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We report on the trapping of 14 keV photons in periods of 1.11–1.67 ps by the 12 4 0 backdiffraction in two- and multiplate silicon single-crystal cavities of a few hundred micrometer size. The formation of standing waves inside the cavities ensures better coherence for the x rays. We anticipate that the transmitted x rays through this type of cavities can be used as a quasicoherent x-ray source for probing the dynamic structures of solids, liquids, and biological substances. [ABSTRACT FROM AUTHOR]

Cubic phase yttrium-doped HfO2 (YDH) ultrathin films were grown on Si (111) substrates by molecular beam epitaxy. Thorough structural and morphological investigations by x-ray scattering and transmission electron microscopy reveal that the YDH thin films are epitaxially grown on the Si substrates with (111)YDH∥(111)Si and [101]YDH∥[110]Si. The interface between YDH and Si is atomistic sharp and free of interfacial layer. We have also determined the yttrium content of YDH films to be 19% by using anomalous x-ray diffraction (AXD) across Y k edge and angle resolved x-ray photoelectron spectroscopy (AR-XPS). The agreement between the AXD and AR-XPS results manifests that the incorporated Y atoms homogeneously substitute Hf atoms in the crystalline lattice and form a substitutional solid solution. [ABSTRACT FROM AUTHOR]