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A 31-inch 4K flexible active-matrix organic light-emitting diode (AMOLED) display integrating with gate driver on the array (GOA) technology has been proposed and fabricated on a polyimide substrate. The GOA circuits, composed of two series-connected thin-film transistors (TFTs) and dual low-voltage power structure, are introduced to decrease the leakage current in TFTs. They are arranged symmetrically along the sides of the display. Inkjet printing (IJP) OLED process is used to reduce the number of sub-pixels from four (R/G/B/W) in commercial white OLED process to three (R/G/B) and a high pixel density in the display (144 pixels per inch) is achieved. Moreover, top-gated (TG) amorphous indium-gallium-zinc oxide (IGZO) TFTs with good electrical and mechanical reliability, have been successfully utilized to decrease the capacitance load in the display and improve signal transfer speed in GOA. Finally, this 31-inch flexible AMOLED display was operated for 500h under accelerating test conditions of 60°C and 90% humidity. [ABSTRACT FROM AUTHOR]

A new pixel circuit is proposed for the realization of high resolution and high uniformity organic light-emitting diode on silicon (OLEDoS) microdisplays in this article. A compensation scheme is adopted to mitigate the influence of threshold voltage variation of the driving transistor on display uniformity. Furthermore, two coupling capacitors are used to reduce the voltage at the gate terminal of the driving transistor in order to extend the data voltage range. The performance of the proposed pixel circuit is verified in an industrial 0.18- $\mu \text{m}$ CMOS process. Simulation results show that the data voltage of the proposed pixel circuit ranges from 0.5 to 3.12 V, which is up to $4.37\times $ wider than the previously published pixel circuits. The emission current error of the proposed pixel circuit varies from −2.1% to 2.08%, under the condition of ±5 mV threshold voltage variation for the driving transistor. The maximum emission current error changes from −10.36% to −2.62% when the OLED turn-on voltage is increased by 5 to 20 mV due to device aging. Furthermore, the proposed pixel circuit only occupies a layout area of $8.1\,\,\mu \text{m}\,\,\times {4}\,\,\mu \text{m}$. [ABSTRACT FROM AUTHOR]

A new source driving circuit to compensate characteristics variations of thin-film transistors for AMOLED displays with high resolution is presented in this brief. The second-generation current conveyor is implemented for rapid current sensing of the feedback line, which is biased with a constant reference-voltage ($V_{{\mathrm{ REF}}}$). Further, the current difference between the current of the driving transistor (${I}_{ {D}}$) and the programming current, i.e., ${I}_{{\mathrm{ DATA}}}$ , is converted into switching voltage through an amplifier with a shorted resistor, to control the input of a ramp voltage (${V}_{{\mathrm{ RAMP}}}$). Thus, the degradations in electrical characteristics of the driving transistor can be compensated in real time, and both the influence of threshold voltage (${V}_{{\mathrm{ TH}}}$) shift and mobility (${ {\mu }}$) variation are effectively suppressed. The current-error rate of the proposed circuit is less than 3% with ${V}_{{\mathrm{ TH}}}$ shift of ±0.5 V or ${ {\mu } }$ variation of ±15%. In addition, the settling time is less than $4~{ {\mu } }{\text s}$ with the panel loading of 1.5 $\text{K}{ {\Omega }}$ and 100 pF at the OLED current (${I}_{{\mathrm{ OLED}}}$) levels ranging from 3 ${ {\mu }}\text{A}$ to 200 nA. [ABSTRACT FROM AUTHOR]

A readout circuit for large sized capacitive touch screens is presented in this letter. Being different from the conventional readout circuit, the phase conversion module is inserted between the differential sensing structure and the integrating amplifier, to take advantage of both the positive and negative edge of the touch sensing signal for the following integrator. Thus, the sensing output value can be increased as the touch signals are integrated by twice for every clock cycle. Both simulation and measurement results verify that, thanks to the insertion of the proposed phase conversion module, the amplitude of touch sensing circuit’s output is increased from 1.4 to 2.8 V. In addition, compared with the frequency increasing method, the proposed scheme features an increase of 40% in the sensing output voltage. [ABSTRACT FROM AUTHOR]

An operational amplifier with indium-gallium-zinc oxide thin-film-transistors (InGaZnO TFTs) is proposed and investigated. The proposed amplifier features introduction of positive feedback with negative equivalent output resistance for high voltage gain. Biasing conditions for every TFTs and voltage gain are systematically discussed. In addition, influences of threshold voltage shift on both static and dynamic performances are discussed. Comparison results show that the voltage gain can be increased from 40 to 67 dB, and stability of the constant tail-current biasing is better than that of constant voltage biasing method. Further, an oscillating capacitance touch sensing circuit based on the proposed amplifier is shown, and sub-pF touching capacitance can be distinguished. The proposed InGaZnO TFTs integrated amplifier is promising for high performance system on panel designs. [ABSTRACT FROM PUBLISHER]

A dual-gate (DG) amorphous indium–gallium–zinc-oxide thin-film transistor (TFT)-driven pixel circuit for active-matrix organic light-emitting diode displays is presented. One gate of the DGs serves as a primary gate (PG) and the other as an auxiliary gate (AG). The threshold voltage ( V\mathrm {{TH}} ) of the DG TFT under the PG operation is modulated by the AG bias voltage. The V\mathrm {{TH}} variation ( \Delta V\mathrm {{TH}} ) is compensated with the AG and the drain diode-connected structure. The validity of the presented pixel circuit is experimentally verified. The measured current error rates are less than 3.2% at a \Delta V\mathrm {{TH}} of \text TFT = \pm 0.5 V and a \Delta V\mathrm {{TH}} of OLED = 0.5 V with the emission current ranging from 7 nA to 1.13~\mu \textA . [ABSTRACT FROM AUTHOR]

A hydrogenated amorphous silicon (a-Si:H) thin-film transistor (TFT) gate driver on array with low-level holding TFTs (LLH TFTs) biased under bipolar pulse is investigated. It is shown that the bipolar bias at low frequency significantly alleviates the threshold voltage shift of the LLH TFTs. As a result, the lifetime of the proposed gate driver is demonstrated to be several times of that under the conventional unipolar pulse bias. In addition, the improvement in the lifetime becomes more significant at the higher work temperature. The liquid crystal display television panels (32-in, 1366\times \textrm RGB\times 768 ) with the proposed a-Si:H gate drivers integrated on array are manufactured, and the feasibility of the proposed driving scheme is well verified. [ABSTRACT FROM PUBLISHER]

Threshold voltage shift ( \Delta V\mathrm{ TH} ) effect of hydrogenated amorphous silicon thin-film transistors under bipolar pulse bias stress (BPBS) is investigated. The dependence of the \Delta V\mathrm{ TH} effect on the signal pulsewidth, stress temperature, and negative pulse voltage magnitude of the BPBS is systematically measured, and explained by the charge trapping and detrapping theory. Results show that the BPBS leads to a noticeably suppressed \Delta V\mathrm{ TH} , compared with the conventional unipolar pulse bias stress. It is suggested that the BPBS with proper negative pulse voltage magnitude and low pulse frequency is an effective way of suppressing \Delta V\mathrm{ TH} , especially when the thin-film transistors work relatively at high temperature. [ABSTRACT FROM PUBLISHER]

A thorough study on the gate driver integrated with hydrogenated amorphous-silicon thin-film transistors (a-Si:H TFTs) for active-matrix flat-panel display (AM-FPD) is carried out in this work. The single stage circuit of the a-Si:H gate driver consists of input, pull-up, pull-down, and low-level holding units. The operation principle of the driver is described in detail. The subtle static and dynamic characteristics of the a-Si:H TFT based circuit are analyzed systematically for the first time. The long term reliability issue is also addressed. Design equations for determining the device sizes of the circuit are derived. The TFT-LCD panels integrated with the designed gate driver are fabricated to verify the design efficiency. [ABSTRACT FROM PUBLISHER]

An integrated five-transistor/one-capacitor approach for realizing a a-Si:H thin-film transistor (TFT) gate driver operating in multiphase-clock mode is proposed and investigated. The driver needs only one large-size TFT and one small-size storage capacitor. The performance and function of the proposed driver are verified experimentally. The dependence of the performance on the device size is studied in detail. Stability of the fabricated drivers is tested using a flexible measurement scheme. Measured results show that the fabricated gate driver can work stably even though the low-level-holding TFTs have a threshold-voltage shift of 19 V. [ABSTRACT FROM AUTHOR]