Back to Search Start Over

Measuring Inclination and Refractive Index of the Sample in Collection-Mode Scanning Near-Field Optical Microscope with Controllable Illumination

Authors :
吴世法 Wu Shifa
刘琨 Liu Kun
王昭 Wang Zhao
李宏 Li Hong
Source :
Acta Optica Sinica. 30:2272-2277
Publication Year :
2010
Publisher :
Shanghai Institute of Optics and Fine Mechanics, 2010.

Subjects

Subjects :
Materials science
Optics
business.industry
Mode (statistics)
Near field optical microscope
business
Refractive index
Sample (graphics)
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials

Details

ISSN :
02532239
Volume :
30
Database :
OpenAIRE
Journal :
Acta Optica Sinica
Accession number :
edsair.doi...........ab69e981256d9e65aab58c060c58e800
Full Text :
https://doi.org/10.3788/aos20103008.2272
Full Text Access
View/download PDF

Tools

Authors Abstract Subjects Details