1. Employing surface curvature for spatially resolved X‐ray reflectivity: graphene domains on liquid copper
- Author
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Valentina Belova, Maciej Jankowski, Mehdi Saedi, Irene M. N. Groot, Gilles Renaud, Oleg V. Konovalov, European Synchroton Radiation Facility [Grenoble] (ESRF), Leiden Institute of Chemistry, Universiteit Leiden, Modélisation et Exploration des Matériaux (MEM), Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes (UGA), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Nanostructures et Rayons X (NRX), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes (UGA)-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), and European Project: 951943,DirectSepa
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[PHYS]Physics [physics] ,Mechanics of Materials ,Mechanical Engineering - Abstract
Here we demonstrate the possibility of utilizing X-ray reflectivity for visualization with ~μm spatial resolution of a surface with a heterogeneous electron density due to a partial coverage by another nanometrically thin material. It requires the sample to be convexly bent, thus reflecting the collimated incident beam onto a magnified image recorded by a position-sensitive detector. By the use of a small, about ten microns, intense, and parallel beam such as provided by the most recent synchrotron sources, one can record such spatially resolved X-ray reflectivity with 0.1‒1 kHz frame rate. We demonstrate the use of the method for in situ, time-resolved characterization of single-layer graphene domains during their chemical vapor deposition on a naturally curved surface of a liquid copper drop. This method can follow the growth kinetics, including the coverage ratio, two-dimensional crystal (flake) sizes, and distances between flakes. By taking a single snapshot, we can reconstruct the individual X-ray reflectivity curves, of both covered and non-covered parts of the liquid surface, and thus deduce the corresponding electron density profiles perpendicular to the surface. The technique has a promising perspective for in situ study of two-dimensional materials, ultra-thin films, and self-assemblies on liquid as well as solid surfaces.
- Published
- 2023
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