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2 results on '"Synchrotron topography"'

1. Investigation of Defects in 4H-SiC by Synchrotron Topography, Raman spectroscopy Imaging and Photoluminescence Spectroscopy Imaging

Author

Michel Pons, Michel Mermoux, Roland Madar, Jean-Marie Bluet, M Anikin, Etienne Pernot, Didier Chaussende, I. El Harrouni, Laboratoire des matériaux et du génie physique (LMGP ), Institut National Polytechnique de Grenoble (INPG)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de physique de la matière (LPM), Institut National des Sciences Appliquées de Lyon (INSA Lyon), Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Université de Lyon-Centre National de la Recherche Scientifique (CNRS), Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces (LEPMI ), Institut de Chimie du CNRS (INC)-Institut National Polytechnique de Grenoble (INPG)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Joseph Fourier - Grenoble 1 (UJF)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS), NOVASIC, NOVASiC, Laboratoire de thermodynamique et physico-chimie métallurgiques (LTPCM), and Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique de Grenoble (INPG)

Subjects
010302 applied physics, Materials science, Photoluminescence, business.industry, Mechanical Engineering, Synchrotron topography, scanning photoluminescence, [CHIM.MATE]Chemical Sciences/Material chemistry, Condensed Matter Physics, 01 natural sciences, Synchrotron, law.invention, 010309 optics, symbols.namesake, Mechanics of Materials, law, 0103 physical sciences, Raman spectroscopy, symbols, Optoelectronics, General Materials Science, business, Spectroscopy
Abstract

International audience; Reflection synchrotron topography, integrated photoluminescence imaging and Raman spectroscopy imaging have been performed on a 4H-SiC slice. The three methods give complementary information on the defects in the crystal. The differences between the observations are discussed.

Published
2003
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2. Diffraction imaging (topography) with monochromatic synchrotron radiation

Author

Masao Kuriyama, Bruce Steiner, Uri Laor, and Ronald C. Dobbyn

Subjects
Diffraction, business.industry, crystal growth, Resolution (electron density), Lithium niobate, General Engineering, Mineralogy, Synchrotron radiation, electrooptic materials, Article, Cadmium telluride photovoltaics, Gallium arsenide, synchrotron topography, chemistry.chemical_compound, Optics, chemistry, Bismuth silicon oxide, Monochromatic color, monochromatic diffraction imaging, business
Abstract

Structural information of special interest to crystal growers and device physicists is now available from high resolution monochromatic synchrotron diffraction imaging (topography). In this review, the importance of superior resolution in momentum transfer and in space is described, and illustrations are taken from a variety of crystals: gallium arsenide, cadmium telluride, mercuric iodide, bismuth silicon oxide, and lithium niobate. The identification and detailed understanding of local variations in crystal growth processes are shown. Finally, new experimental opportunities now available for exploitation are indicated.

Published
1988
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