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Start Over Author "Yuan, Xiaobin" Publisher institution of engineering & technology
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1. Interview.

Author

Yuan, Xiaobin

Subjects
*TRANSISTORS, *MICROELECTRONICS
Abstract

Dr Xiaobin Yuan from the Microelectronics Division of IBM and author of the Letter ‘Transistor mismatch in 32 nm high-k metal-gate process’ on page 708 tells us more about his research into advanced process technologies. [ABSTRACT FROM AUTHOR]

Published
2010
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