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In 2016, the ”E-SiCure” project (standing for Engineering Silicon Carbide for Border and Port Security), funded by the NATO Science for Peace and Security Programme, was launched. The main objective is to combine theoretical, experimental and applied research towards the development of radiation-hard SiC-based detectors of special nuclear materials (SNM), and by that way, to enhance border and port security barriers. Along the plan, material modification processes are employed firstly to study, and secondly to manipulate the most severe electrically active defects (which trap or annihilate free charge carriers), by specific ion implantation and defect engineering. This paper gives an overview of the experimental activities performed at the JSI TRIGA reactor in the framework of the E-SiCure project. Initial activities were aimed at obtaining information on the radiation hardness of SiC and at the study of the energy levels of the defects induced by neutron irradiation. Several Schottky barrier diodes were fabricated out of nitrogen-doped epitaxial grown 4H-SiC, and irradiated under Cd filters in the PT irradiation channel in the JSI TRIGA reactor with varying neutron fluence levels. Neutron-induced defects in the material were studied using temperature dependent current-voltage (I-V), capacitance-voltage (C-V) and Deep-Level Transient Spectroscopy (DLTS) measurements. Our prototype neutron detectors are configured as 4H-SiC-based Schottky barrier diodes for detection of secondary charged particles (tritons, alphas and lithium atoms) which are result of thermal neutron conversion process in 10B and 6LiF layers above the surface of the 4H-SiC diodes. For field testing of neutron detectors using a broad beam of reactor neutrons we designed a standalone prototype detection system consisting of a preamplifier, shaping amplifier and a multichannel analyser operated by a laptop computer. The reverse bias for the detector diode and the power to electronic system are provided by a standalone battery-powered voltage source. The detector functionality was established through measurements using an 241Am alpha particle source. Two dedicated experimental campaigns were performed at the JSI TRIGA reactor. The registered pulse height spectra from the detectors, using both 10B and 6LiF neutron converting layers, clearly demonstrated the neutron detection abilities of the SiC detector prototypes.

We provide direct evidence that the broad Z 1 / 2 peak, commonly observed by conventional deep level transient spectroscopy in as-grown and at high concentrations in radiation damaged 4 H -SiC, has two components, namely, Z 1 and Z 2 , with activation energies for electron emissions of 0.59 and 0.67 eV, respectively. We assign these components to Z 1 / 2 = → Z 1 / 2 − + e − → Z 1 / 2 0 + 2 e − transition sequences from negative- U ordered acceptor levels of carbon vacancy (V C ) defects at hexagonal/pseudo-cubic sites, respectively. By employing short filling pulses at lower temperatures, we were able to characterize the first acceptor level of V C on both sub-lattice sites. Activation energies for electron emission of 0.48 and 0.41 eV were determined for Z 1 (− / 0) and Z 2 (− / 0) transitions, respectively. Based on trap filling kinetics and capture barrier calculations, we investigated the two-step transitions from neutral to doubly negatively charged Z 1 and Z 2. Positions of the first and second acceptor levels of V C at both lattice sites, as well as (= / 0) occupancy levels, were derived from the analysis of the emission and capture data. [ABSTRACT FROM AUTHOR]

We present results from combined Laplace-Deep Level Transient Spectroscopy (Laplace-DLTS) and density functional theory studies of the carbon vacancy (VC) in n-type 4H-SiC. Using Laplace-DLTS, we were able to distinguish two previously unresolved sub-lattice-inequivalent emissions, causing the broad Z1/2 peak at 290 K that is commonly observed by conventional DLTS in n-type 4H-SiC. This peak has two components with activation energies for electron emission of 0.58 eV and 0.65 eV. We compared these results with the acceptor levels of VC obtained by means of hybrid density functional supercell calculations. The calculations support the assignment of the Z1/2 signal to a superposition of emission peaks from double negatively charged VC defects. Taking into account the measured and calculated energy levels, the calculated relative stability of VC in hexagonal (h) and cubic (k) lattice sites, as well as the observed relative amplitude of the Laplace-DLTS peaks, we assign Z1 and Z2 to VC(h) and VC(k), respectively. We also present the preliminary results of DLTS and Laplace-DLTS measurements on deep level defects (ET1 and ET2) introduced by fast neutron irradiation and He ion implantation in 4H-SiC. The origin of ET1 and ET2 is still unclear. [ABSTRACT FROM AUTHOR]

We report on the low-energy electron and fast neutron irradiated 4H-SiC studied by deep-level transient spectroscopy (DLTS) and Laplace DLTS. Irradiations introduced two defects, E c âˆ'0.4 eV and E c âˆ'0.7 eV. They were previously assigned to carbon interstitial (Ci) labeled as EH1/3 and silicon-vacancy (V Si) labeled as S1/2, for the low-energy electron and fast neutron irradiation, respectively. This work demonstrates how Laplace DLTS can be used as a useful tool for distinguishing the EH1 and S1 defects. We show that EH1 consists of a single emission line arising from the Ci(h), while S1 has two emission lines arising from the V Si(h) and V Si(k) lattice sites. [ABSTRACT FROM AUTHOR]

We report on influence of neutron radiation on majority and minority carrier traps in n-type 4 H -SiC. Together with the increase of the well-known carbon vacancy (V C) majority carrier related trap, neutron irradiation has introduced two deep traps, labeled as EH1 and EH3 with the activation energies for electron emission estimated as 0.4 and 0.7 eV bellow the conduction band, respectively. Based on Laplace deep level transient spectroscopy (DLTS) results, we have assigned EH1 trap to silicon vacancy (V Si). Two minority carrier traps labelled as B and D-center were detected by minority transient spectroscopy (MCTS) and assigned to substitutional boron B Si and B C , respectively. Activation energies for hole emission for B and D-center are estimated as 0.27 and 0.60 eV above the valence band, respectively. We have identified two emission lines for D-center by Laplace-MCTS measurements and assigned them to B C sitting at hexagonal (− h) and cubic (− k) lattice sites. [ABSTRACT FROM AUTHOR]

We report the response of newly designed 4H-SiC Schottky barrier diode (SBD) detector prototype to alpha and gamma radiation. We studied detectors of three different active area sizes (1 × 1, 2 × 2 and 3 × 3 mm2), while all detectors had the same 4H-SiC epi-layer thickness of approximately µm, sufficient to stop alpha particles up to 6.8 MeV, which have been used in this study. The detector response to the various alpha emitters in the 3.27 MeV to 8.79 MeV energy range clearly demonstrates the excellent linear response to alpha emissions of the detectors with the increasing active area. The detector response in gamma radiation field of Co-60 and Cs-137 sources showed a linear response to air kerma and to different air kerma rates as well, up to 4.49 Gy/h. The detector response is not in saturation for the dose rates lower than 15.3 mGy/min and that its measuring range for gamma radiation with energies of 662 keV, 1.17 MeV and 1.33 MeV is from 0.5 mGy/h–917 mGy/h. No changes to electrical properties of pristine and tested 4H-SiC SBD detectors, supported by a negligible change in carbon vacancy defect density and no creation of other deep levels, demonstrates the radiation hardness of these 4H-SiC detectors. [ABSTRACT FROM AUTHOR]

Deep level defects created by implantation of light-helium and medium heavy carbon ions in the single ion regime and neutron irradiation in n-type 4H-SiC are characterized by the DLTS technique. Two deep levels with energies 0.4 eV (EH1) and 0.7 eV (EH3) below the conduction band minimum are created in either ion implanted and neutron irradiated material beside carbon vacancies (Z1/2). In our study, we analyze components of EH1 and EH3 deep levels based on their concentration depth profiles, in addition to (−3/=) and (=/−) transition levels of silicon vacancy. A higher EH3 deep level concentration compared to the EH1 deep level concentration and a slight shift of the EH3 concentration depth profile to larger depths indicate that an additional deep level contributes to the DLTS signal of the EH3 deep level, most probably the defect complex involving interstitials. We report on the introduction of metastable M-center by light/medium heavy ion implantation and neutron irradiation, previously reported in cases of proton and electron irradiation. Contribution of M-center to the EH1 concentration profile is presented. [ABSTRACT FROM AUTHOR]

We present preliminary results on minority carrier traps in as-grown n-type 4H–SiC Schottky barrier diodes. The minority carrier traps are crucial for charge trapping and recombination processes. In this study, minority carrier traps were investigated by means of minority carrier transient spectroscopy (MCTS) and high-resolution Laplace-MCTS measurements. A single minority carrier trap with its energy level position at Ev + 0.28 eV was detected and assigned to boron-related defects. [ABSTRACT FROM AUTHOR]

In the last two decades we have assisted to a rush towards finding a 3He-replacing technology capable of detecting neutrons emitted from fissile isotopes. The demand stems from applications like nuclear war-head screening or preventing illicit traffic of radiological materials. Semiconductor detectors stand among the strongest contenders, particularly those based on materials possessing a wide band gap like silicon carbide (SiC). We review the workings of SiC-based neutron detectors, along with several issues related to material properties, device fabrication and testing. The paper summarizes the experimental and theoretical work carried out within the E-SiCure project (Engineering Silicon Carbide for Border and Port Security), co-funded by the NATO Science for Peace and Security Programme. The main goal was the development of technologies to support the fabrication of radiation-hard silicon carbide detectors of special nuclear materials. Among the achievements, we have the development of successful Schottky barrier based detectors and the identification of the main carrier life-time-limiting defects in the SiC active areas, either already present in pristine devices or introduced upon exposure to radiation fields. The physical processes involved in neutron detection are described. Material properties as well as issues related to epitaxial growth and device fabrication are addressed. The presence of defects in as-grown material, as well as those introduced by ionizing radiation are reported. We finally describe several experiments carried out at the Jozef Stefan Institute TRIGA Mark II reactor (Ljubljana, Slovenia), where a set of SiC-based neutron detectors were tested, some of which being equipped with a thermal neutron converter layer. We show that despite the existence of large room for improvement, Schottky barrier diodes based on state-of-the-art 4 H -SiC are closing the gap between gas- and semiconductor-based detectors regarding their sensitivity. [ABSTRACT FROM AUTHOR]