1. Light-Induced Tellurium Enrichment on CdZnTe Crystal Surfaces Detected by Raman Spectroscopy
- Author
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Doug B. Hunter, Michael Groza, Eliel Villa-Aleman, Arnold Burger, Samantha A. Hawkins, Vladimir Buliga, David R. Black, and Martine C. Duff
- Subjects
Physics::Instrumentation and Detectors ,Scattering ,Analytical chemistry ,Physics::Optics ,chemistry.chemical_element ,Crystal growth ,Condensed Matter Physics ,Electronic, Optical and Magnetic Materials ,Semiconductor detector ,Crystal ,symbols.namesake ,Crystallography ,chemistry ,Materials Chemistry ,symbols ,Electrical and Electronic Engineering ,Raman spectroscopy ,Tellurium ,Spectroscopy ,Raman scattering - Abstract
CdZnTe (CZT) crystals can be grown under controlled conditions to produce high-quality crystals to be used as room-temperature radiation detectors. Even the best crystal growth methods result in defects, such as tellurium secondary phases, that affect the crystal's performance. In this study, CZT crystals were analyzed by micro-Raman spectroscopy. The growth of Te rich areas on the surface was induced by low-power lasers. The growth was observed versus time with low-power Raman scattering and was observed immediately under higher-power conditions. The detector response was also measured after induced Te enrichment.
- Published
- 2008
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