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An auspicious approach to increase sustainability of a product/packaging cycle is to investigate the dependencies between the different life cycle phases and corresponding actors. For any actor, the perspective on the global cycle initiates from his own position; therefore, it is required to make the entire life cycle more transparent by showing and interpreting the dependencies as well as the correlations and sensitivities of the different phases in the life cycle. The emerging actor network can serve as a fundament for an approach that allows for the meaningful comparison of various aspects of sustainability during the development life cycles of product/packaging combinations.

Organised by: Cranfield University Metadata models are the nucleus of product data and lifecycle management. Current PLM solutions offer generic metadata models for physical products and consider only the product provider’s requirements. They are not sufficient to meet the new requirements and have to be extended in order to provide support for industrial product-service system (IPS²). Based on use case analyses, expert interviews and interviews with participants of the research project the different requirements of IPS2 providers and customers are identified and a proposal for a metadata reference model for IPS2 lifecycle management is introduced. This metadata model provides the foundation not only for basic PLM methods but also for advanced IPS2 management methods like IPS2 change management, IPS2 customer feedback management and IPS2 executive information management. The IPS² metadata reference model could be the basis for further standardisation activities. Mori Seiki – The Machine Tool Company

ISBN: 0-7695-1641-6; The increased complexity of electronic systems has seen increasing reliability needs in various application domains as well as pressure for low cost products. There is a corresponding increased demand for cost-effective on-line test techniques. These needs are increased dramatically in the near future, since very deep submicron and nanometer technologies impact adversely noise margins and make mandatory integrating on-line test in ICs. The workshop is also emphasizing on on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication.

International audience; Online testing has been a known field for sometime now. However, to-day’s situation with online testing may be a little bit different than it was inthe past. With the nanometer technologies, we may see more soft errorsthat cause problems. The goal of this roundtable is to analyze where on-line test was and where future technologies are going.D&Tthanks participants Jacob A. Abraham (Univ. of Texas at Austin),Miron Abramovici (Bell Labs), Silvano Motto (CAEN Microeletronica), IsaacLevendel (Motorola), and Michael Nicolaidis (TIMA). Our moderator wasYervant Zorian (LogicVision). Also attending were Lorena Anghel (TIMA)and Fabian Vargas (Puers, Brazil). D&TRoundtable Editor Kaushik Roy(Purdue Univ.) organized the event.The roundtable was held at the Fourth IEEE International On-Line TestingWorkshop in July 1998. D&Tthanks the workshop for hosting it.