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Your search keyword '"Castaneda, Carlos M"' showing total 11 results

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2. Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

3. Single-event upsets and multiple-bit upsets on a 45 nm SOI SRAM

4. Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

7. Radiation-resistant polymer-based photonics for space applications

10. Use of proton backscattering to determine the carbon and oxygen content in fine particle samples deposited on PTFE((CF2) n ) membrane disk filters

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