6 results on '"Haendler, S."'
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2. Characterization and modeling of low frequency noise in CMOS inverters
3. Low-Frequency Noise Investigation and Noise Variability Analysis in High- k/Metal Gate 32-nm CMOS Transistors.
4. Shrinking from 0.25 down to 0.12 μm SOI CMOS technology node: a contribution to low-frequency noise in partially depleted N-MOSFETs
5. On the 1/f Noise in 0.15 μm Fully Depleted SOI/MOS Transistors.
6. Dispersion study of DC and Low Frequency Noise in SiGe:C Heterojunction Bipolar Transistors used for mm-Wave to Terahertz applications.
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