5 results on '"Wu, Tian-Li"'
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2. Analysis of slow de-trapping phenomena after a positive gate bias on AlGaN/GaN MIS-HEMTs with in-situ Si3N4/Al2O3 bilayer gate dielectrics.
3. Stability evaluation of Au-free Ohmic contacts on AlGaN/GaN HEMTs under a constant current stress.
4. Reliability Analysis of Permanent Degradations on AlGaN/GaN HEMTs.
5. Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis.
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