279 results on '"Chiang, Kuo-Ning"'
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52. Characteristic study of anand and modified anand creep models for area array type WLCSP
53. Finite element mesh size effect for reliability assessment of WLCSP using different creep theories
54. A Comparison of Thermal Stress/Strain Behavior of Elliptical/Round Solder Pads
55. Characterization of Thermal Cycling Ramp Rate and Dwell Time Effects on AF (Acceleration Factor) Estimation
56. Macroscopic Mechanical Constitutive Characterization of Through-Silicon-via-Based 3-D Integration
57. Interfacial topography and properties of graphene sheets on different reconstructed silicon surfaces
58. Reliability Assessment of Packaging Solder Joints Under Different Thermal Cycle Loading Rates
59. First-principles density functional calculations of physical properties of orthorhombic Au2Al crystal
60. Microstructure Effects on Cutting Forces and Flow Stress in Ultra-Precision Machining of Polycrystalline Brittle Materials
61. Analysis of LED wire bonding process using arbitrary Lagrangian-Eulerian and equilibrium mesh smoothing algorithm
62. Determination of the junction temperature of Gallium Nitride (GaN)-based high power LED under thermal with current loading conditions
63. Thermal analysis and reliability assessment of power module under power cycling test using global- local finite element method
64. Investigation of strain rate effect on lifetime performance of wafer level CSP under different thermal cycling loading rate
65. Study on current and junction temperature stress aging effect for accelerated aging test of Light emitting diodes.
66. Investigation of thermal cycling maximum temperature effect on fatigue life of WLCSP.
67. Investigation of the Mechanical Properties of Nano-Scale Metallic Crystal Structural with Point Defects
68. Evaluation of Die Strength by Using Finite Element Method With Experiment Validation
69. Structure design and reliability assessment of double-sided with double-chip stacking packaging
70. Life Prediction of High-Cycle Fatigue in Aluminum Bonding Wires Under Power Cycling Test
71. Greetings from the New Editor-In-Chief
72. Investigating the temperature effect of reliability on integration IC 3D packaging under drop test
73. Analysis of LED wire bonding process using arbitrary Lagrangian-Eulerian and explicit time integration methods
74. Research on packaging effects of three-axis SOI MEMS accelerometer.
75. Reliability analysis of copper bump interconnection in double-sided power module.
76. Development of double-sided with double-chip stacking structure using panel level embedded wafer level packaging
77. A thermal performance assessment of panel type packaging (PTP) technology for high efficiency LED
78. Study on configuration design of interconnection in high power module.
79. Acceleration factor analysis of aging test on gallium nitride (GaN)-based high power light-emitting diode (LED).
80. Investigation of solder creep behavior on wafer level CSP under thermal cycling loading.
81. Light degradation test and design of thermal performance for high-power light-emitting diodes
82. Determination of silicon die initial crack using acoustic emission technique
83. Investigation of Stress Effect of Electromigration Behavior of Aluminum Strip
84. Determination and Verification of Silicon Die Strength Using Ball-Breaker Test
85. Thin Film Residual Stress Assessment of MEMS Microphone Using Process Modeling Technology
86. Analysis of Thermal and Luminous Performance of MR-16 LED Lighting Module
87. Strength determination of light-emitting diodes and chip structure design
88. Life prediction of high concentration photovoltaic modules subjected to thermal cycling test
89. A study on the thermal performance of a chip-in-substrate-type LED package structure
90. Thermal design and transient analysis of insulated gate bipolar transistors of power module
91. Transient thermal analysis of high-concentration photovoltaic cell module subjected to coupled thermal and power cycling test conditions
92. Determination of mechanical property of nanostructure using nano-macro equivalent mechanics method
93. Reliability Assessment of 3D Chip Stacking Package Using Metal Bonding and Through Silicon Via Technologies
94. Determining the Zero‐Force Binding Energetics of an Intercalated DNA Complex by a Single‐Molecule Approach
95. Fabrication process simulation and reliability improvement of high-brightness LEDs
96. Reliability analysis of a novel fan‐out type WLP
97. Sensitivity analysis of packaging effect of silicon-based piezoresistive pressure sensor
98. Interfacial Fracture Analysis of CMOS Cu/Low-$k$ BEOL Interconnect in Advanced Packaging Structures
99. Analysis of Thermal Performance of High Power Light Emitting Diodes Package
100. Validation and reliability assessment of board level drop test of chip-scale-packaging
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