughput D2W bonding

4. Low temperature backside damascene processing on temporary carrier wafer targeting 7μm and 5μm pitch microbumps for N equal and greater than 2 die to wafer TCB stacking

6. A study on IMC morphology and integration flow for low temperature and high throughput TCB down to $10\mu \mathrm{m}$ pitch microbumps

8. Process development and characterization of 3D multi-die stacking

9. ELD NiB for microbumps passivation and wirebonding

12. 10 and 7 μm Pitch Thermo-compression Solder Joint, Using A Novel Solder Pillar And Metal Spacer Process

13. Process Complexity and Cost Considerations of Multi-Layer Die Stacks

15. A Novel Intermetallic Compound Insertion Bonding to Improve Throughput for Sequential 3-D Stacking.

16. A Novel Resistance Measurement Methodology for $In~Situ$ UBM/Solder Interfacial Reaction Monitoring.

22. Growth rate of IMC in the binary sytems of Co/Sn and Cu/Sn

23. 3D stacking cobalt and nickel microbumps and kinetics of corresponding IMCs at low temperatures

24. Die to wafer 3D stacking for below 10um pitch microbumps

25. Liquid mediated direct bonding and bond propagation

26. 3D Stacking Using Bump-Less Process for Sub 10um Pitch Interconnects

27. Investigation of Co Thin Film as Buffer Layer Applied to Cu/Sn Eutectic Bonding and UBM With Sn, SnCu, and SAC Solders Joints.

28. Cobalt UBM for fine pitch microbump applications in 3DIC

29. Picking large thinned dies with high topography on both sides

32. Reflow process optimization for micro-bumps applications in 3D technology

33. Fine Pitch Rapid Heat Self-Aligned Assembly and Liquid-Mediated Direct Bonding of Si Chips.

38. High-Efficiency Silicon Photodiode Detector for Sub-keV Electron Microscopy.

39. Monolithic 3-D Integration of SRAM and Image Sensor Using Two Layers of Single-Grain Silicon.

40. VUV/Low-Energy Electron Si Photodiodes With Postmetal 400^\circC PureB Deposition.

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