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6 results on '"Kim, Seong Yeon"'

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1. Self-Heating Effects in 3-D Vertical-NAND (V-NAND) Flash Memory.

2. Quantitative Analysis of High-Pressure Deuterium Annealing Effects on Vertically Stacked Gate-All-Around SONOS Memory.

3. Suppression of Self-Heating Effects in 3-D V-NAND Flash Memory Using a Plugged Pillar-Shaped Heat Sink.

4. Electro-Thermal Erasing at 104-Fold Faster Speeds in Charge-Trap Flash Memory.

5. Self-powered data erasing of nanoscale flash memory by triboelectricity.

6. Sanitization of Data in Nanoscale Flash Memory by Thermal Erasing and Reuse of Storage.

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