443 results on '"Zhao, X.J."'
Search Results
202. A study of crack propagation in Pb-free solder joints under drop impact.
- Author
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Caers, J.F.J., Wong, E.H., Seah, S.K.W., Zhao, X.J., Selvanayagam, C.S., van Driel, W.D., Owens, N., Leoni, M., Tan, L.C., Eu, P.L., Yi-Shao Lai, and Chang-Lin Yeh
- Published
- 2008
- Full Text
- View/download PDF
203. A Study of Component-Level Measure of Board-Level Drop Impact Reliability by Ball Impact Test.
- Author
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Yi-Shao Lai, Wong, E.H., Rajoo, R., Seah, S.K.W., Selvanayagam, C.S., van Driel, W.D., Caers, J.F.J.M., Zhao, X.J., Owens, N., Tan, L.C., Leoni, M., and Eu, P.L.
- Published
- 2008
- Full Text
- View/download PDF
204. A Component Level Test Method for Evaluating the Resistance of Pb-free BGA Solder Joints to Brittle Fracture under Shock Impact.
- Author
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Zhao, X.J., Caers, J.F.J.M., de Vries, J.W.C., Wong, E.H., and Rajoo, R.
- Published
- 2007
- Full Text
- View/download PDF
205. To simulate the formation of TSSOP solder joint with SAC solder and assess on the effects of the stencil design and the misalignment on the joint shape.
- Author
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Zhao, X.J. and Caers, J.F.J.M.
- Published
- 2004
- Full Text
- View/download PDF
206. Prediction of moisture induced failures in flip chip on flex interconnections with non-conductive adhesives.
- Author
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Caers, J.F.J.M., Zhao, X.J., Wong, E.H., Ong, C.K., Wu, Z.X., and Ranjan, R.
- Published
- 2003
- Full Text
- View/download PDF
207. Assembly process modeling for flip chip on flex interconnections with non-conductive adhesive.
- Author
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Xiaowu Zhang, Wong, E.H., Rajoo, R., Iyer, M.K., Caers, J.F.J.M., and Zhao, X.J.
- Published
- 2003
- Full Text
- View/download PDF
208. Influence of tilting of SrTiO3 substrates on the morphology and superconductivity of YBa2Cu3O7−δ thin films
- Author
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Hu, Wen-fei, primary, Wang, T.S, additional, Shi, D.X, additional, Zhao, X.J, additional, Peng, W, additional, Lei, C, additional, Tao, H.J, additional, Chen, Y.F, additional, and Li, Lin, additional
- Published
- 2001
- Full Text
- View/download PDF
209. An FPGA controlled WDM buffer memory
- Author
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Wu, L., primary, Chao, H.J., additional, Zhao, X.J., additional, Zhao, Y., additional, Chai, Y., additional, Zhang, J.P., additional, and Choa, F.S., additional
- Published
- 2000
- Full Text
- View/download PDF
210. Observation of the decay [formula omitted]
- Author
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Ablikim, M., Bai, J.Z., Ban, Y., Bian, J.G., Cai, X., Chang, J.F., Chen, H.F., Chen, H.S., Chen, H.X., Chen, J.C., Chen, Jin, Chen, Jun, Chen, M.L., Chen, Y.B., Chi, S.P., Chu, Y.P., Cui, X.Z., Dai, H.L., Dai, Y.S., Deng, Z.Y., Dong, L.Y., Du, S.X., Du, Z.Z., Fang, J., Fang, S.S., Fu, C.D., Fu, H.Y., Gao, C.S., Gao, Y.N., Gong, M.Y., Gong, W.X., Gu, S.D., Guo, Y.N., Guo, Y.Q., Guo, Z.J., Harris, F.A., He, K.L., He, M., He, X., Heng, Y.K., Hu, H.M., Hu, T., Huang, G.S., Huang, L., Huang, X.P., Ji, X.B., Jia, Q.Y., Jiang, C.H., Jiang, X.S., Jin, D.P., Jin, S., Jin, Y., Lai, Y.F., Li, F., Li, G., Li, H.H., Li, J., Li, J.C., Li, Q.J., Li, R.B., Li, R.Y., Li, S.M., Li, W.G., Li, X.L., Li, X.Q., Li, X.S., Liang, Y.F., Liao, H.B., Liu, C.X., Liu, F., Liu, Fang, Liu, H.M., Liu, J.B., Liu, J.P., Liu, R.G., Liu, Z.A., Liu, Z.X., Lu, F., Lu, G.R., Lu, J.G., Luo, C.L., Luo, X.L., Ma, F.C., Ma, J.M., Ma, L.L., Ma, Q.M., Ma, X.Y., Mao, Z.P., Mo, X.H., Nie, J., Nie, Z.D., Olsen, S.L., Peng, H.P., Qi, N.D., Qian, C.D., Qin, H., Qiu, J.F., Ren, Z.Y., Rong, G., Shan, L.Y., Shang, L., Shen, D.L., Shen, X.Y., Sheng, H.Y., Shi, F., Shi, X., Sun, H.S., Sun, S.S., Sun, Y.Z., Sun, Z.J., Tang, X., Tao, N., Tian, Y.R., Tong, G.L., Varner, G.S., Wang, D.Y., Wang, J.Z., Wang, K., Wang, L., Wang, L.S., Wang, M., Wang, P., Wang, P.L., Wang, S.Z., Wang, W.F., Wang, Y.F., Wang, Zhe, Wang, Z., Wang, Zheng, Wang, Z.Y., Wei, C.L., Wei, D.H., Wu, N., Wu, Y.M., Xia, X.M., Xie, X.X., Xin, B., Xu, G.F., Xu, H., Xu, Y., Xue, S.T., Yan, M.L., Yang, F., Yang, H.X., Yang, J., Yang, S.D., Yang, Y.X., Ye, M., Ye, M.H., Ye, Y.X., Yi, L.H., Yi, Z.Y., Yu, C.S., Yu, G.W., Yuan, C.Z., Yuan, J.M., Yuan, Y., Yue, Q., Zang, S.L., Zeng, Yu, Zeng, Y., Zhang, B.X., Zhang, B.Y., Zhang, C.C., Zhang, D.H., Zhang, H.Y., Zhang, J., Zhang, J.Y., Zhang, J.W., Zhang, L.S., Zhang, Q.J., Zhang, S.Q., Zhang, X.M., Zhang, X.Y., Zhang, Y.J., Zhang, Y.Y., Zhang, Yiyun, Zhang, Z.P., Zhang, Z.Q., Zhao, D.X., Zhao, J.B., Zhao, J.W., Zhao, M.G., Zhao, P.P., Zhao, W.R., Zhao, X.J., Zhao, Y.B., Zhao, Z.G., Zheng, H.Q., Zheng, J.P., Zheng, L.S., Zheng, Z.P., Zhong, X.C., Zhou, B.Q., Zhou, G.M., Zhou, L., Zhou, N.F., Zhu, K.J., Zhu, Q.M., Zhu, Y.C., Zhu, Y.S., Zhu, Yingchun, Zhu, Z.A., Zhuang, B.A., and Zou, B.S.
- Published
- 2005
- Full Text
- View/download PDF
211. A novel bidirectional add/drop module using waveguide grating routers and wavelength channel matched fiber gratings
- Author
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Zhao, Y., primary, Zhao, X.J., additional, Chen, J.H., additional, and Choa, F.S., additional
- Published
- 1999
- Full Text
- View/download PDF
212. Measurements of [formula omitted] decays into [formula omitted] and [formula omitted]
- Author
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Ablikim, M., Bai, J.Z., Ban, Y., Bian, J.G., Cai, X., Chang, J.F., Chen, H.F., Chen, H.S., Chen, H.X., Chen, J.C., Chen, Jin, Chen, Jun, Chen, M.L., Chen, Y.B., Chi, S.P., Chu, Y.P., Cui, X.Z., Dai, H.L., Dai, Y.S., Deng, Z.Y., Dong, L.Y., Dong, Q.F., Du, S.X., Du, Z.Z., Fang, J., Fang, S.S., Fu, C.D., Fu, H.Y., Gao, C.S., Gao, Y.N., Gong, M.Y., Gong, W.X., Gu, S.D., Guo, Y.N., Guo, Y.Q., Guo, Z.J., Harris, F.A., He, K.L., He, M., He, X., Heng, Y.K., Hu, H.M., Hu, T., Huang, G.S., Huang, X.P., Huang, X.T., Ji, X.B., Jiang, C.H., Jiang, X.S., Jin, D.P., Jin, S., Jin, Y., Jin, Yi, Lai, Y.F., Li, F., Li, G., Li, H.H., Li, J., Li, J.C., Li, Q.J., Li, R.Y., Li, S.M., Li, W.D., Li, W.G., Li, X.L., Li, X.Q., Li, Y.L., Liang, Y.F., Liao, H.B., Liu, C.X., Liu, F., Liu, Fang, Liu, H.H., Liu, H.M., Liu, J., Liu, J.B., Liu, J.P., Liu, R.G., Liu, Z.A., Liu, Z.X., Lu, F., Lu, G.R., Lu, H.J., Lu, J.G., Luo, C.L., Luo, L.X., Luo, X.L., Ma, F.C., Ma, H.L., Ma, J.M., Ma, L.L., Ma, Q.M., Ma, X.B., Ma, X.Y., Mao, Z.P., Mo, X.H., Nie, J., Nie, Z.D., Olsen, S.L., Peng, H.P., Qi, N.D., Qian, C.D., Qin, H., Qiu, J.F., Ren, Z.Y., Rong, G., Shan, L.Y., Shang, L., Shen, D.L., Shen, X.Y., Sheng, H.Y., Shi, F., Shi, X., Sun, H.S., Sun, J.F., Sun, S.S., Sun, Y.Z., Sun, Z.J., Tang, X., Tao, N., Tian, Y.R., Tong, G.L., Varner, G.S., Wang, D.Y., Wang, J.Z., Wang, K., Wang, L., Wang, L.S., Wang, M., Wang, P., Wang, P.L., Wang, S.Z., Wang, W.F., Wang, Y.F., Wang, Z., Wang, Z.Y., Wang, Zhe, Wang, Zheng, Wei, C.L., Wei, D.H., Wu, N., Wu, Y.M., Xia, X.M., Xie, X.X., Xin, B., Xu, G.F., Xu, H., Xue, S.T., Yan, M.L., Yang, F., Yang, H.X., Yang, J., Yang, Y.X., Ye, M., Ye, M.H., Ye, Y.X., Yi, L.H., Yi, Z.Y., Yu, C.S., Yu, G.W., Yuan, C.Z., Yuan, J.M., Yuan, Y., Zang, S.L., Zeng, Y., Zeng, Yu, Zhang, B.X., Zhang, B.Y., Zhang, C.C., Zhang, D.H., Zhang, H.Y., Zhang, J., Zhang, J.W., Zhang, J.Y., Zhang, Q.J., Zhang, S.Q., Zhang, X.M., Zhang, X.Y., Zhang, Y.Y., Zhang, Yiyun, Zhang, Z.P., Zhang, Z.Q., Zhao, D.X., Zhao, J.B., Zhao, J.W., Zhao, M.G., Zhao, P.P., Zhao, W.R., Zhao, X.J., Zhao, Y.B., Zhao, Z.G., Zheng, H.Q., Zheng, J.P., Zheng, L.S., Zheng, Z.P., Zhong, X.C., Zhou, B.Q., Zhou, G.M., Zhou, L., Zhou, N.F., Zhu, K.J., Zhu, Q.M., Zhu, Y.C., Zhu, Y.S., Zhu, Yingchun, Zhu, Z.A., Zhuang, B.A., Zhuang, X.A., and Zou, B.S.
- Published
- 2005
- Full Text
- View/download PDF
213. Resonances in [formula omitted] and [formula omitted]
- Author
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Ablikim, M., Bai, J.Z., Ban, Y., Bian, J.G., Bugg, D.V., Cai, X., Chang, J.F., Chen, H.F., Chen, H.S., Chen, H.X., Chen, J.C., Chen, Jin, Chen, Jun, Chen, M.L., Chen, Y.B., Chi, S.P., Chu, Y.P., Cui, X.Z., Dai, H.L., Dai, Y.S., Deng, Z.Y., Dong, L.Y., Dong, Q.F., Du, S.X., Du, Z.Z., Fang, J., Fang, S.S., Fu, C.D., Fu, H.Y., Gao, C.S., Gao, Y.N., Gong, M.Y., Gong, W.X., Gu, S.D., Guo, Y.N., Guo, Y.Q., Guo, Z.J., Harris, F.A., He, K.L., He, M., He, X., Heng, Y.K., Hu, H.M., Hu, T., Huang, G.S., Huang, X.P., Huang, X.T., Ji, X.B., Jiang, C.H., Jiang, X.S., Jin, D.P., Jin, S., Jin, Y., Jin, Yi, Lai, Y.F., Li, F., Li, G., Li, H.H., Li, J., Li, J.C., Li, Q.J., Li, R.Y., Li, S.M., Li, W.D., Li, W.G., Li, X.L., Li, X.Q., Li, Y.L., Liang, Y.F., Liao, H.B., Liu, C.X., Liu, F., Liu, Fang, Liu, H.H., Liu, H.M., Liu, J., Liu, J.B., Liu, J.P., Liu, R.G., Liu, Z.A., Liu, Z.X., Lu, F., Lu, G.R., Lu, H.J., Lu, J.G., Luo, C.L., Luo, L.X., Luo, X.L., Ma, F.C., Ma, H.L., Ma, J.M., Ma, L.L., Ma, Q.M., Ma, X.B., Ma, X.Y., Mao, Z.P., Mo, X.H., Nie, J., Nie, Z.D., Olsen, S.L., Peng, H.P., Qi, N.D., Qian, C.D., Qin, H., Qiu, J.F., Ren, Z.Y., Rong, G., Shan, L.Y., Shang, L., Shen, D.L., Shen, X.Y., Sheng, H.Y., Shi, F., Shi, X., Sun, H.S., Sun, J.F., Sun, S.S., Sun, Y.Z., Sun, Z.J., Tang, X., Tao, N., Tian, Y.R., Tong, G.L., Varner, G.S., Wang, D.Y., Wang, J.Z., Wang, K., Wang, L., Wang, L.S., Wang, M., Wang, P., Wang, P.L., Wang, S.Z., Wang, W.F., Wang, Y.F., Wang, Z., Wang, Z.Y., Wang, Zhe, Wang, Zheng, Wei, C.L., Wei, D.H., Wu, Y.M., Xia, X.M., Xie, X.X., Xin, B., Xu, G.F., Xu, H., Xue, S.T., Yan, M.L., Yang, F., Yang, H.X., Yang, J., Yang, Y.X., Ye, M., Ye, M.H., Ye, Y.X., Yi, L.H., Yi, Z.Y., Yu, C.S., Yu, G.W., Yuan, C.Z., Yuan, J.M., Yuan, Y., Zang, S.L., Zeng, Y., Zeng, Yu, Zhang, B.X., Zhang, B.Y., Zhang, C.C., Zhang, D.H., Zhang, H.Y., Zhang, J., Zhang, J.W., Zhang, J.Y., Zhang, Q.J., Zhang, S.Q., Zhang, X.M., Zhang, X.Y., Zhang, Y.Y., Zhang, Yiyun, Zhang, Z.P., Zhang, Z.Q., Zhao, D.X., Zhao, J.B., Zhao, J.W., Zhao, M.G., Zhao, P.P., Zhao, W.R., Zhao, X.J., Zhao, Y.B., Zhao, Z.G., Zheng, H.Q., Zheng, J.P., Zheng, L.S., Zheng, Z.P., Zhong, X.C., Zhou, B.Q., Zhou, G.M., Zhou, L., Zhou, N.F., Zhu, K.J., Zhu, Q.M., Zhu, Y.C., Zhu, Y.S., Zhu, Yingchun, Zhu, Z.A., Zhuang, B.A., Zhuang, X.A., and Zou, B.S.
- Published
- 2005
- Full Text
- View/download PDF
214. Electroluminescent devices based on monohexadecyl phthalate terbium
- Author
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Li, B., primary, Ma, D.G., additional, Zhang, H.J., additional, Zhao, X.J., additional, and Ni, J.Z., additional
- Published
- 1998
- Full Text
- View/download PDF
215. Study of [formula omitted]
- Author
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Ablikim, M., Bai, J.Z., Ban, Y., Bian, J.G., Bugg, D.V., Cai, X., Chang, J.F., Chen, H.F., Chen, H.S., Chen, H.X., Chen, J.C., Chen, Jin, Chen, Jun, Chen, M.L., Chen, Y.B., Chi, S.P., Chu, Y.P., Cui, X.Z., Dai, H.L., Dai, Y.S., Deng, Z.Y., Dong, L.Y., Dong, Q.F., Du, S.X., Du, Z.Z., Fang, J., Fang, S.S., Fu, C.D., Fu, H.Y., Gao, C.S., Gao, Y.N., Gong, M.Y., Gong, W.X., Gu, S.D., Guo, Y.N., Guo, Y.Q., Guo, Z.J., Harris, F.A., He, K.L., He, M., He, X., Heng, Y.K., Hu, H.M., Hu, T., Huang, G.S., Huang, X.P., Huang, X.T., Ji, X.B., Jiang, C.H., Jiang, X.S., Jin, D.P., Jin, S., Jin, Y., Jin, Yi, Lai, Y.F., Li, F., Li, G., Li, H.H., Li, J., Li, J.C., Li, Q.J., Li, R.Y., Li, S.M., Li, W.D., Li, W.G., Li, X.L., Li, X.Q., Li, Y.L., Liang, Y.F., Liao, H.B., Liu, C.X., Liu, F., Liu, Fang, Liu, H.H., Liu, H.M., Liu, J., Liu, J.B., Liu, J.P., Liu, R.G., Liu, Z.A., Liu, Z.X., Lu, F., Lu, G.R., Lu, H.J., Lu, J.G., Luo, C.L., Luo, L.X., Luo, X.L., Ma, F.C., Ma, H.L., Ma, J.M., Ma, L.L., Ma, Q.M., Ma, X.B., Ma, X.Y., Mao, Z.P., Mo, X.H., Nie, J., Nie, Z.D., Olsen, S.L., Peng, H.P., Qi, N.D., Qian, C.D., Qin, H., Qiu, J.F., Ren, Z.Y., Rong, G., Shan, L.Y., Shang, L., Shen, D.L., Shen, X.Y., Sheng, H.Y., Shi, F., Shi, X., Sun, H.S., Sun, J.F., Sun, S.S., Sun, Y.Z., Sun, Z.J., Tang, X., Tao, N., Tian, Y.R., Tong, G.L., Varner, G.S., Wang, D.Y., Wang, J.Z., Wang, K., Wang, L., Wang, L.S., Wang, M., Wang, P., Wang, P.L., Wang, S.Z., Wang, W.F., Wang, Y.F., Wang, Z., Wang, Z.Y., Wang, Zhe, Wang, Zheng, Wei, C.L., Wei, D.H., Wu, N., Wu, Y.M., Xia, X.M., Xie, X.X., Xin, B., Xu, G.F., Xu, H., Xue, S.T., Yan, M.L., Yang, F., Yang, H.X., Yang, J., Yang, Y.X., Ye, M., Ye, M.H., Ye, Y.X., Yi, L.H., Yi, Z.Y., Yu, C.S., Yu, G.W., Yuan, C.Z., Yuan, J.M., Yuan, Y., Zang, S.L., Zeng, Y., Zeng, Yu, Zhang, B.X., Zhang, B.Y., Zhang, C.C., Zhang, D.H., Zhang, H.Y., Zhang, J., Zhang, J.W., Zhang, J.Y., Zhang, Q.J., Zhang, S.Q., Zhang, X.M., Zhang, X.Y., Zhang, Y.Y., Zhang, Yiyun, Zhang, Z.P., Zhang, Z.Q., Zhao, D.X., Zhao, J.B., Zhao, J.W., Zhao, M.G., Zhao, P.P., Zhao, W.R., Zhao, X.J., Zhao, Y.B., Zhao, Z.G., Zheng, H.Q., Zheng, J.P., Zheng, L.S., Zheng, Z.P., Zhong, X.C., Zhou, B.Q., Zhou, G.M., Zhou, L., Zhou, N.F., Zhu, K.J., Zhu, Q.M., Zhu, Y.C., Zhu, Y.S., Zhu, Yingchun, Zhu, Z.A., Zhuang, B.A., Zhuang, X.A., and Zou, B.S.
- Published
- 2004
- Full Text
- View/download PDF
216. Search for the lepton flavor violation processes [formula omitted]μτ and eτ
- Author
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Ablikim, M., Bai, J.Z., Ban, Y., Bian, J.G., Cai, X., Chang, J.F., Chen, H.F., Chen, H.S., Chen, H.X., Chen, J.C., Chen, Jin, Chen, Jun, Chen, M.L., Chen, Y.B., Chi, S.P., Chu, Y.P., Cui, X.Z., Dai, H.L., Dai, Y.S., Deng, Z.Y., Dong, L.Y., Du, S.X., Du, Z.Z., Fang, J., Fang, S.S., Fu, C.D., Fu, H.Y., Gao, C.S., Gao, Y.N., Gong, M.Y., Gong, W.X., Gu, S.D., Guo, Y.N., Guo, Y.Q., Guo, Z.J., Harris, F.A., He, K.L., He, M., He, X., Heng, Y.K., Hu, H.M., Hu, T., Huang, G.S., Huang, L., Huang, X.P., Ji, X.B., Jia, Q.Y., Jiang, C.H., Jiang, X.S., Jin, D.P., Jin, S., Jin, Y., Lai, Y.F., Li, F., Li, G., Li, H.H., Li, J., Li, J.C., Li, Q.J., Li, R.B., Li, R.Y., Li, S.M., Li, W.G., Li, X.L., Li, X.Q., Li, X.S., Liang, Y.F., Liao, H.B., Liu, C.X., Liu, F., Liu, Fang, Liu, H.M., Liu, J.B., Liu, J.P., Liu, R.G., Liu, Z.A., Liu, Z.X., Lu, F., Lu, G.R., Lu, J.G., Luo, C.L., Luo, X.L., Ma, F.C., Ma, J.M., Ma, L.L., Ma, Q.M., Ma, X.Y., Mao, Z.P., Mo, X.H., Nie, J., Nie, Z.D., Olsen, S.L., Peng, H.P., Qi, N.D., Qian, C.D., Qin, H., Qiu, J.F., Ren, Z.Y., Rong, G., Shan, L.Y., Shang, L., Shen, D.L., Shen, X.Y., Sheng, H.Y., Shi, F., Shi, X., Sun, H.S., Sun, S.S., Sun, Y.Z., Sun, Z.J., Tang, X., Tao, N., Tian, Y.R., Tong, G.L., Varner, G.S., Wang, D.Y., Wang, J.Z., Wang, K., Wang, L., Wang, L.S., Wang, M., Wang, P., Wang, P.L., Wang, S.Z., Wang, W.F., Wang, Y.F., Wang, Zhe, Wang, Z., Wang, Zheng, Wang, Z.Y., Wei, C.L., Wei, D.H., Wu, N., Wu, Y.M., Xia, X.M., Xie, X.X., Xin, B., Xu, G.F., Xu, H., Xu, Y., Xue, S.T., Yan, M.L., Yang, F., Yang, H.X., Yang, J., Yang, S.D., Yang, Y.X., Ye, M., Ye, M.H., Ye, Y.X., Yi, L.H., Yi, Z.Y., Yu, C.S., Yu, G.W., Yuan, C.Z., Yuan, J.M., Yuan, Y., Yue, Q., Zang, S.L., Zeng, Yu, Zeng, Y., Zhang, B.X., Zhang, B.Y., Zhang, C.C., Zhang, D.H., Zhang, H.Y., Zhang, J., Zhang, J.Y., Zhang, J.W., Zhang, L.S., Zhang, Q.J., Zhang, S.Q., Zhang, X.M., Zhang, X.Y., Zhang, Y.J., Zhang, Y.Y., Zhang, Yiyun, Zhang, Z.P., Zhang, Z.Q., Zhao, D.X., Zhao, J.B., Zhao, J.W., Zhao, M.G., Zhao, P.P., Zhao, W.R., Zhao, X.J., Zhao, Y.B., Zhao, Z.G., Zheng, H.Q., Zheng, J.P., Zheng, L.S., Zheng, Z.P., Zhong, X.C., Zhou, B.Q., Zhou, G.M., Zhou, L., Zhou, N.F., Zhu, K.J., Zhu, Q.M., Zhu, Y.C., Zhu, Y.S., Zhu, Yingchun, Zhu, Z.A., Zhuang, B.A., and Zou, B.S.
- Published
- 2004
- Full Text
- View/download PDF
217. The σ pole in [formula omitted]
- Author
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Ablikim, M., Bai, J.Z., Ban, Y., Bian, J.G., Bugg, D.V., Cai, X., Chang, J.F., Chen, H.F., Chen, H.S., Chen, H.X., Chen, J.C., Chen, Jin, Chen, Jun, Chen, M.L., Chen, Y.B., Chi, S.P., Chu, Y.P., Cui, X.Z., Dai, H.L., Dai, Y.S., Deng, Z.Y., Dong, L.Y., Du, S.X., Du, Z.Z., Fang, J., Fang, S.S., Fu, C.D., Fu, H.Y., Gao, C.S., Gao, Y.N., Gong, M.Y., Gong, W.X., Gu, S.D., Guo, Y.N., Guo, Y.Q., Guo, Z.J., Harris, F.A., He, K.L., He, M., He, X., Heng, Y.K., Hu, H.M., Hu, T., Huang, G.S., Huang, L., Huang, X.P., Ji, X.B., Jia, Q.Y., Jiang, C.H., Jiang, X.S., Jin, D.P., Jin, S., Jin, Y., Lai, Y.F., Li, F., Li, G., Li, H.H., Li, J., Li, J.C., Li, Q.J., Li, R.B., Li, R.Y., Li, S.M., Li, W.G., Li, X.L., Li, X.Q., Li, X.S., Liang, Y.F., Liao, H.B., Liu, C.X., Liu, F., Liu, Fang, Liu, H.M., Liu, J.B., Liu, J.P., Liu, R.G., Liu, Z.A., Liu, Z.X., Lu, F., Lu, G.R., Lu, J.G., Luo, C.L., Luo, X.L., Ma, F.C., Ma, J.M., Ma, L.L., Ma, Q.M., Ma, X.Y., Mao, Z.P., Mo, X.H., Nie, J., Nie, Z.D., Olsen, S.L., Peng, H.P., Qi, N.D., Qian, C.D., Qin, H., Ruan, T.N., Qiu, J.F., Ren, Z.Y., Rong, G., Shan, L.Y., Shang, L., Shen, D.L., Shen, X.Y., Sheng, H.Y., Shi, F., Shi, X., Sun, H.S., Sun, S.S., Sun, Y.Z., Sun, Z.J., Tang, X., Tao, N., Tian, Y.R., Tong, G.L., Varner, G.S., Wang, D.Y., Wang, J.Z., Wang, K., Wang, L., Wang, L.S., Wang, M., Wang, P., Wang, P.L., Wang, S.Z., Wang, W.F., Wang, Y.F., Wang, Zhe, Wang, Z., Wang, Zheng, Wang, Z.Y., Wei, C.L., Wei, D.H., Wu, N., Wu, Y.M., Xia, X.M., Xie, X.X., Xin, B., Xu, G.F., Xu, H., Xu, Y., Xue, S.T., Yan, M.L., Yang, F., Yang, H.X., Yang, J., Yang, S.D., Yang, Y.X., Ye, M., Ye, M.H., Ye, Y.X., Yi, L.H., Yi, Z.Y., Yu, C.S., Yu, G.W., Yuan, C.Z., Yuan, J.M., Yuan, Y., Yue, Q., Zang, S.L., Zeng, Yu, Zeng, Y., Zhang, B.X., Zhang, B.Y., Zhang, C.C., Zhang, D.H., Zhang, H.Y., Zhang, J., Zhang, J.Y., Zhang, J.W., Zhang, L.S., Zhang, Q.J., Zhang, S.Q., Zhang, X.M., Zhang, X.Y., Zhang, Y.J., Zhang, Y.Y., Zhang, Yiyun, Zhang, Z.P., Zhang, Z.Q., Zhao, D.X., Zhao, J.B., Zhao, J.W., Zhao, M.G., Zhao, P.P., Zhao, W.R., Zhao, X.J., Zhao, Y.B., Zhao, Z.G., Zheng, H.Q., Zheng, J.P., Zheng, L.S., Zheng, Z.P., Zhong, X.C., Zhou, B.Q., Zhou, G.M., Zhou, L., Zhou, N.F., Zhu, K.J., Zhu, Q.M., Zhu, Y.C., Zhu, Y.S., Zhu, Yingchun, Zhu, Z.A., Zhuang, B.A., and Zou, B.S.
- Published
- 2004
- Full Text
- View/download PDF
218. Measurements of [formula omitted]
- Author
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Bai, J.Z., Ban, Y., Bian, J.G., Cai, X., Chang, J.F., Chen, H.F., Chen, H.S., Chen, H.X., Chen, J., Chen, J.C., Chen, Jun, Chen, M.L., Chen, Y.B., Chi, S.P., Chu, Y.P., Cui, X.Z., Dai, H.L., Dai, Y.S., Deng, Z.Y., Dong, L.Y., Du, S.X., Du, Z.Z., Fang, J., Fang, S.S., Fu, C.D., Fu, H.Y., Fu, L.P., Gao, C.S., Gao, M.L., Gao, Y.N., Gong, M.Y., Gong, W.X., Gu, S.D., Guo, Y.N., Guo, Y.Q., Guo, Z.J., Han, S.W., Harris, F.A., He, J., He, K.L., He, M., He, X., Heng, Y.K., Hu, H.M., Hu, T., Huang, G.S., Huang, L., Huang, X.P., Ji, X.B., Jia, Q.Y., Jiang, C.H., Jiang, X.S., Jin, D.P., Jin, S., Jin, Y., Lai, Y.F., Li, F., Li, G., Li, H.H., Li, J., Li, J.C., Li, Q.J., Li, R.B., Li, R.Y., Li, S.M., Li, W., Li, W.G., Li, X.L., Li, X.Q., Li, X.S., Liang, Y.F., Liao, H.B., Liu, C.X., Liu, Fang, Liu, F., Liu, H.M., Liu, J.B., Liu, J.P., Liu, R.G., Liu, Y., Liu, Z.A., Liu, Z.X., Lu, G.R., Lu, F., Lu, J.G., Luo, C.L., Luo, X.L., Ma, F.C., Ma, J.M., Ma, L.L., Ma, X.Y., Mao, Z.P., Meng, X.C., Mo, X.H., Nie, J., Nie, Z.D., Olsen, S.L., Peng, H.P., Qi, N.D., Qian, C.D., Qin, H., Qiu, J.F., Ren, Z.Y., Rong, G., Shan, L.Y., Shang, L., Shen, D.L., Shen, X.Y., Sheng, H.Y., Shi, F., Shi, X., Song, L.W., Sun, H.S., Sun, S.S., Sun, Y.Z., Sun, Z.J., Tang, X., Tao, N., Tian, Y.R., Tong, G.L., Varner, G.S., Wang, D.Y., Wang, J.Z., Wang, L., Wang, L.S., Wang, M., Wang, Meng, Wang, P., Wang, P.L., Wang, S.Z., Wang, W.F., Wang, Y.F., Wang, Zhe, Wang, Z., Wang, Zheng, Wang, Z.Y., Wei, C.L., Wu, N., Wu, Y.M., Xia, X.M., Xie, X.X., Xin, B., Xu, G.F., Xu, H., Xu, Y., Xue, S.T., Yan, M.L., Yan, W.B., Yang, F., Yang, H.X., Yang, J., Yang, S.D., Yang, Y.X., Yi, L.H., Yi, Z.Y., Ye, M., Ye, M.H., Ye, Y.X., Yu, C.S., Yu, G.W., Yuan, C.Z., Yuan, J.M., Yuan, Y., Yue, Q., Zang, S.L., Zeng, Y., Zhang, B.X., Zhang, B.Y., Zhang, C.C., Zhang, D.H., Zhang, H.Y., Zhang, J., Zhang, J.M., Zhang, J.Y., Zhang, J.W., Zhang, L.S., Zhang, Q.J., Zhang, S.Q., Zhang, X.M., Zhang, X.Y., Zhang, Yiyun, Zhang, Y.J., Zhang, Y.Y., Zhang, Z.P., Zhang, Z.Q., Zhao, D.X., Zhao, J.B., Zhao, J.W., Zhao, P.P., Zhao, W.R., Zhao, X.J., Zhao, Y.B., Zhao, Z.G., Zheng, H.Q., Zheng, J.P., Zheng, L.S., Zheng, Z.P., Zhong, X.C., Zhou, B.Q., Zhou, G.M., Zhou, L., Zhou, N.F., Zhu, K.J., Zhu, Q.M., Zhu, Yingchun, Zhu, Y.C., Zhu, Y.S., Zhu, Z.A., Zhuang, B.A., and Zou, B.S.
- Published
- 2004
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- View/download PDF
219. Large and ultrafast third-order optical nonlinearity of GeS 2–Ga 2S 3–CdS chalcogenide glass
- Author
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Wang, X.F., Wang, Z.W., Yu, J.G., Liu, C.L., Zhao, X.J., and Gong, Q.H.
- Published
- 2004
- Full Text
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220. Radiation hardness tests of scintillating tile/WLS fiber calorimeter modules
- Author
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Han, S.W., primary, Hu, L.D., additional, Liu, N.Z., additional, Mao, H.S., additional, Shi, H.Z., additional, Tan, Y.P., additional, Wang, G.L., additional, Zhang, C.D., additional, Zhang, G., additional, Zhang, L.S., additional, Zhang, Z.X., additional, Zhao, X.J., additional, Zheng, L.S., additional, Zhong, X.C., additional, Zhou, Y.S., additional, Byon-Wagner, A., additional, Green, D., additional, Para, A., additional, Johnson, K., additional, and Barnes, V., additional
- Published
- 1995
- Full Text
- View/download PDF
221. Cytochrome c Oxidase Catalysis of the Reduction of Nitric Oxide to Nitrous Oxide
- Author
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Zhao, X.J., primary, Sampath, V., additional, and Caughey, W.S., additional
- Published
- 1995
- Full Text
- View/download PDF
222. Infrared Characterization of Nitric Oxide Bonding to Bovine Heart Cytochrome c Oxidase and Myoglobin
- Author
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Zhao, X.J., primary, Sampath, V., additional, and Caughey, W.S., additional
- Published
- 1994
- Full Text
- View/download PDF
223. Characterization of sites occupied by the anesthetic nitrous oxide within proteins by infrared spectroscopy.
- Author
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Dong, A., primary, Huang, P., additional, Zhao, X.J., additional, Sampath, V., additional, and Caughey, W.S., additional
- Published
- 1994
- Full Text
- View/download PDF
224. Interaction of Nickel Deposits with Catalytic Metals on CoMo/Al2O3 Hydrodemetalation Catalysts
- Author
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Zhao, X.J., primary and Wei, J., additional
- Published
- 1994
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225. Characterization of Interactions of Nitric Oxide with Human Hemoglobin A by Infrared Spectroscopy
- Author
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Sampath, V., primary, Zhao, X.J., additional, and Caughey, W.S., additional
- Published
- 1994
- Full Text
- View/download PDF
226. Oxidation behaviour of nano-sized SiC particulate reinforced Alon composites
- Author
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Zhao, X.J., Chen, D.L., Ru, H.Q., Zhang, N., and Liang, B.
- Subjects
- *
CERAMIC-matrix composites , *OXIDATION , *SILICON carbide , *ALUMINUM compounds , *CERAMICS , *SILICON oxide , *CORROSION & anti-corrosives - Abstract
Abstract: Silicon carbide (SiC)–aluminium oxynitride (Alon) ceramic composites exhibited improved mechanical properties, but the high temperature oxidation behaviour was unknown. The aim of this investigation was to identify oxidation characteristics and kinetics of 8wt% SiC–Alon composites over a temperature range between 700°C and 1200°C in air. The Alon matrix and SiC particles near the surface were oxidized to form Al2O3 and SiO2, respectively. The starting oxidation temperature of Alon was observed to be about 1000°C. While the addition of nano-sized SiC particles resulted in a reduced starting oxidation temperature due to the large cumulative surface area and high total surface energy, the oxidation resistance at higher temperatures of 1100°C and 1200°C was remarkably enhanced. The oxidation kinetics changed from a linear weight gain for pure Alon into a logarithmic weight gain for the composites due to the formation of a dense protective oxidation layer arising from the presence of SiO2. [Copyright &y& Elsevier]
- Published
- 2011
- Full Text
- View/download PDF
227. Zirconium nitride nano-particulate reinforced Alon composites: Fabrication, mechanical properties and toughening mechanisms
- Author
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Zhao, X.J., Chen, D.L., Ru, H.Q., and Zhang, N.
- Subjects
- *
ZIRCONIUM , *NANOPARTICLES , *ALUMINUM , *NITRIDES , *COMPOSITE materials , *MICROFABRICATION , *MECHANICAL behavior of materials - Abstract
Abstract: Aluminium oxynitride (Alon) exhibits excellent stability, high rigidity and good thermal shock resistance, but it has relatively low strength and poor fracture toughness. The aim of this investigation was to develop a new type of zirconium nitride (ZrN) nano-particulate reinforced Alon composites via a change of ZrO2 nano-particles during sintering. A reduction of porosity and grain size was observed in the composite. With increasing amount of ZrN nano-particles up to 2.7%, the relative density, hardness, Young''s modulus, flexural strength, and fracture toughness all increased. When the ZrN nano-particles exceeded 2.7%, while the flexural strength and fracture toughness decreased slightly, the density, hardness and Young''s modulus continued to increase. Different toughening mechanisms including crack bridging, crack branching and crack deflection were observed, thus effectively increasing the crack propagation resistance and leading to a considerable improvement in the flexural strength and fracture toughness of the composites. [Copyright &y& Elsevier]
- Published
- 2011
- Full Text
- View/download PDF
228. Structural, electrical and optical properties of p-type transparent conducting SnO2:Al film derived from thermal diffusion of Al/SnO2/Al multilayer thin films
- Author
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Zhao, J., Zhao, X.J., Ni, J.M., and Tao, H.Z.
- Subjects
- *
MOLECULAR structure , *ELECTRIC properties of thin films , *OPTICAL properties , *THIN films , *STANNIC oxide , *ALUMINUM , *HEAT transfer , *MULTILAYERED thin films , *SANDWICH construction (Materials) , *ANNEALING of crystals - Abstract
Abstract: Highly transparent, p-type conducting SnO2:Al films derived from thermal diffusion of a sandwich structure Al/SnO2/Al multilayer thin films deposited on quartz substrate have been prepared by direct current and radio-frequency magnetron sputtering using Al and SnO2 targets. The deposited films were annealed at various temperatures for different durations. The effect of thermal diffusing temperature and time on the structural, electrical and optical performances of SnO2:Al films has been studied. X-ray diffraction results show that all p-type conducting films possessed polycrystalline SnO2 with tetragonal rutile structure. Hall-effect results indicate that 450°C for 4h were the optimum annealing parameters for p-type SnO2:Al films, resulting in a relatively high hole concentration of 7.2×1018 cm−3 and a low resistivity of 0.81Ωcm. The transmission of the p-type SnO2:Al films was above 80%. [ABSTRACT FROM AUTHOR]
- Published
- 2010
- Full Text
- View/download PDF
229. Study on electroelastic field concentration around the electrode tip in multilayer ferroelectric actuators of two designs and their optimizations
- Author
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Zhao, X.J., Liu, B., and Fang, D.N.
- Subjects
- *
ACTUATORS , *FERROELECTRIC crystals , *ELECTRIC fields , *ELECTRODES , *DEFORMATIONS (Mechanics) , *STRESS concentration , *ENGINEERING design , *FINITE element method - Abstract
Abstract: Distribution of electromechanical field near electrode tips is closely related to the reliability of ferroelectric multilayer actuators. In this paper, the deformation and stress concentrations around the electrode tip in two multilayer actuator designs, partially and fully cofired, are investigated by means of experimental measurement and numerical simulations. The digital speckle correlation method (DSCM) is used to measure the full displacement field near the electrode tip with the high spatial resolution. The paths of electric breakdown and cracks initiated from the edge of electrodes were observed. With the proposed Double Gibbs free energy criterion, a fully coupled nonlinear electromechanical finite element method based on domain-switching mechanisms is developed and the simulation results agree well with the experiments. It is found that the crack-like “defects” in the partially cofired layered actuators, i.e. the interlayer gaps filled with soft insulating wax, can significantly reduce the maximum tensile stress level compared with that in “perfect” fully cofired actuators, which implies that the partially cofired design is more reliable than the fully cofired one. Further optimization on geometrical dimension of actuators is also carried out. [Copyright &y& Elsevier]
- Published
- 2010
- Full Text
- View/download PDF
230. Thermal and optical properties of GeS2-based chalcogenide glasses
- Author
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Wang, X.F., Zhao, X.J., Wang, Z.W., Guo, H.T., Gu, S.X., Yu, J.G., Liu, C.L., and Gong, Q.H.
- Subjects
- *
CHALCOGENIDES , *GLASS , *THERMAL properties , *OPTICAL properties - Abstract
Glasses compositions which can be expressed by (
100-x )GeS2–xGa2S3 (x=0 , 10, 20, 30 mol%), 70GeS2–(30-x )Ga2S3–xCdS (x=0 , 10, 15, 20 mol%), and (100-x )GeS2–x[0.5Ga2S3–0.5CdS] (x=0 , 10, 20, 30, 40 mol%), were obtained by the melt-quenching technique. Differential scanning calorimetry (DSC) and visible-IR transmission were used to characterize the thermal and optical properties of these glasses, together with refractive index and density measurements. These homogeneous glasses have relatively high glass transition temperatures (338–436 °C), good thermal stabilities, broad transparencies (0.45–11.5 μm), large refractive indices (2.01–2.25), and large densities (2.68–3.18 g cm-3). The long-wavelength cutoff edge is found near 12 μm due to the multiphonon Ge–S and Ga–S vibrations. The compositional dependences of selected properties were also discussed by making reference to the structural variation. [Copyright &y& Elsevier]- Published
- 2004
- Full Text
- View/download PDF
231. Effects of dent size on the evolution process of rolling contact fatigue damage on defective rail.
- Author
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Zhang, S.Y., Zhao, X.J., Ding, H.H., Spiryagin, M., Guo, J., Liu, Q.Y., Wang, W.J., and Zhou, Z.R.
- Subjects
- *
ROLLING contact fatigue , *CRACK propagation (Fracture mechanics) , *FRACTURE mechanics , *RAILROAD trains - Abstract
Defects such as dents on the rail surface might induce severe rolling contact fatigue (RCF) and then threaten the running safety of railway vehicles. This study aims to explore the initiation and propagation of RCF cracks around dents with different sizes through observing both surfaces and cross-sections of the defective rail. The experiments are conducted on a wheel/rail twin-disc machine. Results indicate that the microstructure evolution process around the dent can be divided into three main stages, namely crack initiation, crack propagation and dent removal. Dents in different sizes act very similarly in each stage, including the position, the crack growth path and the final appearance after the dent has been fully worn off. However, dents in different sizes cause different lifetimes of crack initiation and different lasting times of dents at each stage. For the lager dent, cracks initiate later but propagate for a longer time period, so the dent size plays an important role in the RCF evolution process. • Dents with three different sharpness were made on the rail sample. • The evolution process of microstructure of defected rail material was studied. • Dent size plays a vital role in the wear and RCF damage of defected rail. • RCF cracks propagate in a "C" shape at the leading edge of dent. • Shaper dents initiate cracks later but need more time to be worn off. [ABSTRACT FROM AUTHOR]
- Published
- 2021
- Full Text
- View/download PDF
232. Large eddy numerical simulation of flows over a backward-facing step.
- Author
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Ma, K., Wei, W.L., Wang, L.L., and Zhao, X.J.
- Published
- 2011
- Full Text
- View/download PDF
233. A numerical model for simulation of flow with effects of streamline curvature.
- Author
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Liu Mingqin, Wei, W.I., Lv Bin, Zhao, X.J., Li, S., and Zhang, P.
- Published
- 2011
- Full Text
- View/download PDF
234. High-Temperature Oxidation Behavior of a Ni-Cr-W-Al Alloy.
- Author
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Ma, Y.C., Zhao, X.J., Gao, M., and Liu, K.
- Subjects
OXIDATION ,NICKEL-chromium-aluminum alloys ,ATMOSPHERIC temperature ,CHEMICAL kinetics ,MICROSTRUCTURE ,SCANNING electron microscopy ,X-ray diffraction ,DENDRITIC crystals - Abstract
A study was conducted to examine the isothermal oxidation behavior of a new Ni-Cr-W-AI alloy in air at 1250°C with different time. Oxidation kinetics was determined from weight-change measurements. The microstructure and composition of the oxide scale were investigated by means of scanning electron microcopy and X-ray diffraction. The results showed that the oxide scales of the alloy were a compact and continuous outer Cr
2 O3 and NiCr2 O4 layer and an inner AI2 O3 layer that was in dendrite shape. Oxides scales with good adherence were formed on the surface of the alloy, which made the alloy perform excellent high-temperature oxidation resistance. [Copyright &y& Elsevier]- Published
- 2011
- Full Text
- View/download PDF
235. Redox dependent interactions of the metal sites in carbon monoxide-bound cytochrome c oxidase...
- Author
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Dodson, Eric D. and Zhao, X.J.
- Subjects
- *
CARBON monoxide , *LIGANDS (Biochemistry) , *CYTOCHROME oxidase - Abstract
Examines spectroelectrochemical titration studies involving the binding of the infrared-active probe ligand carbon monoxide to the heme a3/CUB site of bovine heart cytochrome c oxidase. Enzyme preparation; Instrumentation and data handling; Infrared spectroelectrochemical titrations; Theoretical fitting of the resultant spectroelectrochemical data.
- Published
- 1996
- Full Text
- View/download PDF
236. XPS Study of N-doped TiOx Thin Films Prepared By DC Reactive Magnetron Sputtering
- Author
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Zhao, Q.N., Li, C.L., He, X., and Zhao, X.J.
- Abstract
Not Available
- Published
- 2003
- Full Text
- View/download PDF
237. The Structure and Photocatalytic Activity of CeO2 Doped TiO2 Films Deposited onto Glass by Magnetron Sputtering
- Author
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Zhao, Q.N., Li, C.L., and Zhao, X.J.
- Abstract
Not Available
- Published
- 2003
- Full Text
- View/download PDF
238. Study of J/ψ→ωK+K−
- Author
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Ablikim, M., Bai, J.Z., Ban, Y., Bian, J.G., Bugg, D.V., Cai, X., Chang, J.F., Chen, H.F., Chen, H.S., Chen, H.X., Chen, J.C., Chen, Jin, Chen, Jun, Chen, M.L., Chen, Y.B., Chi, S.P., Chu, Y.P., Cui, X.Z., Dai, H.L., Dai, Y.S., Deng, Z.Y., Dong, L.Y., Dong, Q.F., Du, S.X., Du, Z.Z., Fang, J., Fang, S.S., Fu, C.D., Fu, H.Y., Gao, C.S., Gao, Y.N., Gong, M.Y., Gong, W.X., Gu, S.D., Guo, Y.N., Guo, Y.Q., Guo, Z.J., Harris, F.A., He, K.L., He, M., He, X., Heng, Y.K., Hu, H.M., Hu, T., Huang, G.S., Huang, X.P., Huang, X.T., Ji, X.B., Jiang, C.H., Jiang, X.S., Jin, D.P., Jin, S., Jin, Y., Jin, Yi, Lai, Y.F., Li, F., Li, G., Li, H.H., Li, J., Li, J.C., Li, Q.J., Li, R.Y., Li, S.M., Li, W.D., Li, W.G., Li, X.L., Li, X.Q., Li, Y.L., Liang, Y.F., Liao, H.B., Liu, C.X., Liu, F., Liu, Fang, Liu, H.H., Liu, H.M., Liu, J., Liu, J.B., Liu, J.P., Liu, R.G., Liu, Z.A., Liu, Z.X., Lu, F., Lu, G.R., Lu, H.J., Lu, J.G., Luo, C.L., Luo, L.X., Luo, X.L., Ma, F.C., Ma, H.L., Ma, J.M., Ma, L.L., Ma, Q.M., Ma, X.B., Ma, X.Y., Mao, Z.P., Mo, X.H., Nie, J., Nie, Z.D., Olsen, S.L., Peng, H.P., Qi, N.D., Qian, C.D., Qin, H., Qiu, J.F., Ren, Z.Y., Rong, G., Shan, L.Y., Shang, L., Shen, D.L., Shen, X.Y., Sheng, H.Y., Shi, F., Shi, X., Sun, H.S., Sun, J.F., Sun, S.S., Sun, Y.Z., Sun, Z.J., Tang, X., Tao, N., Tian, Y.R., Tong, G.L., Varner, G.S., Wang, D.Y., Wang, J.Z., Wang, K., Wang, L., Wang, L.S., Wang, M., Wang, P., Wang, P.L., Wang, S.Z., Wang, W.F., Wang, Y.F., Wang, Z., Wang, Z.Y., Wang, Zhe, Wang, Zheng, Wei, C.L., Wei, D.H., Wu, N., Wu, Y.M., Xia, X.M., Xie, X.X., Xin, B., Xu, G.F., Xu, H., Xue, S.T., Yan, M.L., Yang, F., Yang, H.X., Yang, J., Yang, Y.X., Ye, M., Ye, M.H., Ye, Y.X., Yi, L.H., Yi, Z.Y., Yu, C.S., Yu, G.W., Yuan, C.Z., Yuan, J.M., Yuan, Y., Zang, S.L., Zeng, Y., Zeng, Yu, Zhang, B.X., Zhang, B.Y., Zhang, C.C., Zhang, D.H., Zhang, H.Y., Zhang, J., Zhang, J.W., Zhang, J.Y., Zhang, Q.J., Zhang, S.Q., Zhang, X.M., Zhang, X.Y., Zhang, Y.Y., Zhang, Yiyun, Zhang, Z.P., Zhang, Z.Q., Zhao, D.X., Zhao, J.B., Zhao, J.W., Zhao, M.G., Zhao, P.P., Zhao, W.R., Zhao, X.J., Zhao, Y.B., Zhao, Z.G., Zheng, H.Q., Zheng, J.P., Zheng, L.S., Zheng, Z.P., Zhong, X.C., Zhou, B.Q., Zhou, G.M., Zhou, L., Zhou, N.F., Zhu, K.J., Zhu, Q.M., Zhu, Y.C., Zhu, Y.S., Zhu, Yingchun, Zhu, Z.A., Zhuang, B.A., Zhuang, X.A., and Zou, B.S.
- Abstract
New data are presented on J/ψ→ωK+K− from a sample of 58M J/ψ events in the upgraded BES II detector at the BEPC. There is a conspicuous signal for f0(1710)→K+K− and a peak at higher mass which may be fitted with f2(2150)→KK¯. From a combined analysis with ωπ+π− data, the branching ratio BR(f0(1710)→ππ)/BR(f0(1710)→KK¯) is
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239. Measurement of cross sections for D0D¯0 and D+D− production in e+e− annihilation at s=3.773 GeV
- Author
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Ablikim, M., Bai, J.Z., Ban, Y., Bian, J.G., Cai, X., Chang, J.F., Chen, H.F., Chen, H.S., Chen, H.X., Chen, J.C., Chen, Jin, Chen, Jun, Chen, M.L., Chen, Y.B., Chi, S.P., Chu, Y.P., Cui, X.Z., Dai, H.L., Dai, Y.S., Deng, Z.Y., Dong, L.Y., Du, S.X., Du, Z.Z., Fang, J., Fang, S.S., Fu, C.D., Fu, H.Y., Gao, C.S., Gao, Y.N., Gong, M.Y., Gong, W.X., Gu, S.D., Guo, Y.N., Guo, Y.Q., He, K.L., He, M., He, X., Heng, Y.K., Hu, H.M., Hu, T., Huang, L., Huang, X.P., Ji, X.B., Jia, Q.Y., Jiang, C.H., Jiang, X.S., Jin, D.P., Jin, S., Jin, Y., Lai, Y.F., Li, F., Li, G., Li, H.H., Li, J., Li, J.C., Li, Q.J., Li, R.B., Li, R.Y., Li, S.M., Li, W.G., Li, X.L., Li, X.Q., Li, X.S., Liang, Y.F., Liao, H.B., Liu, C.X., Liu, F., Liu, Fang, Liu, H.M., Liu, J.B., Liu, J.P., Liu, R.G., Liu, Z.A., Liu, Z.X., Lu, F., Lu, G.R., Lu, J.G., Luo, C.L., Luo, X.L., Ma, F.C., Ma, J.M., Ma, L.L., Ma, Q.M., Ma, X.Y., Mao, Z.P., Mo, X.H., Nie, J., Nie, Z.D., Peng, H.P., Qi, N.D., Qian, C.D., Qin, H., Qiu, J.F., Ren, Z.Y., Rong, G., Shan, L.Y., Shang, L., Shen, D.L., Shen, X.Y., Sheng, H.Y., Shi, F., Shi, X., Sun, H.S., Sun, S.S., Sun, Y.Z., Sun, Z.J., Tang, X., Tao, N., Tian, Y.R., Tong, G.L., Wang, D.Y., Wang, J.Z., Wang, K., Wang, L., Wang, L.S., Wang, M., Wang, P., Wang, P.L., Wang, S.Z., Wang, W.F., Wang, Y.F., Wang, Zhe, Wang, Z., Wang, Zheng, Wang, Z.Y., Wei, C.L., Wei, D.H., Wu, N., Wu, Y.M., Xia, X.M., Xie, X.X., Xin, B., Xu, G.F., Xu, H., Xu, Y., Xue, S.T., Yan, M.L., Yang, F., Yang, H.X., Yang, J., Yang, S.D., Yang, Y.X., Ye, M., Ye, M.H., Ye, Y.X., Yi, L.H., Yi, Z.Y., Yu, C.S., Yu, G.W., Yuan, C.Z., Yuan, J.M., Yuan, Y., Yue, Q., Zang, S.L., Zeng, Yu., Zeng, Y., Zhang, B.X., Zhang, B.Y., Zhang, C.C., Zhang, D.H., Zhang, H.Y., Zhang, J., Zhang, J.Y., Zhang, J.W., Zhang, L.S., Zhang, Q.J., Zhang, S.Q., Zhang, X.M., Zhang, X.Y., Zhang, Y.J., Zhang, Y.Y., Zhang, Yiyun, Zhang, Z.P., Zhang, Z.Q., Zhao, D.X., Zhao, J.B., Zhao, J.W., Zhao, M.G., Zhao, P.P., Zhao, W.R., Zhao, X.J., Zhao, Y.B., Zheng, H.Q., Zheng, J.P., Zheng, L.S., Zheng, Z.P., Zhong, X.C., Zhou, B.Q., Zhou, G.M., Zhou, L., Zhou, N.F., Zhu, K.J., Zhu, Q.M., Zhu, Y.C., Zhu, Y.S., Zhu, Yingchun, Zhu, Z.A., Zhuang, B.A., and Zou, B.S.
- Abstract
The cross sections for D0D¯0 and D+D− production at 3.773 GeV have been measured with BES-II detector at BEPC. These measurements are made by analyzing a data sample of about 17.3 pb−1 collected at the center-of-mass energy of 3.773 GeV. Observed cross sections for the charm pair production are radiatively corrected to obtain the tree level cross section for DD¯ production. A measurement of the total tree level hadronic cross section is obtained from the tree level DD¯ cross section and an extrapolation of the Ruds below the open charm threshold.
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240. Direct measurements of the branching fractions for D0→K−e+νe and D0→π−e+νe and determinations of the form factors f+K(0) and f+π(0)
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Ablikim, M., Bai, J.Z., Ban, Y., Bian, J.G., Cai, X., Chang, J.F., Chen, H.F., Chen, H.S., Chen, H.X., Chen, J.C., Chen, Jin, Chen, Jun, Chen, M.L., Chen, Y.B., Chi, S.P., Chu, Y.P., Cui, X.Z., Dai, H.L., Dai, Y.S., Deng, Z.Y., Dong, L.Y., Du, S.X., Du, Z.Z., Fang, J., Fang, S.S., Fu, C.D., Fu, H.Y., Gao, C.S., Gao, Y.N., Gong, M.Y., Gong, W.X., Gu, S.D., Guo, Y.N., Guo, Y.Q., He, K.L., He, M., He, X., Heng, Y.K., Hu, H.M., Hu, T., Huang, L., Huang, X.P., Ji, X.B., Jia, Q.Y., Jiang, C.H., Jiang, X.S., Jin, D.P., Jin, S., Jin, Y., Lai, Y.F., Li, F., Li, G., Li, H.H., Li, J., Li, J.C., Li, Q.J., Li, R.B., Li, R.Y., Li, S.M., Li, W.G., Li, X.L., Li, X.Q., Li, X.S., Liang, Y.F., Liao, H.B., Liu, C.X., Liu, F., Liu, Fang, Liu, H.M., Liu, J.B., Liu, J.P., Liu, R.G., Liu, Z.A., Liu, Z.X., Lu, F., Lu, G.R., Lu, J.G., Luo, C.L., Luo, X.L., Ma, F.C., Ma, J.M., Ma, L.L., Ma, Q.M., Ma, X.Y., Mao, Z.P., Mo, X.H., Nie, J., Nie, Z.D., Peng, H.P., Qi, N.D., Qian, C.D., Qin, H., Qiu, J.F., Ren, Z.Y., Rong, G., Shan, L.Y., Shang, L., Shen, D.L., Shen, X.Y., Sheng, H.Y., Shi, F., Shi, X., Sun, H.S., Sun, S.S., Sun, Y.Z., Sun, Z.J., Tang, X., Tao, N., Tian, Y.R., Tong, G.L., Wang, D.Y., Wang, J.Z., Wang, K., Wang, L., Wang, L.S., Wang, M., Wang, P., Wang, P.L., Wang, S.Z., Wang, W.F., Wang, Y.F., Wang, Zhe, Wang, Z., Wang, Zheng, Wang, Z.Y., Wei, C.L., Wei, D.H., Wu, N., Wu, Y.M., Xia, X.M., Xie, X.X., Xin, B., Xu, G.F., Xu, H., Xu, Y., Xue, S.T., Yan, M.L., Yang, F., Yang, H.X., Yang, J., Yang, S.D., Yang, Y.X., Ye, M., Ye, M.H., Ye, Y.X., Yi, L.H., Yi, Z.Y., Yu, C.S., Yu, G.W., Yuan, C.Z., Yuan, J.M., Yuan, Y., Yue, Q., Zang, S.L., Zeng, Yu., Zeng, Y., Zhang, B.X., Zhang, B.Y., Zhang, C.C., Zhang, D.H., Zhang, H.Y., Zhang, J., Zhang, J.Y., Zhang, J.W., Zhang, L.S., Zhang, Q.J., Zhang, S.Q., Zhang, X.M., Zhang, X.Y., Zhang, Y.J., Zhang, Y.Y., Zhang, Yiyun, Zhang, Z.P., Zhang, Z.Q., Zhao, D.X., Zhao, J.B., Zhao, J.W., Zhao, M.G., Zhao, P.P., Zhao, W.R., Zhao, X.J., Zhao, Y.B., Zheng, H.Q., Zheng, J.P., Zheng, L.S., Zheng, Z.P., Zhong, X.C., Zhou, B.Q., Zhou, G.M., Zhou, L., Zhou, N.F., Zhu, K.J., Zhu, Q.M., Zhu, Y.C., Zhu, Y.S., Zhu, Yingchun, Zhu, Z.A., Zhuang, B.A., and Zou, B.S.
- Abstract
The absolute branching fractions for the decays D0→K−e+νe and D0→π−e+νe are determined using 7584±198±341 singly tagged D¯0 sample from the data collected around 3.773 GeV with the BES-II detector at the BEPC. In the system recoiling against the singly tagged D¯0 meson, 104.0±10.9 events for D0→K−e+νe and 9.0±3.6 events for D0→π−e+νe decays are observed. Those yield the absolute branching fractions to be BF(D0→K−e+νe)=(3.82±0.40±0.27)% and BF(D0→π−e+νe)=(0.33±0.13±0.03)%. The vector form factors are determined to be |f+K(0)|=0.78±0.04±0.03 and |f+π(0)|=0.73±0.14±0.06. The ratio of the two form factors is measured to be |f+π(0)/f+K(0)|=0.93±0.19±0.07.
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241. First observations of ψ(2S) and χcJ(1P) decays to four-body final states h+h−KS0KS0☆☆The h± denote charged pions or kaons
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Ablikim, M., Bai, J.Z., Ban, Y., Bian, J.G., Cai, X., Chang, J.F., Chen, H.F., Chen, H.S., Chen, H.X., Chen, J.C., Chen, Jin, Chen, Jun, Chen, M.L., Chen, Y.B., Chi, S.P., Chu, Y.P., Cui, X.Z., Dai, H.L., Dai, Y.S., Deng, Z.Y., Dong, L.Y., Du, S.X., Du, Z.Z., Fang, J., Fang, S.S., Fu, C.D., Fu, H.Y., Gao, C.S., Gao, Y.N., Gong, M.Y., Gong, W.X., Gu, S.D., Guo, Y.N., Guo, Y.Q., Guo, Z.J., Harris, F.A., He, K.L., He, M., He, X., Heng, Y.K., Hu, H.M., Hu, T., Huang, G.S., Huang, L., Huang, X.P., Ji, X.B., Jia, Q.Y., Jiang, C.H., Jiang, X.S., Jin, D.P., Jin, S., Jin, Y., Lai, Y.F., Li, F., Li, G., Li, H.H., Li, J., Li, J.C., Li, Q.J., Li, R.B., Li, R.Y., Li, S.M., Li, W.G., Li, X.L., Li, X.Q., Li, X.S., Liang, Y.F., Liao, H.B., Liu, C.X., Liu, F., Liu, Fang, Liu, H.M., Liu, J.B., Liu, J.P., Liu, R.G., Liu, Z.A., Liu, Z.X., Lu, F., Lu, G.R., Lu, J.G., Luo, C.L., Luo, X.L., Ma, F.C., Ma, J.M., Ma, L.L., Ma, Q.M., Ma, X.Y., Mao, Z.P., Mo, X.H., Nie, J., Nie, Z.D., Olsen, S.L., Peng, H.P., Qi, N.D., Qian, C.D., Qin, H., Qiu, J.F., Ren, Z.Y., Rong, G., Shan, L.Y., Shang, L., Shen, D.L., Shen, X.Y., Sheng, H.Y., Shi, F., Shi, X., Sun, H.S., Sun, S.S., Sun, Y.Z., Sun, Z.J., Tang, X., Tao, N., Tian, Y.R., Tong, G.L., Varner, G.S., Wang, D.Y., Wang, J.Z., Wang, K., Wang, L., Wang, L.S., Wang, M., Wang, P., Wang, P.L., Wang, S.Z., Wang, W.F., Wang, Y.F., Wang, Zhe, Wang, Z., Wang, Zheng, Wang, Z.Y., Wei, C.L., Wei, D.H., Wu, N., Wu, Y.M., Xia, X.M., Xie, X.X., Xin, B., Xu, G.F., Xu, H., Xu, Y., Xue, S.T., Yan, M.L., Yang, F., Yang, H.X., Yang, J., Yang, S.D., Yang, Y.X., Ye, M., Ye, M.H., Ye, Y.X., Yi, L.H., Yi, Z.Y., Yu, C.S., Yu, G.W., Yuan, C.Z., Yuan, J.M., Yuan, Y., Yue, Q., Zang, S.L., Zeng, Yu., Zeng, Y., Zhang, B.X., Zhang, B.Y., Zhang, C.C., Zhang, D.H., Zhang, H.Y., Zhang, J., Zhang, J.Y., Zhang, J.W., Zhang, L.S., Zhang, Q.J., Zhang, S.Q., Zhang, X.M., Zhang, X.Y., Zhang, Y.J., Zhang, Y.Y., Zhang, Yiyun, Zhang, Z.P., Zhang, Z.Q., Zhao, D.X., Zhao, J.B., Zhao, J.W., Zhao, M.G., Zhao, P.P., Zhao, W.R., Zhao, X.J., Zhao, Y.B., Zhao, Z.G., Zheng, H.Q., Zheng, J.P., Zheng, L.S., Zheng, Z.P., Zhong, X.C., Zhou, B.Q., Zhou, G.M., Zhou, L., Zhou, N.F., Zhu, K.J., Zhu, Q.M., Zhu, Y.C., Zhu, Y.S., Zhu, Yingchun, Zhu, Z.A., Zhuang, B.A., and Zou, B.S.
- Abstract
First observations of χc0, χc1, and χc2 decays to π+π−KS0KS0 and K+K−KS0KS0, as well as ψ(2S) decay to π+π−KS0KS0, are presented. The branching fractions of these decay channels are determined using 14×106 ψ(2S) events collected at BESII/BEPC. The branching fractions of χc0,χc2→KS0KS0 are measured with improved statistical precision.
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242. Direct measurement of the branching fraction for the decay of D+→K¯0e+νe and determination of Γ(D0→K−e+νe)/Γ(D+→K¯0e+νe)
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Ablikim, M., Bai, J.Z., Ban, Y., Bian, J.G., Cai, X., Chang, J.F., Chen, H.F., Chen, H.S., Chen, H.X., Chen, J.C., Chen, Jin, Chen, Jun, Chen, M.L., Chen, Y.B., Chi, S.P., Chu, Y.P., Cui, X.Z., Dai, H.L., Dai, Y.S., Deng, Z.Y., Dong, L.Y., Du, S.X., Du, Z.Z., Fang, J., Fang, S.S., Fu, C.D., Fu, H.Y., Gao, C.S., Gao, Y.N., Gong, M.Y., Gong, W.X., Gu, S.D., Guo, Y.N., Guo, Y.Q., He, K.L., He, M., He, X., Heng, Y.K., Hu, H.M., Hu, T., Huang, L., Huang, X.P., Ji, X.B., Jia, Q.Y., Jiang, C.H., Jiang, X.S., Jin, D.P., Jin, S., Jin, Y., Lai, Y.F., Li, F., Li, G., Li, H.H., Li, J., Li, J.C., Li, Q.J., Li, R.B., Li, R.Y., Li, S.M., Li, W.G., Li, X.L., Li, X.Q., Li, X.S., Liang, Y.F., Liao, H.B., Liu, C.X., Liu, F., Liu, Fang, Liu, H.M., Liu, J.B., Liu, J.P., Liu, R.G., Liu, Z.A., Liu, Z.X., Lu, F., Lu, G.R., Lu, J.G., Luo, C.L., Luo, X.L., Ma, F.C., Ma, J.M., Ma, L.L., Ma, Q.M., Ma, X.Y., Mao, Z.P., Mo, X.H., Nie, J., Nie, Z.D., Peng, H.P., Qi, N.D., Qian, C.D., Qin, H., Qiu, J.F., Ren, Z.Y., Rong, G., Shan, L.Y., Shang, L., Shen, D.L., Shen, X.Y., Sheng, H.Y., Shi, F., Shi, X., Sun, H.S., Sun, S.S., Sun, Y.Z., Sun, Z.J., Tang, X., Tao, N., Tian, Y.R., Tong, G.L., Wang, D.Y., Wang, J.Z., Wang, K., Wang, L., Wang, L.S., Wang, M., Wang, P., Wang, P.L., Wang, S.Z., Wang, W.F., Wang, Y.F., Wang, Zhe, Wang, Z., Wang, Zheng, Wang, Z.Y., Wei, C.L., Wei, D.H., Wu, N., Wu, Y.M., Xia, X.M., Xie, X.X., Xin, B., Xu, G.F., Xu, H., Xu, Y., Xue, S.T., Yan, M.L., Yang, F., Yang, H.X., Yang, J., Yang, S.D., Yang, Y.X., Ye, M., Ye, M.H., Ye, Y.X., Yi, L.H., Yi, Z.Y., Yu, C.S., Yu, G.W., Yuan, C.Z., Yuan, J.M., Yuan, Y., Yue, Q., Zang, S.L., Zeng, Yu., Zeng, Y., Zhang, B.X., Zhang, B.Y., Zhang, C.C., Zhang, D.H., Zhang, H.Y., Zhang, J., Zhang, J.Y., Zhang, J.W., Zhang, L.S., Zhang, Q.J., Zhang, S.Q., Zhang, X.M., Zhang, X.Y., Zhang, Y.J., Zhang, Y.Y., Zhang, Yiyun, Zhang, Z.P., Zhang, Z.Q., Zhao, D.X., Zhao, J.B., Zhao, J.W., Zhao, M.G., Zhao, P.P., Zhao, W.R., Zhao, X.J., Zhao, Y.B., Zheng, H.Q., Zheng, J.P., Zheng, L.S., Zheng, Z.P., Zhong, X.C., Zhou, B.Q., Zhou, G.M., Zhou, L., Zhou, N.F., Zhu, K.J., Zhu, Q.M., Zhu, Y.C., Zhu, Y.S., Zhu, Yingchun, Zhu, Z.A., Zhuang, B.A., and Zou, B.S.
- Abstract
The absolute branching fraction for the decay D+→K¯0e+νe is determined using 5321±149±160 singly tagged D− event sample from the data collected around 3.773 GeV with the BES-II detector at the BEPC collider. In the system recoiling against the singly tagged D− mesons, 34.4±6.1 events for D+→K¯0e+νe are observed. Those yield the absolute branching fraction to be BF(D+→K¯0e+νe)=(8.95±1.59±0.67)%. The ratio of the two partial widths for the decays of D0→K−e+νe and D+→K¯0e+νe is determined to be Γ(D0→K−e+νe)/Γ(D+→K¯0e+νe)=1.08±0.22±0.07.
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243. Direct measurement of the pseudoscalar decay constant fD+
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Ablikim, M., Bai, J.Z., Ban, Y., Bian, J.G., Cai, X., Chang, J.F., Chen, H.F., Chen, H.S., Chen, H.X., Chen, J.C., Chen, Jin, Chen, Jun, Chen, M.L., Chen, Y.B., Chi, S.P., Chu, Y.P., Cui, X.Z., Dai, H.L., Dai, Y.S., Deng, Z.Y., Dong, L.Y., Dong, Q.F., Du, S.X., Du, Z.Z., Fang, J., Fang, S.S., Fu, C.D., Fu, H.Y., Gao, C.S., Gao, Y.N., Gong, M.Y., Gong, W.X., Gu, S.D., Guo, Y.N., Guo, Y.Q., He, K.L., He, M., He, X., Heng, Y.K., Hu, H.M., Hu, T., Huang, X.P., Huang, X.T., Ji, X.B., Jiang, C.H., Jiang, X.S., Jin, D.P., Jin, S., Jin, Y., Jin, Yi, Lai, Y.F., Li, F., Li, G., Li, H.H., Li, J., Li, J.C., Li, Q.J., Li, R.Y., Li, S.M., Li, W.D., Li, W.G., Li, X.L., Li, X.Q., Li, Y.L., Liang, Y.F., Liao, H.B., Liu, C.X., Liu, F., Liu, Fang, Liu, H.H., Liu, H.M., Liu, J., Liu, J.B., Liu, J.P., Liu, R.G., Liu, Z.A., Liu, Z.X., Lu, F., Lu, G.R., Lu, H.J., Lu, J.G., Luo, C.L., Luo, L.X., Luo, X.L., Ma, F.C., Ma, H.L., Ma, J.M., Ma, L.L., Ma, Q.M., Ma, X.B., Ma, X.Y., Mao, Z.P., Mo, X.H., Nie, J., Nie, Z.D., Peng, H.P., Qi, N.D., Qian, C.D., Qin, H., Qiu, J.F., Ren, Z.Y., Rong, G., Shan, L.Y., Shang, L., Shen, D.L., Shen, X.Y., Sheng, H.Y., Shi, F., Shi, X., Sun, H.S., Sun, J.F., Sun, S.S., Sun, Y.Z., Sun, Z.J., Tang, X., Tao, N., Tian, Y.R., Tong, G.L., Wang, D.Y., Wang, J.Z., Wang, K., Wang, L., Wang, L.S., Wang, M., Wang, P., Wang, P.L., Wang, S.Z., Wang, W.F., Wang, Y.F., Wang, Z., Wang, Z.Y., Wang, Zhe, Wang, Zheng, Wei, C.L., Wei, D.H., Wu, N., Wu, Y.M., Xia, X.M., Xie, X.X., Xin, B., Xu, G.F., Xu, H., Xue, S.T., Yan, M.L., Yang, F., Yang, H.X., Yang, J., Yang, Y.X., Ye, M., Ye, M.H., Ye, Y.X., Yi, L.H., Yi, Z.Y., Yu, C.S., Yu, G.W., Yuan, C.Z., Yuan, J.M., Yuan, Y., Zang, S.L., Zeng, Y., Zeng, Yu, Zhang, B.X., Zhang, B.Y., Zhang, C.C., Zhang, D.H., Zhang, H.Y., Zhang, J., Zhang, J.W., Zhang, J.Y., Zhang, Q.J., Zhang, S.Q., Zhang, X.M., Zhang, X.Y., Zhang, Y.Y., Zhang, Yiyun, Zhang, Z.P., Zhang, Z.Q., Zhao, D.X., Zhao, J.B., Zhao, J.W., Zhao, M.G., Zhao, P.P., Zhao, W.R., Zhao, X.J., Zhao, Y.B., Zheng, H.Q., Zheng, J.P., Zheng, L.S., Zheng, Z.P., Zhong, X.C., Zhou, B.Q., Zhou, G.M., Zhou, L., Zhou, N.F., Zhu, K.J., Zhu, Q.M., Zhu, Y.C., Zhu, Y.S., Zhu, Yingchun, Zhu, Z.A., Zhuang, B.A., Zhuang, X.A., and Zou, B.S.
- Subjects
High Energy Physics::Experiment ,Nuclear Experiment - Abstract
The absolute branching fraction for the decay D+→μ+ν has been directly measured based on a data sample of about 33 pb−1 collected around s=3.773 GeV with the BES-II detector at the BEPC collider. A total of 5321±149±160 D− mesons are reconstructed in nine hadronic decay modes. In the system recoiling against these singly tagged D− mesons, 2.67±1.74 purely leptonic decay events of D+→μ+νμ are observed. Those yield the branching fraction of BF(D+→μ+νμ)=(0.122−0.053+0.111±0.010)%, and a corresponding value of the pseudoscalar decay constant fD+=(371−119+129±25) MeV.
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244. Effect of spherical and ballast dents on rolling contact fatigue of rail materials.
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Zhao, X.J., Guo, L.C., Guo, J., Liu, Q.Y., Butini, E., Marini, L., Meli, E., Rindi, A., and Wang, W.J.
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ROLLING contact fatigue , *RAILROAD rails , *FRACTURE mechanics , *STRENGTH of materials , *RESIDUAL stresses , *MATERIAL fatigue - Abstract
Surface dents on railroad rails may be caused, for example, by the drop of freight goods or the impact of ballast rocks and may have a deep effect on the rail service life. To better understand this problem, this investigation aims at exploring the rolling contact fatigue behavior of the rail materials (as, for example, PD3 steel) after being impacted by two kinds of hard bodies: a simple spherical steel ball and a more realistic ballast rock. The results show that the residual tensile stress, which is distributed on the shoulders of the dent, decreases the rolling contact fatigue (RCF) resistance of the material around the dent. Moreover, the unbalanced wear behavior between the two shoulders of the dent makes the situation even worse on the side of the dent where the tangential force acts firstly. Finally, due to the higher martensite hardness with respect to the matrix material, the crack propagates faster around the dent in presence of white etching layer on the bottom of the dent itself. • The residual tensile stress on the shoulders of rail dents was modelled through FE models. • The unbalanced wear on the shoulders of the rail dent leads to a sever fatigue damage on one side of the dent. • The crack growth mechanism on two typical dents was studied in detail. [ABSTRACT FROM AUTHOR]
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- 2020
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245. Cytochrome cOxidase Catalysis of the Reduction of Nitric Oxide to Nitrous Oxide
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Zhao, X.J., Sampath, V., and Caughey, W.S.
- Abstract
Reduction of nitric oxide (NO) to nitrous oxide (N2O) is catalyzed by bovine heart cytochrome coxidase (CcO) in anaerobic solutions at pH 7.2 and 20°C. Cyanide inhibits and forms Fe3+a3CN. The mononitrosyl (Fe2+a3NO), but not the dinitrosyl (Fe2+a3NO; Cu+BNO), is a likely intermediate in N2O formation. One-electron reduction of NO at Fe2+a3could yield N2O via HNO. However, a two-electron reduction of the NO ligand to give an intermediate that reacts with a second NO to give N2O and H2O appears more likely. Conversion of NO to N2O is favored by low levels of both NO and O2; higher NO levels can inhibit both cytochrome coxidase and NO reductase activities. Raising the O2level will favor catalysis of NO oxidation to NO2by CcO. The reactions of NO and the specific CcO activity that occur in tissue will be critically dependent on NO, O2, and CcO levels.
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- 1995
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246. Infrared Characterization of Nitric Oxide Bonding to Bovine Heart Cytochrome cOxidase and Myoglobin
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Zhao, X.J., Sampath, V., and Caughey, W.S.
- Abstract
The stable binding of nitric oxide to both Cu+Band Fe2+a3in cytochrome coxidase is shown in infrared spectra. The N-O stretch band for Fe2+a3-NO at 1610 cm−1is similar to the band for MbNO at 1612 cm−1. The Cu+B-NO band is at 1700 cm−1. Thus, electron donation from metal to NO is greater with Fe2+a3than Cu+B. However, the affinity for NO is only slightly greater at Fe2+a3than at Cu+B. In contrast CO binds stably only to Fe2+a3. Infrared spectra of oxidase, myoglobin and hemoglobin NO and CO complexes are consistent with only one stable protein structure at the ligand binding site of nitrosyls and with dynamic multiple protein conformers at carbonyl sites. The binding of NO to both Cu+Band Fe2+a3of cytochrome coxidase can contribute to NO cytotoxicity and to the catalysis of NO reduction to N2O and makes possible the effective use of infrared spectroscopy in investigations of Cu as well as Fe at the binuclear O2reduction sites of oxidases.
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- 1994
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247. Effect of annealing treatments on microstructure and mechanical properties of high-entropy alloy Cr10 Mn10Fe60Co10Ni10.
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Duan, J.Y., Zhang, N.B., Zhao, X.J., Lu, L., Cai, Y., Liu, Q.C., and Luo, S.N.
- Subjects
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BODY centered cubic structure , *FACE centered cubic structure , *MICROSTRUCTURE , *TENSILE strength , *STRAIN hardening - Abstract
A face-centered cubic (FCC) non-equiatomic high-entropy alloy (HEA), Cr 10 Mn 10 Fe 60 Co 10 Ni 10 , is processed via cold-rolling and subsequent annealing at 800 − 1200 °C with different cooling methods. All the annealing treatments lead to fully recrystallized microstructures with various grain sizes and precipitate types. The mechanical properties under uniaxial tension are obtained along with microstructure characterizations of postmortem samples. The sample annealed at 800 °C followed by furnace cooling yields a reasonable combination of high strength and good ductility. The yield strength and ultimate tensile strength are 43% and 19% higher than those of the sample annealed at 800 °C followed by water quenching, with only a uniform elongation ∼ 6% reduction. The yield strength variations of all the annealed samples are explained with a structure-based strength model. After fracture, all the samples show strong 〈 111 〉 texture along the tensile direction. Besides dislocation slip, deformation twinning and multiple phase transitions contribute to high strength and effective work hardening as additional deformation mechanisms. The newly formed hexagonal close-packed and body-centered cubic phases follow the Shoji–Nishiyama and Kurdjumov–Sachs orientation relations with the FCC matrix, respectively. Given the "treatment method − microstructure − mechanical property" relationship in this study, combining the advantages of the steel and HEAs, this kind of Fe-rich HEA bears great potentials to serve under practical conditions. [ABSTRACT FROM AUTHOR]
- Published
- 2024
- Full Text
- View/download PDF
248. To simulate the formation of TSSOP solder joint with SAC solder and assess on the effects of the stencil design and the misalignment on the joint shape
- Author
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Zhao, X.J., primary and Caers, J.F.J.M., additional
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249. Optical DRAMS using refreshable WDM loop memories
- Author
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Chai, Y., primary, Chen, J.H., additional, Zhao, X.J., additional, Zhang, J.P., additional, Fan, J.Y., additional, Choa, F.S., additional, and Lin, W., additional
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250. Feasibility Study on Board Assembly of TSSOP Components with NiPdAu PPF Finish
- Author
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Zhao, X.J., primary and Caers, J.F.J.M., additional
- Full Text
- View/download PDF
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