Search

This article (Colonnade) presents a fully digital bit-serial compute-in-memory (CIM) macro. The digital CIM macro is designed for processing neural networks with reconfigurable 1–16 bit input and weight precisions based on bit-serial computing architecture and a novel all-digital bitcell structure. A column of bitcells forms a column MAC and used for computing a multiply-and-accumulate (MAC) operation. The column MACs placed in a row work as a single neuron and computes a dot-product, which is an essential building block of neural network accelerators. Several key features differentiate the proposed Colonnade architecture from the existing analog and digital implementations. First, its full-digital circuit implementation is free from process variation, noise susceptibility, and data-conversion overhead that are prevalent in prior analog CIM macros. A bitwise MAC operation in a bitcell is performed in the digital domain using a custom-designed XNOR gate and a full-adder. Second, the proposed CIM macro is fully reconfigurable in both weight and input precision from 1 to 16 bit. So far, most of the analog macros were used for processing quantized neural networks with very low input/weight precisions, mainly due to a memory density issue. Recent digital accelerators have implemented reconfigurable precisions, but they are inferior in energy efficiency due to significant off-chip memory access. We present a regular digital bitcell array that is readily reconfigured to a 1–16 bit weight-stationary bit-serial CIM macro. The macro computes parallel dot-product operations between the weights stored in memory and inputs that are serialized from LSB to MSB. Finally, the bit-serial computing scheme significantly reduces the area overhead while sacrificing latency due to bit-by-bit operation cycles. Based on the benefits of digital CIM, reconfigurability, and bit-serial computing architecture, the Colonnade can achieve both high performance and energy efficiency (i.e., both benefits of prior analog and digital accelerators) for processing neural networks. A test-chip with $128 \times 128$ SRAM-based bitcells for digital bit-serial computing is implemented using 65-nm technology and tested with 1–16 bit weight/input precisions. The measured energy efficiency is 117.3 TOPS/W at 1 bit and 2.06 TOPS/W at 16 bit. [ABSTRACT FROM AUTHOR]

In Space applications, the scaling of transistors has made integrated circuits (ICs) more susceptible to soft errors, caused by radiation strikes. When a soft error causes a bit flip in a memory device, this event is referred to as a Single Event Upset (SEU). Since SEU errors degrade system performance and eventually lead to system failure, the design of radiation-resilient memory is substantial. This paper presents a radiation resilient SRAM with a self-refresh scheme for lowering the number of errors in each row below a threshold number. The proposed self-refresh operation reads out the stored data and performs single error correction using a simple algorithm during its hold/idle mode. A 4KB SRAM test chip in 65nm CMOS technology demonstrates a significant reduction in errors with the self-refresh operation. When the SRAM test chip was exposed to accelerated proton radiation with an energy level of 39.38 MeV, the self-refresh scheme reduces the number of uncorrectable errors by $25\times $ and $8\times $ lesser for the fluence of $9.82\times 10^{11}$ particles/cm2 and $49.1\times 10^{11}$ particles/cm2, respectively. [ABSTRACT FROM AUTHOR]