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The present work reports our efforts to enhance the performance and uniformity for the long tapes of metal–organic deposition YBa2Cu3O7−x (MOD-YBCO) layer on ion-beam-assisted deposition MgO (IBAD-MgO) template. Reflection High-energy electron diffraction (RHEED) is employed to realize the in-situ growth monitor of IBAD-MgO, as well as the correlation between the quantitative RHEED peaks and in-plane texture of Epi-MgO identified by XRD, which is an effective guide to improve the uniformity and performance of long YBCO tapes. In addition, the surface of the LMO layer during the magnetron sputtering process is improved via controlling the O2 flux, and then the critical-current density (Jc) of YBCO films has been improved. By optimizing the texture of the MgO layer and precisely controlling the LMO layer growth conditions, the performance and uniformity of YBCO-coated conductors grown by metal–organic deposition (MOD) have been greatly enhanced. The superconducting current-carrying capacities of 12-mm-wide tapes have upgraded steadily from 400–500 A to 500–550 A in past 3 years. The laminated CC tapes with current-carrying capacities of 150–170 A per 4-mm width show good uniformity and high quality along 500-m length, implying being promising for various commercial power applications. [ABSTRACT FROM AUTHOR]

LaMnO3−δ (LMO) films with different oxygen contents are deposited on Epi-MgO/IBAD-MgO templates using reactive magnetron sputtering under varying temperatures and atmospheres. Subsequent YBa2Cu3O7−δ (YBCO) films are grown on LMO layers by metal-organic deposition (MOD) method. X-ray diffraction measurements reveal that YBCO texture cannot be further improved when the full width at half maximum (FWHM) values of LMO (011) φ-scans (evaluation on in-plane alignment) and LMO (002) ω-scans (evaluation on out-of-plane alignment) for LMO films are less than 8° and 4°, respectively. Sharp orientation with in-plane FWHM value of <3° for YBCO (103) φ-scan and out-of-plane FWHM value of <1.5° for YBCO (006) ω-scan can typically be achieved in YBCO films. Precise control of growth conditions, especially atmosphere, remains a feasible way to modify the surface of LMO films. It induces changes in oxygen content, lattice structure and surface morphology of LMO, and further affects the epitaxial growth of superconducting layers. Oxygen-deficient LMO with expanded lattice parameters and flat surface can effectively suppress the non-c-axis oriented YBCO, thereby enhancing the current carrying capability. The 500 m long YBCO coated conductors with conditioned LMO layers have an inductive critical current (Ic) ranging from 358 to 437 A/12 mm width with an average value of 398 A/12 mm width. [ABSTRACT FROM AUTHOR]

It is demonstrated that electrodeposition is a promising cost-effective technique to grow oxide buffer on metallic tapes. The resultant layer of CeO2 shows the biaxial texture of FWHM = 5.5° as well as a smooth surface of RMS = 2.0 nm, and YBa2Cu3O7−δ coated conductor with such a buffer exhibits the critical current density of 1.85 MA cm−2 at 77 K. Of more interest is that the CeO2 film thickness reaches a high value of more than 200 nm without any cracks, while it is very hard to achieve a thickness of more than 70 nm in the conventional vapor deposition methods employed. [ABSTRACT FROM AUTHOR]

Comparing with conventional physical vapor deposition methods, electrochemistry deposition technique shows a crack suppression effect by which the thickness of CeO 2 films on Ni–5 at.%W substrate can reach a high value up to 200 nm without any cracks, make it a potential single buffer layer for coated conductor. In the present work, the processes of CeO 2 film deposited by electrochemistry method are detailed investigated. A hydroxide reactive mechanism and an oxide reactive mechanism are distinguished for dimethyl sulfoxide and aqueous solution, respectively. Before heat treatment to achieve the required bi-axial texture performance of buffer layers, the precursor CeO 2 films are identified in nanometer scales. The crack suppression for electrochemistry deposited CeO 2 films is believed to be attributed to the nano-effects of the precursors. [ABSTRACT FROM AUTHOR]