Search

Improves a newly developed experimental scheme for high resolution pulsed field ionization photoelectron (PFI-PE) studies of oxygen using the high resolution monochromatized multibunch undulator synchroton of the chemical dynamics beamline at the advanced light source. Advantage of the scheme for PFI-PE measurements to have no contamination by background electrons.

Describes the development of an efficient electron time-of-flight selection scheme for high resolution pulsed field ionization photoelectron (PFI-PE) measurements using monochromatized multibunch undulator synchrotron radiation at the Advanced Light Source. PFI-PE bands; Spectral analysis; Advantage of synchrotron based PFI-PE experiments.

Focuses on high resolution threshold and pulsed field ionization photoelectron spectroscopy using multi-bunch synchrotron radiation. Resolution for threshold photoelectron measurements; Characteristics of the monochromatized vacuum ultraviolet beam at the chemical dynamics beamline; Photoionization-photoelectron apparatus.

We have demonstrated that the time-of-flight (TOF) selection method for pulsed field ionization (PFI) photoelectron detection [Jarvis et al., Rev. Sci. Instrum. 70, 2615 (1999)] can also be applied for the detection of PFI-photoions (PFI-PIs) using the two-bunch synchrotron radiation at the Advanced Light Source. By employing the supersonic beam technique to lower the translational temperature of the sample gas, we show that background prompt ions formed in direct and spontaneous autoionization processes arrive at the ion detector in a pattern similar to that of the vacuum ultraviolet light bunches. The PFI-PIs formed at dark gaps can be designed to arrive at the detector in between adjacent prompt ion peaks, enabling the gating of the PFI-PI signal with only minor contamination from background prompt ions. This experiment has revealed important considerations for the design of a general TOF selection scheme for PFI-PI detection using synchrotron radiation. © 2000 American Institute of Physics. [ABSTRACT FROM AUTHOR]