15 results on '"Bushnell, Michael L."'
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2. Test Generation for Mixed-Signal Devices Using Signal Flow Graphs
3. Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits
4. Classification and Test Generation for Path-Delay Faults Using Single Struck-at Fault Tests
5. A Functional Decomposition Method for Redundancy Identification and Test Generation
6. Sequential circuit test generation using dynamic justification equivalence
7. A parallel-vector concurrent-fault simulator and generation of single-input-change tests for path-delay faults
8. The path-status graph with application to delay fault simulation
9. Energy minimization and design for testability
10. On variable clock methods for path delay testing of sequential circuits
11. Improving a nonenumerative method to estimate path delay fault coverage
12. Fault coverage estimation by test vestor sampling
13. Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
14. A solvable class of quadratic 0–1 programming
15. DIF: A framework for VLSI multi-level representation
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