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We propose an all-standard-cell-based synthesizable successive-approximation-register analog-to-digital converter (SAR ADC) which is automatically placed and routed (P&R) using a commercial digital implementation tool. For higher feasibility and wider input range, a differential architecture is proposed with an inverter-based resistive digital-to-analog converter (RDAC) and a four-input comparator. MOSFET gate capacitance is employed for the sampling capacitor. To mitigate its capacitance variation due to input voltage and the leakage between gate and diffusion, we leave the diffusion of the standard cell floating and only use the capacitance between gate and bulk. Two prototypes have been designed in 65-nm bulk CMOS. Prototype I has been fabricated and achieves 10 MS/s, 14.3 mW, and 28.1-dB SNDR in a 6-bit architecture. The performance is improved in Prototype II by proposing a lookup table (LUT)-compensating transistor-configurable inverter-based RDAC and an OR-AND-Inverter (OAI)-based comparator and by employing a thick-oxide diffusion-floating decoupling cell for the sampling capacitor. The default LUT is created during the design phase by a script-controlled automatic simulation routine. The power consumption is significantly reduced as well through improved timing control. Layout-parasitic-extraction (LPE) simulations of Prototype II suggest 35.7- and 47.2-dB SNDRs in 6- and 8-bit versions, respectively. The power consumptions are reduced to 0.91 and 2.52 mW, respectively. [ABSTRACT FROM AUTHOR]

This paper presents a fractional-N digital phase-locked loop (PLL) that achieves low in-band phase noise. Phase detection is carried out by a proposed 10-bit, 0.8 ps resolution time-to-digital converter (TDC) using a charge pump and a successive-approximation-register analog-to-digital converter (SAR-ADC) with low power and small area. The latency of the TDC is addressed by the designed building blocks. The fractional spurs are reduced by dual-loop least-mean-square (LMS) calibration. A $\Delta \Sigma $ -less and MOS varactor-less LC digitally-controlled oscillator (DCO) is proposed whose frequency resolution is enhanced to 7 kHz (or a unit variable capacitance of 2.6 aF) using a bridging capacitor technique. A prototype chip is fabricated using a 65 nm CMOS process, occupying an active area of 0.38 mm2 and consuming a power of 9.7 mW at a reference frequency of 50 MHz. The measured in-band phase noise is 107.8 dBc/Hz to 110.0 dBc/Hz with a loop bandwidth of 1 to 5 MHz. [ABSTRACT FROM PUBLISHER]

A picosecond resolution time-to-digital converter (TDC) is presented. The resolution of a conventional delay chain TDC is limited by the delay of a logic buffer. Various types of recent TDCs are successful in breaking this limitation, but they require a significant calibration effort to achieve picosecond resolution with a sufficient linear range. To address these issues, we propose a simple method to break the resolution limitation without any calibration: a Gm \-C integrator followed by a successive approximation register analog-to-digital converter (SAR-ADC). This translates the time interval into charge, and then the charge is quantized. A prototype chip was fabricated in 90 nm CMOS. The measurement results reveal a 1 ps resolution, a -0.6/0.7 LSB differential nonlinearity (DNL), a -1.1/2.3 LSB integral nonlinearity (INL), and a 9-bit range. The measured 11.74 ps single-shot precision is caused by the noise of the integrator. We analyze the noise of the integrator and propose an improved front-end circuit to reduce this noise. The proposal is verified by simulations showing the maximum single-shot precision is less than 1 ps. The proposed front-end circuit can also diminish the mismatch effects. [ABSTRACT FROM PUBLISHER]