72 results on '"Chien, Wei-Ting Kary"'
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52. An enhancement for single sampling plan method
53. A study on the statistical comparison methods for engineering applications
54. Gate oxide reliability improvement for UMOS technology.
55. An investigation on the high temperature dependence of the HCI on NMOSFET transistor.
56. Sample preparation DOE for the die pull test.
57. A study on the relationship between pad surface fluorine concentration and the formation of pad corrosion defect
58. Early failure model analysis and improvement of the upstream electromigration in 45nm Cu low-k interconnects
59. Editorial: Reduce Time-to-Market by Considering Reliability Tradeoffs
60. Impact of FIB parameters on TEM sample preparation for low-k process
61. A Practical, Innovative Method for Electro-Static Discharge Data Analysis
62. Failure rate calculation: Extending JESD74/JESD74A to any sample size
63. USING REVERSE ARRANGEMENT TEST TO DETECT NON-MONOTONIC TRENDS FOR SEMICONDUCTOR MANUFACTURING AND RELIABILITY TESTS
64. A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing
65. A study on the relationship between pad surface fluorine concentration and the formation of pad corrosion defect.
66. A sample preparation technique to reveal the implant profile by TEM for IC failure analysis.
67. PERFORMING THE SOFT-ERROR RATE (SER) ON A TDBI CHAMBER
68. Sample preparation and improvement for Die Pull test.
69. A nonparametric Bayes approach to decide system burn-in time
70. OPTIMAL BURN-IN SIMULATION ON HIGHLY INTEGRATED CIRCUIT SYSTEMS
71. Extensions of the kaplan-meier estimator
72. A Study On The Dielectric Intrinsic Breakdown Specification
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