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Homosexual or bisexual men, dissatisfied with, or indirectly because of, their sexual orientation, were treated in a psychotherapy group led by a male-female cotherapy team. Of the 66 patients in this series, almost half made heterosexuality an explicit treatment goal. Of these, 85 percent experienced at least partial heterosexual shifts. (Author)

We report a strong direct correlation (above 0.9) between conventional transistor-level parametrics typically used in the industry to monitor and control intra-die variability (IDV) and a novel, non-contact performance-based metrology (PBM), technology that was integrated into an active die on a 32nm SOI advanced logic product platform. We demonstrate a PBM test structure measurement repeatability of less than 0.4%. In this work, we also demonstrate the compatibility of integrating the PBM technology into an advanced CMOS process flow with no added processing or steps, as well as its footprint scalability. The data suggests that the non-contact PBM technology meets all prerequisites for its deployment as a standard, within-product IDV monitor.

This paper presents the first single element time resolved emission (TRE) data collected from microprocessors fabricated with 0.13 µm process silicon using tester loop lengths, and in many cases acquisition times, comparable to laser voltage probing. The data presented here demonstrate that TRE tools with highly sensitive single element detectors can be used for practical microprocessor circuit diagnostics with reasonable acquisition times.

Time-resolved photon emission has been shown to be useful in analyzing clock skews and timing-related defects in flip-chip devices. In practice, time-resolved photon emission using the S-25 Quantar detector cannot be used at long loop lengths (typically >10 μs). This paper discusses a near-infrared (NIR) optimized time-resolved emission system to demonstrate that even with long loop lengths time-resolved photon emission can be extremely useful for defect localization. Specifically, it describes time-resolved photon emission system, and shows how time-resolved photon emission was used to solve two different issues that caused scan fails on silicon-on-insulator devices, and briefly discusses the interpretation of optical waveforms. The two issues are presented as case studies.