1. Full-field hard X-ray nano-tomography at SSRF.
- Author
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Fen Tao, Jun Wang, Guohao Du, Bo Su, Ling Zhang, Chen Hou, Biao Deng, and Tiqiao Xiao
- Subjects
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SYNCHROTRON radiation , *SPATIAL resolution , *X-ray microscopy , *X-rays , *HARD X-rays - Abstract
An in-house designed transmission X-ray microscopy (TXM) instrument has been developed and commissioned at beamline BL18B of the Shanghai Synchrotron Radiation Facility (SSRF). BL18B is a hard (5-14 keV) X-ray bending-magnet beamline recently built with sub-20 nm spatial resolution in TXM. There are two kinds of resolution mode: one based on using a highresolution-based scintillator-lens-coupled camera, and the other on using a medium-resolution-based X-ray sCMOS camera. Here, a demonstration of full-field hard X-ray nano-tomography for high-Z material samples (e.g. Au particles, battery particles) and low-Z material samples (e.g. SiO2 powders) is presented for both resolution modes. Sub-50 nm to 100 nm resolution in three dimensions (3D) has been achieved. These results represent the ability of 3D non-destructive characterization with nano-scale spatial resolution for scientific applications in many research fields. [ABSTRACT FROM AUTHOR]
- Published
- 2023
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