1. Dependence of Sub-Thermionic Swing on Channel Thickness and Drain Bias of Poly-Si Junctionless Thin-Film Transistor.
- Author
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Ma, William Cheng-Yu, Wang, Jia-Yi, Wang, Hsiao-Chun, Huang, Yan-Jia, and Yu, Li-Wei
- Subjects
FIELD-effect transistors ,POLYCRYSTALLINE silicon ,THICKNESS measurement - Abstract
We demonstrate the polycrystalline-silicon (poly-Si) junctionless (JL) thin-film transistor (TFT) with a planar structure and an ultra-thin channel film thickness ~1.5-nm exhibiting subthreshold swing (S.S.) less than 60 mV/decade. The S.S. of the poly-Si JL-TFT shows abnormal drain-voltage dependence, which the higher drain voltage leads to the smaller S.S. The minimum S.S. (S.S.min) observed in this letter is about 30 mV/decade, which is a record low S.S.min. The sub-60-mV/decade S.S. of the poly-Si JL-TFT is attributed to the impact ionization effect resulting from the high lateral electric field at the drain side at OFF-state. It is different from the conventional inversion-mode transistor, whose pinch-off point is observed at ON-state rather than the OFF-state. The lateral electric field is also found to be increasing with decreasing the channel thickness, and as a consequence, the impact ionization effect is more pronounced when the channel thickness is thinner. This letter shows a new concept for JL transistors, which would be helpful for the development of poly-Si JL-TFTs and the applications of 3-D integrated circuit and non-volatile memory. [ABSTRACT FROM AUTHOR]
- Published
- 2018
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