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1. Measuring Inclination and Refractive Index of the Sample in Collection-Mode Scanning Near-Field Optical Microscope with Controllable Illumination

Author

吴世法 Wu Shifa, 刘琨 Liu Kun, 王昭 Wang Zhao, and 李宏 Li Hong

Subjects
Materials science, Optics, business.industry, Mode (statistics), Near field optical microscope, business, Refractive index, Sample (graphics), Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials
Published
2010
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