1. Probe Characterization for Electromagnetic Near-Field Studies
- Author
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Sylvie Jarrix, Tristan Dubois, B. Azais, D. Gasquet, Pierre Nouvel, R. Adam, Institut d’Electronique et des Systèmes ( IES ), Université de Montpellier ( UM ) -Centre National de la Recherche Scientifique ( CNRS ), Laboratoire Chrono-environnement ( LCE ), Université Bourgogne Franche-Comté ( UBFC ) -Centre National de la Recherche Scientifique ( CNRS ) -Université de Franche-Comté ( UFC ), Direction générale de l'armement [Bagneux] ( DGA ), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Radiations et composants (RADIAC), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Térahertz, hyperfréquence et optique (TéHO), and Direction générale de l'armement [Bagneux] (DGA)
- Subjects
Electromagnetic field ,Physics ,Field (physics) ,business.industry ,020208 electrical & electronic engineering ,020206 networking & telecommunications ,Near and far field ,02 engineering and technology ,Electromagnetic radiation ,Microstrip ,[SPI.TRON]Engineering Sciences [physics]/Electronics ,[ SPI.TRON ] Engineering Sciences [physics]/Electronics ,Magnetic field ,Optics ,Electric field ,0202 electrical engineering, electronic engineering, information engineering ,Electronic engineering ,Electrical and Electronic Engineering ,business ,Instrumentation ,Electrical conductor ,ComputingMilieux_MISCELLANEOUS - Abstract
Probes used for contactless electromagnetic field capture or injection are characterized. Depending on the probe structure, they interact preferentially with the electric or magnetic field. The optimal size of the probes for broad-frequency-band measurements is investigated. However, it is shown particularly for the magnetic field probe that considerations about the size and the structures presented in this paper are not sufficient for a good discrimination between electric and magnetic fields. Then, the space resolution of near-field measurements is discussed, with application to the field capture of a microstrip line under operation.
- Published
- 2010