4 results on '"Cambieri, J."'
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2. High Voltage P-Channel MOS Breakdown Voltage Instability During High Temperature Gate Stress Induced by Pre-Metal Nitride Layers
3. A novel simulation methodology for development of ESD primitives on a 0.18µm analog, mixed-signal high voltage process technology.
4. Simulation of off-state degradation at high temperature in High Voltage NMOS transistor with STI architecture.
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