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Crystallization (set) time is a key bottleneck to achieve high-speed programming in phase change memory (PCM). Overcoming this limitation requires a deeper understanding of the solidification processes within nanoscale device configuration. This study explores crystallization dynamics in Ge2Sb2Te5 by measuring the transient resistance and power during the set process in confined PCM cells with nanosecond resolution. The transient resistance probes the phase, while the power can be used to evaluate temperature, thus uncovering details of the phase change dynamics. Our findings reveal a notable trend indicating that solidification from the melt results in faster crystallization compared with annealing the glassy state. Moreover, we observed notable differences in the solidification dynamics during set (crystallization) and reset (amorphization) pulses. Our nanosecond transient measurement methodology proves valuable in revealing crucial aspects of PCM crystallization dynamics, holding the potential to enable higher-speed programming. [ABSTRACT FROM AUTHOR]

A key bottleneck in using phase change memory (PCM) for training artificial neural networks is the abrupt nature of the melt-quench process (amorphization), which does not allow gradual reset. Here we demonstrate analog reset (partial amorphization) in PCM by applying sub-nanosecond programming pulses. Intermediate-level reset states are enabled by reducing the pulse width below the dominant thermal time constant of the PCM, which is on the order of a few nanoseconds. We show gradual change in PCM resistance as a function of number of (sub-ns) reset pulses with 50 intermediate states. Our unique scheme allows fine-tuning the resistance with sub-ns pulses of constant amplitude, which can significantly reduce the programming complexity in training neuromorphic hardware. [ABSTRACT FROM AUTHOR]