119 results on '"Cheng, Binjie"'
Search Results
2. Comprehensive study of the statistical variability in a 22 nm fully depleted ultra-thin-body SOI MOSFET
3. Impact of statistical parameter set selection on the statistical compact model accuracy: BSIM4 and PSP case study
4. Research on Medical Knowledge Graph for Stroke
5. Simulation of statistical variability in nano-CMOS transistors using drift-diffusion, Monte Carlo and non-equilibrium Green’s function techniques
6. A Brief Analysis on the Protection and Development of Daci Temple Area in Chengdu
7. Review of Rational Drug Use Based on Apriori Algorithm
8. IMPACT OF INTRINSIC PARAMETER FLUCTUATIONS IN NANO-CMOS DEVICES ON CIRCUITS AND SYSTEMS
9. Research on the Current Situation and Promotion Strategy of Qiang Embroidery Inheritance in Qiang Village of Xiuxi Based on the Perspective of Living Inheritance
10. From devices to circuits: modelling the performance of 5nm nanosheets
11. Z²-FET as capacitor-less eDRAM cell for high-density integration
12. Extended analysis of the Z²-FET: operation as capacitorless eDRAM
13. Z2-FET memory for low power applications
14. ${Z}^{\textsf {2}}$ -FET as Capacitor-Less eDRAM Cell For High-Density Integration
15. Extended Analysis of the $Z^{2}$ -FET: Operation as Capacitorless eDRAM
16. Low-Power Z2-FET Capacitorless 1T-DRAM
17. Comparative study on RTN amplitude in planar and FinFET devices
18. New approach for understanding “random device physics” from channel percolation perspectives: Statistical simulations, key factors and experimental results
19. New insights into the near-threshold design in nanoscale FinFET technology for sub-0.2V applications
20. A Device-Level Characterization Approach to Quantify the Impacts of Different Random Variation Sources in FinFET Technology
21. Optimal DC-Segmentation for Multi-Infeed HVDC Systems Based on Stability Performance
22. A simple method to decompose the amplitudes of different random variation sources in FinFET technology
23. Multivariate Modeling of Variability Supporting Non-Gaussian and Correlated Parameters
24. Predictive compact modeling of random variations in FinFET technology for 16/14nm node and beyond
25. FinFET Centric Variability-Aware Compact Model Extraction and Generation Technology Supporting DTCO
26. Simulation Study of the Impact of Quantum Confinement on the Electrostatically Driven Performance of n-type Nanowire Transistors
27. Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow
28. Performance and Variability of Doped Multithreshold FinFETs for 10-nm CMOS
29. Statistical aspects of FinFET based SRAM metrics subject to process and statistical variability
30. Variability-aware compact model strategy for 20-nm bulk MOSFETs
31. Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability
32. Simulation of 3D FinFET doping profiles introduced by ion implantation and the impact on device performance
33. Analytical Models for Three-Dimensional Ion Implantation Profiles in FinFETs
34. Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology
35. Comprehensive study of the statistical variability in a 22nm fully depleted ultra-thin-body SOI MOSFET
36. PDK development for 10nm III-V/Ge IFQW CMOS technology including statistical variability
37. Circuit-level modeling of FinFet sub-threshold slope and DIBL mismatch beyond 22nm
38. Impact of statistical variability and charge trapping on 14 nm SOI FinFET SRAM cell stability
39. Interplay Between Process-Induced and Statistical Variability in 14-nm CMOS Technology Double-Gate SOI FinFETs
40. Geometry, Temperature, and Body Bias Dependence of Statistical Variability in 20-nm Bulk CMOS Technology: A Comprehensive Simulation Analysis
41. Back-Gate Bias Dependence of the Statistical Variability of FDSOI MOSFETs With Thin BOX
42. Statistical variability in scaled generations of n-channel UTB-FD-SOI MOSFETs under the influence of RDF, LER, OTF and MGG
43. Statistical variability in 14-nm node SOI FinFETs and its impact on corresponding 6T-SRAM cell design
44. Statistical variability study of a 10nm gate length SOI FinFET device
45. Statistical distribution of RTS amplitudes in 20nm SOI FinFETs
46. A framework to study time-dependent variability in circuits at sub-35nm technology nodes
47. Statistical Variability in Fully Depleted SOI MOSFETs Due to Random Dopant Fluctuations in the Source and Drain Extensions
48. Simulation of 3D FinFET doping profiles by ion implantation
49. A general approach for multivariate statistical MOSFET compact modeling preserving correlations
50. Impact of NBTI/PBTI on SRAM Stability Degradation
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.