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Start Over Author "Andreas Koitzsch" Publisher international union of crystallography (iucr)
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1. Electronic depth profiles with atomic layer resolution from resonant X-ray reflectivity

Author

Jochen Geck, J. E. Hamann-Borrero, Lambert Alff, Uwe Treske, Enrico Schierle, Philipp Komissinskiy, Mehran Vafaee, S. Sutarto, George A. Sawatzky, M. Zwiebler, Jak Chakhalian, J. W. Freeland, S. Macke, Feizhou He, Eugen Weschke, Andreas Koitzsch, and B. Gray

Subjects
Inorganic Chemistry, X-ray reflectivity, Optics, Materials science, Structural Biology, business.industry, Resolution (electron density), General Materials Science, Physical and Theoretical Chemistry, Condensed Matter Physics, business, Biochemistry, Layer (electronics)
Published
2015
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