Search

The improved approach for analysis of the thin film optical spectra exhibiting the interference fringes is presented. It is shown that, based on the positions of adjacent extrema, the interference order numbers can be easily identified allowing for determination of a model-free normal dispersion of the refraction coefficient provided the film thickness is known from an independent measurement. The usefulness of the presented method is illustrated by the analysis of the reflection spectra obtained for thin films of 3, 4, 9, 10-perylene tetracarboxylic dianhydride (PTCDA) with various thicknesses determined with the atomic force microscopy (AFM). [ABSTRACT FROM AUTHOR]

The optical reflection measurements of polyvinylocarbazole (PVK) and polyazomethine (PPI) thin films have been done by means of optical profilometry (OP) exhibiting many advantages in surface and subsurface investigations. The obtained OP images clearly demonstrate that the thickness of the polymer films under investigation is not uniform over their lateral dimensions. For the PVK thin film, the fast Fourier transform (FFT) in the inverse space of the OP image is also presented along with distribution of the surface highs. [ABSTRACT FROM AUTHOR]

Copyright of Polimery is the property of Industrial Chemistry Research Institute and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

Copyright of Polimery is the property of Industrial Chemistry Research Institute and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)

Transmission and fundamental reflectivity studies, completed on amorphous Zn-P thin films, allowed us to obtain parameters describing the fundamental absorption edge, i.e., the optical pseudogap EG, Urbach energy EU and exponential edge parameter ET. All these data, together with the results of earlier transport measurements, have been utilized in developing simple models of electronic structure (distribution of electronic states) for amorphous Zn-P thin films of two compositions, i.e., Zn57P43 (near stoichiometry of Zn3P2) and Zn32P68 (near stoichiometry of ZnP2). [ABSTRACT FROM AUTHOR]

Abstract: Aromatic polyazomethine (PPI) thin film have been obtained by chemical vapor deposition (CVD) method, via polycondensation process and characterized by X-ray diffraction, AFM, FTIR and detailed UV–Vis–NIR studies. Optical transmission and fundamental reflectivity spectra of the film have been examined within the spectral range 200–2500nm. The refractive index (n), film thickness (d) and parameters of the absorption edge i.e. the optical gap (E G) and the Urbach energy (E U) have been found for the PPI film before and after iodine (I2) doping. Then the annealing effect (from 25°C every 25°C up to 225°C) on the absorption edge have been investigated during “in situ” spectral measurements. Amorphous character of the films allowed us to obtain the E G and E U values, in the way typical for amorphous semiconductors. As a result of iodine doping, the energy gap of the PPI film (2.19eV) distinctly reduces to 1.73eV, due to the polaron states and, simultaneously, the Urbach energy decreases. Thermal stability of the pure PPI film, being the typical feature of polyazomethines, was confirmed, while after iodine doping the film turned out to be thermo-stable only below 100°C; then the distinct changes of the optical gap and the Urbach energy, connected with the iodine releasing process, have been presented and discussed. [Copyright &y& Elsevier]

Abstract: Thin films of poly(1,4-phenylenemethilidynenitrilo-1,4-phenylenenitrilomethilidyne) (PPI) have been prepared by chemical vapor deposition in the horizontal geometry using gaseous argon as a transport agent. PPI thin films have been grown by polycondensation of para-phenylene diamine (PPDA) and terephtal aldehyde (TPA). Fourier Transform Infrared spectra confirm formation of PPI layers without end groups. The strongest absorption band with discernible vibronic progression has been found to be due to superposition of 2.64, 2.82 and 3.03 eV bands corresponding to interband transitions connecting electronic ground state and vibrational levels of electronic excited state. A feature seen at about 2.6 eV in the spectra of PPI films prepared at higher temperatures of PPDA and TPA sources are attributed to excitons connected with the π–π⁎ gap. Shoulder at 3.31 eV is attributed to interband transitions between delocalized states, while a peak at 4.2 eV is attributed to excitons formed by localized holes and delocalized electrons and vice versa and interband transitions connecting delocalized and localized bands, with the binding energy of about 0.8 eV. Thin films prepared at low temperatures of monomers consist of randomly distributed PPI chains weakly bound together. [Copyright &y& Elsevier]

Abstract: Optical transmission and fundamental reflectivity spectra of aromatic polyazomethine thin films, obtained by vacuum evaporation via the polycondensation process have been investigated in the wide spectral range 0.49–6.2eV. As initial monomers, terephaldehyde (TPA) and one of four different amines, i.e. paraphenylene-diamine (PPDA), 7,2-diamino-fluorene, 1,1′-biphenyl-3,3′,4,4′-tetramine and 3-amino-4-(1-naphthyldiazenyl)phenylamine (fat brown RR) have been used, respectively. Amorphous character of these films was confirmed by the results of X-ray diffraction and AFM investigations. Absorption coefficient of the films has been obtained and the edge of absorption seems to be similar to the absorption edge typical for amorphous semiconductors, what allowed to obtain the Urbach energy and E T parameter. The energy gaps of the films, following the Tauc relation, are found to change from 2.05 to 2.4eV, depending on the length of conjugated part of the polymer chain. Absorption bands above the absorption edge, observed for different polyazomethine films are connected with their chemical structure and possible electronic transitions. [Copyright &y& Elsevier]