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Many of today’s stretchable interconnection technologies make extensive use of meandered interconnections, these provide 2-D in-plane springs capable of extending and compressing as the need arises. While a significant quantity of research work exists on these interconnects, few generic methodologies exist to design circuits in a consistent manner. This shortfall leads to questionable design practices, which can negatively affect reliability and performance. Presented within this paper is a method to quickly determine which meander fits within a given area based on common geometric boundary conditions. [ABSTRACT FROM AUTHOR]

The primary bottleneck of the stretchable mold interconnect (SMI) technology is its reliance on carrier boards. These are necessary to handle the meandered circuit during production and to ensure dimensional stability of the flexible circuit board before encapsulation. However, for all the problems it solves, it also introduces a new major problem by requiring a peeling step—which is difficult to automate. This paper aims to present some of the work that went into eliminating this problem, discussing both unsuccessful and functioning methods to tackle this conundrum and some of the experimental work that went into verifying these techniques. First, alterations to the design to simplify peeling are considered, followed by adhesive-based peeling processes and mechanical pin-based systems. Next, masking and structuring of the carrier board adhesive are considered. Finally, two carrierless methods that circumvent the problems are discussed, a two-step process—which cuts temporary support structures after partial encapsulation—and a technique whereby the frame is designed to fail in a controlled manner during the first use of the circuit, creating a carrierless process feasible for high-volume production. [ABSTRACT FROM AUTHOR]

In this contribution, a conformable 64x45 RGB light-emitting diode (LED) matrix is presented. A design concept of stretchable electronics is used: non-stretchable polymer islands host rigid LEDs and are interconnected by horseshoe shaped metallic conductors, which are able to deform together with an elastomeric substrate. Thin-film metallization is used to enable a pixel pitch of 1 mm, while polyimide is used to realize the non-stretchable islands, but also to support the meandering conductors. The design of the stretchable interconnections has been optimized with respect to their mechanical and electrical performance. Thermoplastic polyurethane is introduced at a final stage of the fabrication process to ensure its compatibility with conventional thin-film processing. A passive matrix addressing scheme is used to drive the LED matrix. At a supply voltage of 10 V, the brightness of the display reaches up to 700 cd/m2. [ABSTRACT FROM AUTHOR]

In this paper, we present the developments of a new technology to realize 2.5-/3-D electronic circuits. The starting point is an electronic circuit embedded in a hard thermoplastic material, which is transformed into a 2.5-/3-D shape using a thermoforming process. The electronic circuit consists of stretchable copper interconnections in combination with electronic components. The circuit is produced using conventional printed circuit board process steps: a copper sheet is laminated on a thermoplastic material, such as Polycarbonate (PC) or Polyethylene Terephthalate Glycol (PET-G). The copper is structured using lithography and wet etching, and the electronic components are assembled using conductive adhesives. We investigated the use of different designs for stretchable interconnects to overcome the stretching of the electronic circuit by thermoforming it. A semispherical-shaped mold was used for this purpose where the local strain of the substrate can reach 100% with a sharp bending. It was shown that meander-shaped interconnects could accommodate the gradual deformation during the forming of the substrate either for PC and PET-G. However, at the mold’s edge, the copper-meandered tracks showed a delamination of the copper from the substrate. In the meanwhile, the electrical conductivity of the copper tracks did not show any significant variation. Another meander design based on an elliptical shape (in order to increase the length of the track) is proposed and compared with the first design. [ABSTRACT FROM PUBLISHER]

In order to increase the functionality of electronic devices, while reducing the overall size and weight of the electronic chip packages, electronic chip packages can be combined into a 3-D assembly. In this field, we present a technology for stacking multiple chip packages, resulting in total volume almost equal to that of a single bare die. The technology is based on batch-processed ultrathin chip packages (UTCPs) with a fine pitch metal fan-out. Package-on-package technology enables stacking of UTCPs by vacuum lamination, followed by through-hole interconnection technology for making contacts to the metal fan-out of the embedded UTCPs within the stack. The individual chip packages can be tested before stacking. [ABSTRACT FROM AUTHOR]

The development and mechanical characterization of a novel technology for stretchable electronics is presented, which can be used for the realization of wearable textile electronics and biomedical implants. The stretchable devices consist of rigid or flexible component islands interconnected with stretchable meander-shaped copper conductors embedded in a stretchable polymer, polydemethylsiloxane. The technology uses standard printed circuit board manufacturing steps and liquid injection molding techniques to achieve a robust and reliable product. The conductors in the device are designed to accommodate strains up to 10–15%. Spin-on photo-definable polyimide as mechanical support for the stretchable interconnects and the functional flexible islands are introduced. By use of polyimide, the reliability of the stretchable interconnects, the straight interconnects on the flexible islands and the transitions between the stretchable and nonstretchable parts are improved. Long-term endurance behavior of the stretchable interconnects is studied by cyclic elongation at strain ranges of up to 20% while monitoring the electrical connectivity. It's shown that the lifetime of the polyimide supported interconnects is at least two times better compared to the nonsupported. [ABSTRACT FROM AUTHOR]

This paper discusses the optimization of a stretchable electrical interconnection between integrated circuits in terms of stretchability and fatigue lifetime. The interconnection is based on Cu stripes embedded in a polyimide-enhanced (PI-enhanced) layer. Design-of-experiment (DOE) methods and finite-element modeling were used to obtain an optimal design and to define design guidelines, concerning both stripe and layer dimensions and material selection. Stretchable interconnects with a PI-enhanced layer were fabricated based on the optimized design parameters and tested. In situ experimental observations did validate the optimal design. Statistical analysis indicated that the PI width plays the most important role among the different design parameters. By increasing the PI width, the plastic strain in the Cu stripes is reduced, and thus, the stretchability and fatigue lifetime of the system is increased. The experimental results demonstrate that the PI-enhanced stretchable interconnect enables elongations up to 250% without Cu rupture. This maximum elongation is two times larger than the one in samples without PI enhancement refid="ref1"/ . Moreover, the fatigue life at 30% elongation is 470 times higher refid="ref2" . [ABSTRACT FROM PUBLISHER]

This paper describes the fine-pitch interconnection capabilities of the ultra-thin chip packaging (UTCP) technology, a technology under development for embedding thin chips in a flexible polyimide (PI) substrate. It allows for fully flexible electronics, as the rigid chips are thinned down to 20-30 μm, at which point they become truly flexible themselves. This way, instead of just a flexible substrate with rigid components assembled on top, the entire circuitry can be incorporated inside a 30-40 μm thin chip package. The paper briefly introduces the technology's background with a short description of the fabrication process. Building on the developments already achieved, some further optimizations are discussed, and the technology is tested for its fine-pitch interconnection capabilities using test chips with four-point probe and daisy chain patterns, with a pitch down to 40 μm. The possibility to package several chips in the same substrate is investigated, as well, and finally an outlook on future experiments is briefly discussed. [ABSTRACT FROM AUTHOR]

The increasing number of biomedical applications for electronic systems have led to the need for stretchable electronics in order to significantly enhance the comfort of the user. This paper describes the design and manufacturing process of new stretchable high-frequency interconnects with meander-shaped conductors in a coplanar waveguide topology. The novel interconnects are produced based on laser-ablation of a copper foil, which is then embedded in a highly stretchable bio-compatible silicone material. Measurements on prototypes of the designed stretchable high-frequency interconnects revealed a maximal magnitude of -14 dB for the reflection coefficient and a minimal magnitude of -4 dB for the transmission coefficient in the frequency band up to 3 GHz. The influence of stretch on the performance of the high-frequency interconnects was analyzed using a stretch testing machine. The results showed that nor the magnitude, neither the phase of the transmission coefficient was influenced by elongations up to 20%. [ABSTRACT FROM AUTHOR]

Abstract: This paper presents a summary of the modeling and technology developments for flexible and stretchable electronics. These technologies can achieve mechanically bendable and stretchable subsystems by incorporating the electronic circuit into a matrix made of a soft polymer. The base substrate used for the fabrication of flexible circuits is a uniform polyimide layer, while silicones or polyurethanes materials are preferred for the stretchable circuits. The method developed for chip embedding and interconnections is named Ultra Thin Chip Package (UTCP). Extensions of this technology can be achieved by stacking and embedding thin dies in polyimide, providing large benefits in electrical performance and still allowing some mechanical flexibility. These flexible circuits can be converted into stretchable circuits by replacing the polyimide by a soft and elastic silicone material. The integration of ultra thin dies at package level, with thickness in the range of 10–30μm, into flexible and/or stretchable materials are demonstrated. Furthermore, the design and reliability test of stretchable metal interconnections at board level are analyzed by both experiments and finite element modeling. We have shown through finite element modeling and experimental validation that an appropriate thermo-mechanical design is necessary to achieve mechanically reliable circuits and thermally optimized packages. [Copyright &y& Elsevier]

Abstract: In this paper, the effect of encapsulation on deformation behavior and failure mechanisms of stretchable interconnects is presented. Extensive numerical modeling is conducted for mechanical analysis of which the results are correlated with in-situ experimental observations. The numerical results reveal that by adding an encapsulation layer of various thickness (from 0.0 to 0.5mm) on top of the stretchable interconnect, the out-of-plane deformation and in-plane geometrical opening are reduced. Consequently, not only the plastic strain in the metal increases but also the in-plane shear stress at the interconnect/substrate interface. In-situ electromechanical experiments combined with scanning electron micrographs and optical images confirm the numerical analysis. More specifically, it is found that two failure mechanisms are involved during the stretching process: interfacial delamination in a S-shape alongside the metal conductor and metal breakdown at the crests of the metal conductor. The encapsulated stretchable interconnect shows both failure mechanisms at a lower percentage elongation than the non-encapsulated stretchable interconnect. Even so, the onset point of interfacial delamination for the encapsulated stretchable interconnect occurs only at an impressive number of 63% elongation and metal rupture only at 120%. The in-plane shear strain contour, obtained by numerical simulation, agrees well with the delamination failure location observed in the experiment. [ABSTRACT FROM AUTHOR]